GB2323176A

GB2323176A - An apparatus and method for impact testing an electronic product

Info

Publication number: GB2323176A
Application number: GB9805328A
Authority: GB
Inventors: Joung-Un Jin
Original assignee: Samsung Electronics Co Ltd
Current assignee: Samsung Electronics Co Ltd
Priority date: 1997-03-13
Filing date: 1998-03-13
Publication date: 1998-09-16
Anticipated expiration: 2018-03-13
Also published as: KR19980073269A; GB2323176B; KR100294203B1; MY120228A; GB9805328D0

Abstract

An apparatus for impact testing an electronic product comprises a hammer 31, 32 and a rotating device 40 attached to one end of the hammer, which rotates the hammer through a predetermined angular displacement. A support arrangement 60, 61 supports the hammer and an electronic product to be tested 20 in a predetermined relationship. Two test impact apparatuses may be arranged to strike two sides of an electronic product 20 simultaneously. Sensors may be employed to detect and control the rotational angle through which the hammer operates. The support arrangement 60, 61 may include vertical and horizontal adjustments of the hammer relative to the electronic product to be tested 20. A method of testing is also disclosed in which the position of an electronic product to be tested 20 is detected, test signals are supplied to the product and the sides of the product are hammered. After the hammering action the output signal from the product is tested and then the product is released. The above test systems may be used in providing an automatic impact test system for monitor equipment 20 on a production line.

Description

AN APPARATUS AND METHOD FOR IMPACT TESTING AN ELECTRONIC PRODUCT BACKGROUND OF THE INVENTION The present invention relates to an apparatus for testing an electronic product and a method of so doing.

Generally, when the assemblies of various kinds of electronic products are completed in the production line, several tests are performed on the products. In the case that the tested quality is within the standards of the pertinent product, packing the product is completed and then the finished product is sent out. Within the several tests, there is an impact test.

As an example of such tests, the impact test against a monitor as an example of an electronic product, will be explained.

The monitor is an electronic product for sensing a video signal transmitted from various video products by human sight. Inside of the monitor, a cathode ray tube (CRT), a printed circuit board (PCB), various cables and connectors are connected to each other.

Accordingly, in order to assure the assembly state of the monitor, the impact test is performed by using a testing device after a final performance testing process in the production line. The impact test is explained as follows.

First, an operator displays a predetermined test pattern on the screen of the monitor. After that, a certain impact is applied to a part of the monitor case, and it is checked manually whether any abnormal result which is not complied with the test pattern is generated. In other words, a monitor having an abnormal result on the test pattern on the screen even when a predetermined time elapses after the impact is regarded as an inferior product.

By performing the impact test, the operator can indirectly detect any inferior soldering of circuit components on the PCB inside the monitor are mounted, and also assure the good connection state of various cables.

Conventionally, the operator had performed the impact test against the finished monitor by hammering on a predetermined part of the monitor case intentionally with a rubber bar having a predetermined size.

However, the direct impact on the monitor case by the rubber bar has a problem in that it cannot realise an even impact force over the monitors which are the test objects, as the impact force of the operator differs every day even if the same operator continuously performs the impact test.

In addition, in the case that an excessive impact force is applied to the monitor case by the rubber bar, it has a problem in that the monitor case which will be sent out as the finished product can be damaged.

Moreover, as the operator hammers the monitor with the rubber bar and he tests manually the variation state of the screen of the monitor generated by the impact, it takes much operational labour, thereby dropping the operation efficiency.

SUMMARY OF THE INVENTION Therefore, it is an object of the present invention to provide an apparatus for impact testing of an electronic product and method thereof capable of automatically applying an even impact force to predetermined parts of a monitor case to be tested, a predetermined number of times at a pre-set interval.

According to one aspect of the present invention, the apparatus for impact testing of the electronic product includes: a hammering unit for applying the impact to a predetermined part of the electronic products including a monitor; a rotating unit which is connected to one end of the hammering unit and rotates the hammering unit by a predetermined angle; and a supporting unit for fixing the hammering unit and the rotating unit to the upper part of the electronic products apart by a predetermined distance.

Preferably, each of the hammering unit, the rotating unit and the supporting unit is formed in a pair to hammer simultaneously on predetermined parts at both sides of the case of the electronic product.

The hammering unit may include: a hammering contact unit support having a predetermined length which rotates centring on the rotary shaft of the rotating unit; and a hammering contact unit which is mounted at one end of the hammering contact unit support and is contacted to the case of the electronic product in the case of hammering.

Preferably, the rotating unit includes a cylinder which is connected to the hammering unit and rotates the hammering unit by a predetermined angle. Moreover, the rotating unit further includes a zero angle sensor and a vertical angle sensor which are located adjacent to the rotary shaft of the rotating unit so that the rotation angle formed by the rotation of the hammering unit can be adjusted.

Moreover, the supporting unit may include: a horizontal support for fixing/supporting the rotating unit so that a proper horizontal distance can be maintained between the rotating unit and the electronic product; and a vertical support for fixing/supporting the rotating unit so that a proper vertical distance can be maintained between the rotating unit and the electronic product. Here, the horizontal and vertical supports can be controlled so that the hammering unit can be located at horizontal and vertical central parts at the side of case of the electronic product, respectively, as the size of the electronic product varies.

According to another aspect of the present invention, in the case that a palette on which the monitor is loaded arrives at the operational position, the palette is fixed and a video signal is supplied to the monitor, and thereby a predetermined test pattern is displayed on the monitor.

After that, the rotating cylinder is operated by supplying power and then the side of the monitor case is hammered by a predetermined number of times by the hammering unit, and the variation of the test pattern caused by the hammering is tested.

BRIEF DESCRIPTION OF THE DRAWINGS The present invention will now be described by way of example with reference to the accompanying drawings in which: FIG. 1 is a side view of an apparatus for impact testing of an electronic product according to the present invention, which is located at a conveyer line; FIG. 2A is a side view of an apparatus for impact testing of an electronic product according to the present invention, which is seen from the front side of a conveyer line moving direction; FIG. 2B is a plain view of an apparatus for impact testing of an electronic product according to the present invention, which is seen from the top side of a conveyer line; FIG. 3 is a front view of an apparatus for impact testing of an electronic product according to the present invention, as seen by an operator; FIG. 4 is an enlarged view of a main part of a right rotating unit illustrated in FIG. 3; and FIGs. 5A and 5B are flowcharts illustrating a method for impact testing of an electronic product according to the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT Referring to FIG. 1, an apparatus for impact testing of an electronic product according to the present invention includes: a hammering unit for applying the impact to a predetermined part at the side of the case of a monitor 20; a rotating unit which is connected to one end of the hammering unit and rotates the hammering unit by a predetermined angle; and a supporting unit for fixing the rotating unit apart from a palette 10 at which a monitor 20 which is the test object is located by a predetermined distance.

The hammering unit includes: a hammering contact unit support 32 having a predetermined length which rotates centring on a rotary shaft of the rotating unit; and a hammering contact unit 31 which is mounted at one end of the hammering contact unit support 32 which is directly contacted to the case of the monitor 20 in the case of hammering.

As the hammering contact unit 31, a round-shaped rubber hammer can be used, and it is possible to wrap the rubber hammer in a cloth to prevent the case of the monitor which is the test object from being disfigured.

Moreover, the rotating unit is a rotating cylinder 40 which is connected to the hammering unit and rotates the hammering unit by a predetermined angle. The rotating speed can be controlled by controlling the pressure of air which is supplied to the rotating cylinder 40. In addition, by controlling the rotating speed, the impact force can be controlled.

The supporting unit includes: a horizontal support 60 for fixing/supporting the rotating unit to maintain a proper horizontal distance to the monitor 20; and a vertical support 61 for fixing/supporting the rotating unit to maintain a proper vertical distance to the monitor 20.

Here, the vertical support 61 can control the height so that the hammering contact unit 31 of the hammering unit can correspond to the vertical central part at the side of the case of the monitor 20. In addition, the horizontal support can control the height so that the hammering contact unit 31 of the hammering unit can correspond to the horizontal central part at the side of the case of the monitor 20.

Referring to FIG. 2, when each of the hammering unit, the rotating unit, and the supporting unit is formed in a pair, it is possible to simultaneously hammer on two central parts at both the right and left sides of the case of the monitor 20 which is the test object.

The operation of the apparatus for impact testing of the electronic product according to the present invention having the above-described structure will be explained, with reference to FIG. 2A to FIG. 5B.

Referring to FIGs. 5A and 5B, it is confirmed whether the palette 10 on which the monitor 20 is loaded arrives at the operational position, riding in the conveyer (step S10).

The palette 10 which has arrived is fixed and a video signal is applied to the monitor 20 to be tested (step S20). A predetermined video signal which is the test pattern is supplied and then displayed in the monitor 20.

When the operator presses a start switch which is not illustrated (step S30), the rotating cylinder 40 is rotated by 90 degrees and the hammering contact unit 31 fixed at the hammering contact unit support 32 hammers on the side of the case of the monitor 20 (step S40). After hammering on the side of the case of the monitor 20, the operator presses an end switch which is not illustrated (step S50), and the supply of the video signal which is the test pattern to the monitor 20 which has finished its impact test is blocked. The palette 10 in which the monitor 20 is loaded is released from the fixed state (step S60).

Moreover, the step S10 of confirming whether the monitor 20 arrives includes the steps of: confirming whether the palette 10 arrives at the operational position by a palette confirming sensor 43 located at a predetermined position of the lower part of a conveyer belt 12 (step S11); and confirming whether the monitor 20 to be tested is located on the palette 10 (step S12).

The step S20 of fixing the palette 10 and supplying the video signal includes the steps of: confirming whether both a pusher cylinder 80 and a signal cylinder 70 are moved backward to the initial position (step S21); rearranging the position of the sensor in the case that pusher cylinder backward sensor 80b and signal cylinder backward sensor 70b are not turned on as a result of step S21 (step S22); moving the pusher cylinder 80 forward in the case that the pusher cylinder backward sensor 80b and the signal cylinder backward sensor 70b are turned on (step S23); confirming whether the pusher cylinder forward sensor 80a is turned on to confirm whether the pusher cylinder 80 which is moved forward at step S23 is completely forwarded (step S24); rearranging the position of the sensor in the case that the pusher cylinder forward sensor 80a is not turned on at step S24 (step S25); moving the signal cylinder 70 forward to insert a video connector into a signal block 11 of the palette 10 to supply the video signal to the monitor 20 to be tested by moving the signal cylinder 70 forward when the pusher cylinder forward sensor 80a is turned on as a result of step S24 (step S26); confirming whether a signal cylinder forward sensor 70a is turned on to confirm whether the signal cylinder 70 is completely forwarded (step S27); and rearranging the position of the sensor in the case that the signal cylinder forward sensor 70a is not turned on at step S27 (step S28).

Moreover, the step S40 of hammering the monitor 20 includes the steps of: confirming whether a zero angle sensor 40a (FIG.4) is turned on to confirm whether the rotation angle of the rotating cylinder 40 is zero, when the video signal is supplied and then displayed on the monitor 20 and the operator presses the start switch (step S41); rearranging the position of the sensor in the case that the zero angle sensor 40a is not turned on at step 541 (step S42); rotating the rotating cylinder 40 vertically when the zero angle sensor 40a is turned on at step S41 (step S43); confirming whether a vertical angle sensor 40b is turned on to confirm whether the rotating cylinder 40 is vertically rotated (step S44); rearranging the position of the sensor in the case that the vertical angle sensor 40b is not turned on at step S43 (step S45); and confirming whether the rotating cylinder 40 is rotated by a predetermined number of times when the vertical angle sensor 4 orb is turned on at step S44 (step S46).

The operator presses the end switch (not illustrated) after hammering by a predetermined times at step S40 (step S50).

The step S60 of releasing the palette 10 from the fixed state includes the steps of: separating the video connector from the signal block 11 by moving the signal cylinder 70 backward. (step S61); confirming whether signal cylinder backward sensor 70b is turned on to confirm whether the signal cylinder 70 is moved backward at step S61 (step S62); rearranging the position of the sensor in the case that the signal cylinder backward sensor 70b is not turned on at step S62 (step S63); moving the pusher cylinder 80 backward to separate the palette 10 in the case that the signal cylinder backward sensor 70b is turned on (step S64); confirming whether the pusher cylinder backward sensor 80b is turned on after the pusher cylinder 80 is completely moved backward (step S65); rearranging the position of the sensor in the case that the pusher cylinder backward sensor 80b is not turned on at step S65 (step S66); and transporting the monitor 20 which finishes the test to the next process by lowering a stopper which blocks the palette 10 from the flow of the conveyer belt in the case that the pusher cylinder backward sensor 80b is turned on at step S65 (step S67).

In the case that the relevant sensor is not activated when the relevant moving operation is performed, the operator can adjust the position of the sensor and then the next step can be performed.The step S40 of hammering the monitor 20 by the rotating cylinder 40 will be explained in detail.

First, when the monitor 20 to be tested is transported to the operational position after the palette confirming sensor 43 and a monitor confirming sensor 44 are sensed, the pusher cylinder 80 and the signal cylinder 70, which are located in backward positions initially, move forward.

Here, the pusher cylinder 80 fixes the palette 10 apart from the conveyer and the signal cylinder 70 supplies the video signal to the signal block 11 located on the fixed palette 10. Accordingly, on the screen of the monitor 20 which is previously connected to the signal block 11, a proper test pattern capable of determining whether the monitor properly functions in the case of the impact test is displayed.

The palette 10 used in the impact test process includes the signal block 11 for supplying the power and the video signal to the monitor 20 which is the test object.

After that, the operator presses the start switch for performing the impact test regarding the monitor 20 which is finally assembled. The rotating cylinder 40 is operated by a control program of a program logic controller (not illustrated). The angle initially formed between the hammering contact unit support 32 which is connected to the rotating cylinder 40, and the horizontal level is zero (0).

In other words, the initial position of the hammering contact unit support 32 indicates the position where the zero angle sensor 40a illustrated in FIG. 4 is turned on.

Moreover, to sense the rotation angle formed in rotating the hammering contact unit support 32, the zero angle sensor 40a and the vertical angle sensor 40b are located at a bracket for connecting the rotating unit and the hammering unit, or they are located at a position adjacent to the rotary shaft of the rotating cylinder 40. In other words, the angle initially formed between the hammering contact unit support 32 and the horizontal level is zero (o). At this time, this position is adjusted by the zero angle sensor 40a. On the other hand, the position where the hammering contact unit support 32 is completely rotated, i.e., the position where the hammering contact unit 31 which is mounted on the hammering contact unit support 32 hammers on the side of the case of the monitor 20, is adjusted by the vertical sensor 40b.

Here, the rotation angle when hammering the monitor 20 which is the test object can be adjusted by controlling the positions of the zero angle sensor 40a and the vertical angle sensor 40b. As the zero angle sensor 40a and the vertical angle sensor 40b for controlling the rotation angle, a proximity sensor or a limit switch can be used.

The operation of the hammering unit and the rotating unit which are located at the right side, which is seen from the front of the operator, will be explained with particular reference to figure 4.

When the rotating cylinder 40 is rotated by the control program of the program logic controller for the first time, the hammering contact unit support 32 which is connected to the rotating unit starts to be rotated clockwise.

After that, the hammering contact unit 31 which is mounted on the end of the hammering contact unit support 32 hammers the central part at the side of the case of the monitor 20 which is the test object. At this time, the position of the vertical sensor 40b is previously adjusted so that the hammering contact unit 31 can exactly hammer the central part at the side of the case of the monitor 20.

As described above, as soon as the vertical angle sensor 40b is activated by the rotating of the rotating cylinder 40 clockwise, the rotating cylinder 40 starts to be rotated back, anticlockwise, and thereby the hammering contact unit support 32 connected to the rotating unit is also rotated anticlockwise until the zero angle sensor 40a is activated.

By doing so, a hammering operation is completed.

At this time, by using the counting function when making out a control program of the program logic controller, the number of hammering operations on the side of the case of the monitor 20 can be controlled. The rotating operation of the hammering contact unit support 32 may be repeated by the predetermined number of times.

After completing the impact test on the monitor 20, when the operator presses the end switch, the signal cylinder 70 moves backward under control of the control program of the program logic controller, and the power cable and the video connector are separated from the monitor 20 which is located on the fixed palette 10.

The program logic controller moves backward a stopper cylinder 90 and the pusher cylinder 80 which are located forward and brings down the palette 10, on which the monitor 20 which has finished the test is located, in the conveyer thereby transporting the palette for the next process.

On the other hand, in the apparatus for impact testing of the electronic product, even if the sizes of the monitor 20 to be tested are various, the height H of the vertical support 61 and the width W of the horizontal support 60 are adjusted so that the hammering contact unit 31 of the hammering unit can hammer the central part of the side of the case of the monitor 20, as shown in FIG. 1, thereby coping with monitors having different heights and lengths.

Moreover, the apparatus for impact testing of the electronic product according to the present invention may also be used when performing the impact test on another electronic products.

As described above, the present invention provides apparatus for impact testing of electronic products, by automatically performing a process for hammering on a predetermined part at the case of the electronic product.

The operational labour can be minimised, thereby enhancing productivity.

In addition, as the apparatus for impact testing of the electronic product performs the impact test by an automated mechanical operation, an even, constant, impact force can be applied to all the monitors tested.

Claims

1. An apparatus for impact testing of an electronic product comprising: a hammering unit for applying the impact to a predetermined part of the electronic product; a rotating unit which is connected to one end of the hammering unit and rotates the hammering unit by a predetermined angle; and a supporting unit for fixing the hammering unit and rotating unit at a predetermined distance from the electronic product.

2. The apparatus of claim 1, wherein each of the hammering unit, rotating unit and the supporting unit is formed in a pair to hammer simultaneously on predetermined parts at two sides of the electronic product.

3. The apparatus of claim 1, wherein hammering unit comprises: a hammering contact unit support having a predetermined length which rotates centring on a rotary shaft of the rotating unit; and a hammering contact unit which is mounted at one end of the hammering contact unit support and contacts the electronic product in the case of hammering.

4. The apparatus of claim 1, wherein the rotating unit comprises a cylinder which is connected to the hammering unit and rotates the hammering unit by a predetermined angle.

5. The apparatus of claim 4, wherein the rotating unit further comprises a zero angle sensor and a vertical angle sensor which are located adjacent to the rotary shaft of the rotating unit so that the rotation angle formed by the rotation of the hammering unit can be adjusted.

6. The apparatus of claim 1, wherein the supporting unit comprises: a horizontal support for fixing and supporting the rotating unit so that a proper horizontal distance can be maintained between the rotating unit and the electronic product; and a vertical support for fixing and supporting the rotating unit so that a proper vertical distance can be maintained between the rotating unit and the electronic product.

7. The apparatus of claim 6, wherein the vertical support can be adjusted so that the hammering unit can be aligned with the vertically central part of the electronic product, as the size of the electronic product varies.

8. The apparatus of claim 6, wherein the horizontal support can be adjusted so that the hammering unit can be aligned with the horizontally central part at the side of the electronic product, as the size of the electronic product varies.

9. The apparatus of any of claims 1 to 8, wherein the electronic product includes a monitor.

10. The apparatus of any of claims 1 to 9, wherein the electronic product includes an external case, the impact being applied to the external case.

11. A method for impact testing an electronic product comprising the steps of: confirming whether a palette on which the electronic product which is the test object is located arrives at an operational position; fixing the palette and applying a predetermined signal to the electronic product, in the case that the palette is arrived at the operational position as a result of confirmation; hammering on the side of the electronic product using a hammering unit, by rotating a rotating cylinder; testing a signal outputted from the electronic product after hammering; and releasing the palette from the fixed state and stopping the supply of the signal.

12. A method according to claim 11 wherein the electronic product is a monitor, the predetermined signal is a video test pattern signal, and the signal outputted from the electronic product is a visual image of the test pattern.

13. A method for impact testing of a monitor comprising the steps of: confirming whether a palette on which a monitor is located arrives at an operational position; displaying a predetermined test pattern on the monitor by fixing the palette and supplying a video signal to the monitor, in the case of the palette is arrived at the operational position as a result of confirmation; hammering on the side of the case of the monitor using a hammering unit a predetermined number of times, by rotating a rotating cylinder through applying power; testing the variation of the test pattern, caused by the hammering; and releasing the palette from the fixed state by stopping the supply of the video signal.

14. The method of any of claims 11-13, wherein the step of confirming whether the palette on which the electronic product is located arrives at the operational position comprises the steps of: confirming whether the palette arrives at the operational position by a palette confirming sensor which is located at a predetermined position of the lower part of a conveyer belt; and confirming whether the electronic product to be tested is located on the palette.

15. The method of any of claims 11-14, wherein the step of hammering on the side of the case of the electronic product comprises the steps of: confirming whether the rotation angle of the rotating cylinder is zero through a zero angle sensor; rotating the rotating cylinder to a vertical position; confirming whether the rotation angle of the rotating cylinder is 90 degrees through a vertical angle sensor; and confirming whether the rotating cylinder has rotated by a predetermined number of times.

16. An apparatus for impact testing of an electronic product substantially as described, with reference to the accompanying drawings.

17. A method for impact testing of an electronic product substantially as described, with reference to the accompanying drawings.