GB2295285B - Signal input unit for semiconductor memory device - Google Patents

Signal input unit for semiconductor memory device

Info

Publication number
GB2295285B
GB2295285B GB9523779A GB9523779A GB2295285B GB 2295285 B GB2295285 B GB 2295285B GB 9523779 A GB9523779 A GB 9523779A GB 9523779 A GB9523779 A GB 9523779A GB 2295285 B GB2295285 B GB 2295285B
Authority
GB
United Kingdom
Prior art keywords
memory device
input unit
signal input
semiconductor memory
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9523779A
Other languages
English (en)
Other versions
GB2295285A (en
GB9523779D0 (en
Inventor
Jae Jin Lee
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SK Hynix Inc
Original Assignee
Hyundai Electronics Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hyundai Electronics Industries Co Ltd filed Critical Hyundai Electronics Industries Co Ltd
Publication of GB9523779D0 publication Critical patent/GB9523779D0/en
Publication of GB2295285A publication Critical patent/GB2295285A/en
Application granted granted Critical
Publication of GB2295285B publication Critical patent/GB2295285B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
    • H10D89/811—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using FETs as protective elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
    • H10D89/611—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using diodes as protective elements
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection
    • H03K19/00315—Modifications for increasing the reliability for protection in field-effect transistor circuits
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
    • H10D89/911—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using passive elements as protective elements

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Logic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Electronic Switches (AREA)
GB9523779A 1994-11-21 1995-11-21 Signal input unit for semiconductor memory device Expired - Fee Related GB2295285B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019940030633A KR0137972B1 (ko) 1994-11-21 1994-11-21 반도체 소자의 신호 입력장치

Publications (3)

Publication Number Publication Date
GB9523779D0 GB9523779D0 (en) 1996-01-24
GB2295285A GB2295285A (en) 1996-05-22
GB2295285B true GB2295285B (en) 1999-06-30

Family

ID=19398523

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9523779A Expired - Fee Related GB2295285B (en) 1994-11-21 1995-11-21 Signal input unit for semiconductor memory device

Country Status (5)

Country Link
US (1) US5689396A (forum.php)
JP (1) JPH08256045A (forum.php)
KR (1) KR0137972B1 (forum.php)
GB (1) GB2295285B (forum.php)
TW (1) TW283799B (forum.php)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6844600B2 (en) * 1998-09-03 2005-01-18 Micron Technology, Inc. ESD/EOS protection structure for integrated circuit devices
KR100323453B1 (ko) * 1999-12-30 2002-02-06 박종섭 정전기방전 보호회로
US8918138B2 (en) * 2010-08-13 2014-12-23 Broadcom Corporation Receive band selection and electrostatic discharge protection in a transceiver

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0177692A2 (en) * 1984-08-09 1986-04-16 Fujitsu Limited Protection device in an integrated circuit
US4860148A (en) * 1986-04-14 1989-08-22 Hitachi, Ltd. Semiconductor integrated circuit device with a protective circuit
GB2220791A (en) * 1988-07-11 1990-01-17 Samsung Electronics Co Ltd An input protection device for a semiconductor integrated circuit

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4147990A (en) * 1978-03-07 1979-04-03 American Optical Corporation Fast-recovery circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0177692A2 (en) * 1984-08-09 1986-04-16 Fujitsu Limited Protection device in an integrated circuit
US4860148A (en) * 1986-04-14 1989-08-22 Hitachi, Ltd. Semiconductor integrated circuit device with a protective circuit
GB2220791A (en) * 1988-07-11 1990-01-17 Samsung Electronics Co Ltd An input protection device for a semiconductor integrated circuit

Also Published As

Publication number Publication date
TW283799B (forum.php) 1996-08-21
US5689396A (en) 1997-11-18
GB2295285A (en) 1996-05-22
GB9523779D0 (en) 1996-01-24
KR960019694A (ko) 1996-06-17
JPH08256045A (ja) 1996-10-01
KR0137972B1 (ko) 1998-04-28

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20131121