GB2383474A

GB2383474A - A probe for a measuring instrument

Info

Publication number: GB2383474A
Application number: GB0130330A
Authority: GB
Inventors: Gregory S Walsh
Original assignee: Qualcomm Inc
Current assignee: Qualcomm Inc
Priority date: 2001-12-19
Filing date: 2001-12-19
Publication date: 2003-06-25
Also published as: GB0130330D0

Abstract

A probe 10 for a measuring instrument comprises a housing 12 and a biased member 14 within the housing. The biased member defines a probe point 16 that extends from the housing when the biased member is in a biased position (figure 1) and a hook 18 that is accessible when the biased member is urged from the hosing against the bias (figure 2).

Description

A PROBE FOR A MEASURING INSTRUMENT BACKGROUND OF THE INVENTION I. Field of the Invention The invention relates to a probe. More specifically, the invention relates to a probe for an electronic instrument such as an oscilloscope or a multi-meter.

II. Description of the Related Art An oscilloscope or multi-meter probe typically comprises a probe handle having a conductive point or stud fixed thereto. A spring-loaded hook is supplied removably secured over the point to enable either the point or the hook to be used to take measurements from an electronic circuit during testing of the circuit.

The hook is not always used and, when it is required, it is often not to be found secured over the stud. This is inconvenient because time must be spent looking for the spring-loaded hook before it can be used. One alternative to the spring-loaded clip is to hold the stud in position during the measurement, but this is less than satisfactory because often the tester needs to have both hands free to perform other operations. Another alternative is to use crocodile clips or wire to connect to the circuit under test.

SUMMARY OF THE INVENTION The invention addresses the above-discussed, and related, problems.

According to the invention there is provided a probe for a measuring instrument, the probe comprising a housing and a biased member within the housing, the biased member defining a probe point that extends from the housing when the biased member is in a biased position and a hook that is accessible when the biased member is urged from the hosing against the bias.

The above and further features of the invention are set forth with particularity in the appended claims and together with advantages thereof will become clearer from consideration of the following detailed description of an exemplary embodiment of the invention given with reference to the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS In the drawings: FIG. I is a side view of a probe in a retracted position; and FIG. 2 is a side view of the probe in an extended position.

DETAILED DESCRIPTION OF AN EMBODIMENT OF THE INVENTION Turning now to FIG. I of the accompanying drawings, there is shown a probe 10 comprising a housing 12 containing a biased central member 14 from which a probe point 16 extends. The central member 14 of the probe is spring-loaded by way of one or more springs or other resilient members (not shown) provided in the housing 12 in a conventional manner.

The central member further defines a hook 18, as shown in FIG. 2 of the accompanying drawings. In use, the housing 12 may be drawn back to

reveal the hook 18, from which the point 14 extends, as shown in FIG. 2 of the accompanying drawings.

With the probe 10 in the position shown in FIG. 1, the point 14 may be used to take measurements from selected locations in an electronic circuit simply by applying the point 14 to a selected location. With the probe in the position shown in FIG. 2, the hook 18 may be used in the conventional manner to secure the probe to a test point or other location in a circuit under test.

The probe 10 thus provides a flexible arrangement by which either the hook 18 or the point 14 may be used without the fear of the hook becoming separated from the probe and mislaid.

Having thus described the invention by reference to a preferred embodiment it is to be well understood that the embodiment in question is exemplary only and that modifications and variations such as will occur to those possessed of appropriate knowledge and skills may be made without departure from the spirit and scope of the invention as set forth in the appended claims and equivalents thereof.

Claims

CLAIMS : 1. A probe for a measuring instrument, the probe comprising a housing and a biased member within the housing, the biased member defining a probe point that extends from the housing when the biased member is in a biased position and a hook that is accessible when the biased member is urged from the hosing against the bias.