GB2268802B - Electron spectroscopy apparatus - Google Patents
Electron spectroscopy apparatusInfo
- Publication number
- GB2268802B GB2268802B GB9313950A GB9313950A GB2268802B GB 2268802 B GB2268802 B GB 2268802B GB 9313950 A GB9313950 A GB 9313950A GB 9313950 A GB9313950 A GB 9313950A GB 2268802 B GB2268802 B GB 2268802B
- Authority
- GB
- United Kingdom
- Prior art keywords
- electron spectroscopy
- spectroscopy apparatus
- electron
- spectroscopy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
- G01N23/2273—Measuring photoelectron spectrum, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS]
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K7/00—Gamma- or X-ray microscopes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/085—Investigating materials by wave or particle radiation secondary emission photo-electron spectrum [ESCA, XPS]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/20—Sources of radiation
- G01N2223/204—Sources of radiation source created from radiated target
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4205954A JP2764505B2 (ja) | 1992-07-09 | 1992-07-09 | 電子分光方法とこれを用いた電子分光装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
GB9313950D0 GB9313950D0 (en) | 1993-08-18 |
GB2268802A GB2268802A (en) | 1994-01-19 |
GB2268802B true GB2268802B (en) | 1995-12-20 |
Family
ID=16515457
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9313950A Expired - Fee Related GB2268802B (en) | 1992-07-09 | 1993-07-06 | Electron spectroscopy apparatus |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2764505B2 (ja) |
DE (1) | DE4322852C2 (ja) |
GB (1) | GB2268802B (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2752101B1 (fr) * | 1996-07-30 | 1998-10-09 | Commissariat Energie Atomique | Dispositif de generation d'impulsions ultra-courtes de rayonnement x |
DE19924204A1 (de) * | 1999-05-27 | 2000-11-30 | Geesthacht Gkss Forschung | Einrichtung und Verfahren zur Erzeugung von Röntgenstrahlen |
EP2557416A3 (en) * | 2002-04-17 | 2013-02-27 | Ebara Corporation | Sample surface inspection apparatus and method |
JP5110812B2 (ja) * | 2006-07-14 | 2012-12-26 | 日本電子株式会社 | オージェ電子分光による化学状態分析法及び装置 |
CN106198581B (zh) * | 2016-08-30 | 2023-04-07 | 中国工程物理研究院激光聚变研究中心 | 一种基于激光驱动固体靶的超短x射线双角度双色背光照相系统 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4435828A (en) * | 1982-04-14 | 1984-03-06 | Battelle Development Corporation | Fluorescence laser EXAFS |
JPH0225737A (ja) * | 1988-07-15 | 1990-01-29 | Hitachi Ltd | 表面分析方法および装置 |
JPH0718960B2 (ja) * | 1989-08-25 | 1995-03-06 | 株式会社島津製作所 | X線顕微鏡 |
JP3152455B2 (ja) * | 1991-08-02 | 2001-04-03 | 浜松ホトニクス株式会社 | 荷電粒子のエネルギー分布測定装置 |
-
1992
- 1992-07-09 JP JP4205954A patent/JP2764505B2/ja not_active Expired - Lifetime
-
1993
- 1993-07-06 GB GB9313950A patent/GB2268802B/en not_active Expired - Fee Related
- 1993-07-08 DE DE19934322852 patent/DE4322852C2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH0627058A (ja) | 1994-02-04 |
DE4322852C2 (de) | 1999-10-14 |
JP2764505B2 (ja) | 1998-06-11 |
GB2268802A (en) | 1994-01-19 |
GB9313950D0 (en) | 1993-08-18 |
DE4322852A1 (de) | 1994-01-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20110706 |