GB2399890B - Multiple scan chains with pin sharing - Google Patents

Multiple scan chains with pin sharing

Info

Publication number
GB2399890B
GB2399890B GB0411444A GB0411444A GB2399890B GB 2399890 B GB2399890 B GB 2399890B GB 0411444 A GB0411444 A GB 0411444A GB 0411444 A GB0411444 A GB 0411444A GB 2399890 B GB2399890 B GB 2399890B
Authority
GB
United Kingdom
Prior art keywords
scan chains
multiple scan
pin sharing
sharing
pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
GB0411444A
Other versions
GB2399890A (en
GB0411444D0 (en
Inventor
Gyoo-Chan Sim
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/136,670 external-priority patent/US7249298B2/en
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of GB0411444D0 publication Critical patent/GB0411444D0/en
Publication of GB2399890A publication Critical patent/GB2399890A/en
Application granted granted Critical
Publication of GB2399890B publication Critical patent/GB2399890B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318552—Clock circuits details
GB0411444A 2002-04-30 2002-07-17 Multiple scan chains with pin sharing Expired - Lifetime GB2399890B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/136,670 US7249298B2 (en) 2002-04-30 2002-04-30 Multiple scan chains with pin sharing
GB0216628A GB2388199B (en) 2002-04-30 2002-07-17 Multiple scan chains with pin sharing

Publications (3)

Publication Number Publication Date
GB0411444D0 GB0411444D0 (en) 2004-06-23
GB2399890A GB2399890A (en) 2004-09-29
GB2399890B true GB2399890B (en) 2005-06-15

Family

ID=32929381

Family Applications (2)

Application Number Title Priority Date Filing Date
GB0411442A Expired - Lifetime GB2399889B (en) 2002-04-30 2002-07-17 Method for loading scan chains
GB0411444A Expired - Lifetime GB2399890B (en) 2002-04-30 2002-07-17 Multiple scan chains with pin sharing

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB0411442A Expired - Lifetime GB2399889B (en) 2002-04-30 2002-07-17 Method for loading scan chains

Country Status (1)

Country Link
GB (2) GB2399889B (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2121997A (en) * 1982-06-11 1984-01-04 Int Computers Ltd Testing modular data processing systems
US4730316A (en) * 1985-07-25 1988-03-08 International Computers Limited Digital integrated circuits

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6070260A (en) * 1998-09-17 2000-05-30 Xilinx, Inc. Test methodology based on multiple skewed scan clocks

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2121997A (en) * 1982-06-11 1984-01-04 Int Computers Ltd Testing modular data processing systems
US4730316A (en) * 1985-07-25 1988-03-08 International Computers Limited Digital integrated circuits

Also Published As

Publication number Publication date
GB0411442D0 (en) 2004-06-23
GB2399890A (en) 2004-09-29
GB0411444D0 (en) 2004-06-23
GB2399889B (en) 2005-05-11
GB2399889A (en) 2004-09-29

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Legal Events

Date Code Title Description
PE20 Patent expired after termination of 20 years

Expiry date: 20220716