GB2208143A - Method of transferring Bloch lines - Google Patents

Abstract

A transfer method for transferring Bloch lines present in the magnetic wall of a magnetic section formed in a magnetic thin film along the magnetic wall has the steps of distributing a predetermined soft magnetic material layer pattern 12 on the magnetic thin film 4, giving the soft magnetic material layer pattern magnetization parallel to the film surface of the magnetic thin film to form a potential well in the magnetic thin film, positioning the Bloch lines in the potential well, and varying the direction of the magnetization of the soft magnetic material layer pattern in a plane parallel to the film surface to move the potential well along the magnetic wall and transfer the Bloch lines. <IMAGE>

Description

TITLE OF THE INVENTION Method of Transferring Bloch Lines BACKGROUND OF THE INVENTION Field of the Invention This invention relates to a method of transferring Bloch lines present in the magnetic wall of a magnetic section formed in a magnetic thin film along the magnetic wall.

Related Background Art Nowadays, various memory devices such as magnetic tapes, Winchester discs, floppy discs, optical discs, magneto-optical discs and magnetic bubble memories are used as memories such as outside memories for computers, memories for electronic file and memories for still picture file. Among these memory devices, the other memories than the magnetic bubble memories requires the recording-reproducing head to be moved relative to the memory during the recording and reproduction of information. That is, with such relative movement of the head, rows of information are fixedly recorded on information tracks by the head or the rows of information fixedly recorded on the information tracks are reproduced by the head.

However, as a higher degree of recording density has been gradually required in recent years, there have arisen various problems, that is, tracking control for causing the head to accurately follow the information tracks has become complicated, the quality of recorded and reproduced signals has been deteriorated because of said control being insufficient, the quality of recorded and reproduced signals has been deteriorated by the vibration of the head moving mechanism or by dust or the like adhering to the surface of the memory, and further, in the case of a memory in which recording and reproduction are effected with the head being in contact with a magnetic tape or the like, abrasion has been caused by sliding, and in the case of a memory such as an optical disc in which recording and reproduction are effected with the head being in non-contact with the disc, highly accurate focusing control for focusing has become necessary, and the quality of recorded and reproduced signals has been deteriorated because of said control being insufficient.

On the other hand, the magnetic bubble memory, as shown in the applicant's U.S. Application Serial No. 801,401, can effect recording of information at a predetermined position and transfer the recorded information and can reproduce the information at a predetermined position while transferring the information and therefore, does not require the relative movement of the head during recording and reproduction.

Therefore, it does not pose the problems as noted above even when making the recording density higher in degree, and can realize high reliability.

However, the magnetic bubble memory uses as information bits circular magnetic sections (bubbles) created by applying a magnetic field to a magnetic thin film such as a magnetic garnet film having a readily magnetizable axis in a direction perpendicular to the film surface thereof and therefore, even if use is made of a minimum bubble (diameter 0.3 pm) limited from the material characteristic of the 2 present-day garnet film, several tens of M bits/cm is the limit of the recording density and a higher degree of recording density is difficult to realize.

v So, recently, attention has been paid to a Bloch line memory as a memory having a recording density exceeding the limit of the recording density of the above-described magnetic bubble memory. This Bloch line memory, as shown in U.S. Patent 4,583,200, uses as information bits a pair of nail magnetic wall structures (Bloch lines) interposed between Bloch magnetic wall structures existing around a magnetic section created in a magnetic thin film and therefore, it permits the recording density to be made higher by about two figures as ~compared with the above-described magnetic bubble memory. For example, where use is made of a garnet film of bubble diameter 0.5 vm, a recording density of 1.6 G bits/cm2 can be achieved.

Figure 1 of the accompanying drawings shows a schematic perspective view of an example of the magnetic material structure constituting a Bloch line memory.

In Figure 1, the reference numeral 2 designates a substrate formed of non-magnetic garnet such as GGG or NdGG, and a magnetic garnet thin film 4 is provided on the substrate 2. The film 4 can be formed, for example, by a liquid phase epitaxial growing method (LPE method), and the thickness thereof is, for example, of the order of 5 pm. The reference numeral 6 denotes a stripe-like magnetic section formed in the magnetic garnet thin film 4, and a magnetic wall 8 is formed as a boundary with the other area of the magnetic section 6. The width of the stripe-like magnetic section 6 is, for example, of the order of 5 pm, and the length thereof is, for example, of the order of 100 pm. The thickness of the magnetic wall 8 is, for example, of the order of 0.5 pm.As indicated by arrows, the direction of magnetization in the magnetic section 6 is upward while, on the other hand, the direction of magnetization outside the magnetic section 6 is downward.

The direction of magnetization in the magnetic wall 8 rotates as if it were gradually twist ed from the inner surface (i.e., the surface adjacent to the magnetic section 6) side toward the outer surface side. The direction of this rotation is converse on the opposite sides of the magnetic wall 8 with Bloch lines 10 present vertically in the magnetic wall 8 as the boundary. In Figure 1, the direction of magnetization in the central portion in the direction of thickness of the magnetic wall 8 is indicated by arrows, and the direction of magnetization in the Bloch lines 10 is likewise indicated.

A downward bias magnetic field H B is applied from the outside to the magnetic material structure as described above.

As shown, there are two kinds of Bloch lines 10 differing in the direction of magnetization, and the presence and absence of the pair of Bloch lines are made to correspond to information "1" and information "0", respectively. The pair of Bloch lines exist in potential wells formed at a certain period along the magnetic wall 8. Also, the pair of Bloch lines are successively transferred to the adjacent potential well by apply a pulse magnetic field perpendicular to the surface of the substrate.

Thus, recording of information into the Bloch line memory (writing of the pair of Bloch lines into the magnetic wall 8) and reproduction of the information recorded in the Bloch line memory (reading-out of the pair of Bloch lines in the magnetic wall 8) can be accomplished at respective predetermined positions while the pair of Bloch lines are transferred in the magnetic wall 8. The recording and reproduction of said information can be accomplished by applying to the end portion of the stripe-like magnetic section 6 a pulse magnetic field of predetermined intensity perpendicular to the surface of the substrate, and although not shown, as pulse magnetic field applying means for recording and reproduction, conductor patterns for the supply of pulses are formed on the surface of the magnetic thin film 4 in predetermined positional relationship with the stripe-like magnetic section 6.

In the Bloch line memory as described above, the formation of the potential well for the pair of Bloch lines is accomplished as by providing periodic regular patterns on the surface of the magnetic thin film so as to cross the magnetic wall.

Figure 2 of the accompanying drawings is a fragmentary plan view of the Bloch line memory showing an example of such patterns.

In Figure 2, a number of line-like patterns 9 extending across the stripe-like magnetic section 6 and parallel to one another are provided on the surface of the magnetic thin film 4. These patterns each comprise a layer of a conductor such as Cr, Al, Au or Ti, the width thereof is, for example, of the order of 0.5 pm and the arrangement pitch thereof is, for example, of the order of 1 pm. By magnetic strain based on the formation of such pattern-like conductor layers, potential wells can be formed in the magnetic wall 8 and moreover, the arrangement thereof can be made regular and periodic. As the patterns 9, besides the above-mentioned conductor layers, use may be made of magnetic material layers or ions such as H ions, He ions or Ne ions driven into the vicinity of the surface of the magnetic thin film 4 in the form of said patterns.Also, potential wells formed by these patterns are symmetrical with respect to the direction of transfer of the Bloch lines indicated by arrows.

Now, the transfer of the Bloch lines is accomplished by applying a pulse magnetic field perpendicular to the film surface of the magnetic thin film 4, and moving the Broch lines to the adjacent potential well by the utilization of the precessional movement of magnetization caused thereby. At this time, an asymmetrical pulse magnetic field as shown in Figure 3 of the accompanying drawings is used as the perpendicular pulse magnetic field Hp to thereby irreversibly transfer the Bloch lines in a particular direction.

As described above, in the conventional Bloch line transfer, utilization is made of the transient response characteristic of the magnetization by the application of a perpendicular pulse magnetic field and therefore, there has been the problem that if the wave form of the pulse magnetic field is slightly disturbed or the magnetic thin film 4 has defect, accurate transfer of the Bloch lines becomes difficult.

SUMMARY OF THE INVENTION The present invention has been made in view of the above-noted problem peculiar to the prior art and the object thereof is to provide a Bloch line transfer method which can always accurately transfer Bloch lines.

To achieve the above object, the present invention provides a method of transferring Bloch lines present in the magnetic wall of a magnetic section formed is a magnetic thin film along said magnetic wall, characterized by distributing a predetermined soft magnetic material layer pattern on said magnetic thin film, imparting to said pattern magnetization parallel to the film surface of said magnetic thin film to thereby form a potential well in said magnetic thin film, positioning said Bloch lines in said potential well, varying the direction of the magnetization of said pattern in a plane parallel to said film surface to thereby move said potential well along said magnetic wall, thereby transferring said Bloch lines.

In the present invention, the potential well is a place which forms an extremal value of the magnetic potential formed in at least the magnetic wall portion of the magnetic thin film, and refers to a place having the ability to trap the Bloch lines (a pair).

Further features and specific form of the present invention will hereinafter be described in detail.

BRIEF DESCRIPTION OF THE DRAWINGS , Figure 1 is a schematic perspective view of a magnetic material structure constituting a Bloch line memory.

Figure 2 is a fragmentary plan view of a prior-art Bloch line memory and shows patterns for forming potential wells.

Figure 3 is a graph showing the wave form of a pulse magnetic field used in the conventional Bloch line transfer.

Figure 4 is a fragmentary plan view of a Bloch line memory using the transfer method of the present invention.

Figure 5 is a cross-sectional view of the portion X - X of the Bloch line memory shown in Figure 4.

Figures 6A - 6D illustrate a variation in the X-direction component Hx of a magnetic field produced in the magnetic wall.

Figure 7 is a schematic block diagram of a magnetic memory apparatus for transferring Bloch lines by the transfer method of the present invention DESCRIPTION OF THE PREFERRED EMBODIMENT A specific embodiment of the present invention will hereinafter be described with reference, to the drawings.

Figure 4 is a fragmentary plan view showing an embodiment of a Bloch line memory using the transfer method according to the present invention, and Figure 5 is a cross-sectional view of the portion X - X of Fi#gure 4.

In these figures, the reference numeral 2 designates a non-magnetic garnet substrate, and the reference numeral 4 denotes a magnetic garnet thin film. A magnetic section 6 of a stripe-like planar shape is formed in the magnetic garnet thin film 4.

The reference numeral 8 designates a magnetic wall around the stripe-like magnetic section 6. These are similar to those described above in connection with Figure 1.

The direction of magnetization in the stripelike magnetic section 6 is upward, and the direction of magnetization in that portion of the magnetic thin film 4 which is outside the magnetic section 6 is downward. A downward bias magnetic field is applied from the outside.

A pattern comprising soft magnetic material layers 12 is distributed on the surface of the magnetic thin film 4. The soft magnetic material may be, for example, a permalloy alloy. In the present embodiment, spacer layers 14 intervene between the soft magnetic material layers 12 and the magnetic thin film 4. The spacer layers 14 may be formed of a non-magnetic material such as SiO2.

Description will now be made of the transfer of the Bloch lines in the present embodiment.

Figures 6A - 6D show a variation (potential) in the component HX of a magnetic field in X direction caused in the portion L of the magnetic wall 8 on the basis of the magnetization induced in the soft magnetic material layers 12 when in Figure 4, an insurface magnetic field rotating clockwise in the film surface of the magnetic thin film 4 as shown by A -) B + C + D is applied. Figures 6A - 6D show HX when the directions of the in-surface magnetic field are A, B, C and D, respectively, in Figure 4.

Here, it has been assumed that the magnetization of the soft magnetic material layers 12 is 800 emu/cc, the thickness of the soft magnetic material layers 12 is 8000 Ac and the thickness of the spacer layers 14 is 2 pm. The spacer layers 14 are used to adjust the ratio between that component of the magnetic field formed in the magnetic thin film 4 on the basis of the magnetization in the soft magnetic material layer 12 which is in a direction perpendicular to the film surface and that component of said magnetic field which is in a direction parallel to the film surface, and this ratio is adjusted by controlling the thickness of the spacer layers 14, whereby stabilization of the Bloch lines can be achieved.

As can be seen from Figures 6A - 6D, as the direction of the magnetic field rotates clockwise, the maximum value position and the minimum value position of Hx gradually move leftward. As shown in Figures 1 and 2, the pair of Bloch lines have magnetization in X direction intermediately thereof and therefore, become stable at the maximum value position or the minimum value position of said Hx and are successively moved leftward with the movement of said extremal value (potential well), whereby the transfer of the Bloch lines is accomplished.

In Figure 4, on the side opposed to the portion L of the magnetic wall 8, the pattern of the soft magnetic material layers 12 is converse to that on the side of the portion L and therefore, in the portion L' of the magnetic wall 8, the direction of movement of the extremal value position of Hx by the application of said clockwise in-surface rotating magnetic field is rightward and after all, the extremal value moves counter-clockwise over the entire magnetic wall 8 as indicated by arrow T in Figure 4, and thus the transfer of the Bloch lines is accomplished.

In the above-described embodiment, the pattern shown in Figure 4 is used as the pattern of the soft magnetic material layers 12, but in the present invention, other pattern may also be used as long as it produces a magnetic potential of which the extremal value moves along the magnetic wall 8 toward the surface of the magnetic thin film in the magnetic wall 8, on the basis of the magnetization induced in the soft magnetic material layers 12 by the application of an in-surface rotating magnetic field. This pattern is formed so that when as shown in Figure 4, the pattern is divided into an upper and a lower pattern by the center line (line X - X) of the stripe-like magnetic section 6, the upper and lower patterns may assume similar shapes when rotated by 1800. Thereby, the potential well can move in one direction along the magnetic wall.

As described above, the potential for controlling the position of the Bloch lines of which the extremal value providing the potential well moves is formed along the magnetic wall and the transfer of the Bloch lines is accomplished by the in-surface rotating magnetic field and thus, sable and reliable transfer of the Bloch lines becomes possible.

Figure 7 is a schematic block diagram showing an example of a magnetic memory apparatus for transferring a Bloch line which is an information carrier by the utilization of the transfer method of the present invention and effecting write-in and read-out of information.

In Figure 7, the reference numeral 101 designates a Bloch line memory substrate. On the substrate 101, as shown, a plurality of stripe-like magnetic sections 6 are arranged at a predetermined pitch in a direction orthogonal to the lengthwise direction of the stripe-like magnetic sections. A pattern comprising soft magnetic material layers as shown in Figure 4 is distributed on the magnetic thin film including the stripe-like magnetic sections 6, and the soft magnetic material layers are magnetized in a predetermined direction by the action of an insurface magnetic field which will be described later, and a predetermined magnetic potential is formed on the magnetic thin film, particularly, the magnetic wall of the stripe-like magnetic sections 6.Bloch lines are positioned in the potential well in said potential, and record information is stored as a time-serial signal shown by the distribution of the Bloch lines.

The reference numeral 102 designates a magnetic bubble generator which generates magnetic bubbles in a time-serial fashion in accordance with input information. The magnetic bubbles generated time-serially are successively transferred to the end position of the corresponding stripe-like magnetic section 6 by a write-in driver 105. These magnetic bubbles are used for the write-in of the Bloch lines.

On the other hand, the reference numeral 106 denotes a read-out driver which converts the Bloch lines into magnetic bubbles for the purpose of reproducing the information, and thereafter transfers these magnetic bubbles to a bubble detector 107.

The bubble detector 107 detects the magnetic bubbles transferred thereto by the read-out driver 106, by the utilization of the magnetic resistance effect or the like, and outputs a time-serial (electrical) signal corresponding to the record information.

The reference numeral 103 designates a writein current source for supplying a current to writein conductors 111 when writing the Bloch lines into the end portion of each stripe-like magnetic section 6, and the reference numeral 104 denotes a read-out current source for supplying a current to read-out conductors 114 when reading out the Bloch lines in the end portion of each stripe-like magnetic section 6.

The reference numeral 110 designates an insurface rotating magnetic field generator which forms a magnetic field parallel to the film surface of the magnetic thin film of the Bloch line memory substrate 101 and also varies the direction of this magnetic field as described in connection with Figure 4. That is, it rotates the direction of the magnetic field to thereby move the potential well formed in the magnetic wall a#long the magnetic wall, thereby accomplishing the transfer of the Bloch lines.

The reference numeral 109 denotes a control circuit which controls the drivers 105, 106, the generators 102, 110, the detector 107 and the sources 103, 104 in accordance with an input signal IN.

A method of forming Bloch lines in the magnetic wall of the end portions of the stripe-like magnetic sections 6 in the magnetic memory apparatus of Figure 7 and a method of converting the Bloch lines in the end# portions of the stripe-like magnetic sections 6 are described in detail in the aforementioned U.S. Patent 4,583,200 and therefore, these methods need not be described herein.

The transfer of the Bloch lines (a pair) by the magnetic field generator 110 and the write-in of the Bloch lines by the write-in conductors ill or the read-out of the Bloch lines by the read-out conductors 114 are executed in synchronism with each other by the control circuit 109. By transferring the Bloch lines by the transfer method of the present invention, the Bloch lines (a pair) can be accurately moved and the performance in recording/reproduction of information is greatly improved.

Claims (9)

1. A transfer method for transferring Bloch lines present in the magnetic wall of a magnetic section formed in a magnetic thin film along said magnetic wall, having the steps of: distributing a predetermined soft magnetic material layer pattern on said magnetic thin film; giving said soft magnetic material layer pattern magnetization parallel to the film surface of said magnetic thin film to form a potential well in said magnetic thin film; positioning said Bloch lines in said potential well; and varying the direction of the magnetization of said soft magnetic material layer pattern in a plane parallel to said film surface to move said potential well along said magnetic wall and transfer said Bloch lines.

2. A transfer method according to Claim 1, wherein said step of varying the direction of the magnetization has the step of rotating a magnetic field for giving said soft magnetic material layer pattern magnetization in a plane parallel to said film surface.

3. A transfer method according to Claim 1, wherein said step of distributing has the step of forming said soft magnetic material layer pattern on a spacer layer of a predetermined thickness formed on said magnetic thin film.

4. A transfer method according to Claim 3, wherein said spacer layer is formed of SiO2.

5. A Bloch line memory for effecting recording/ reproduction of information by the use of Bloch lines present in the magnetic wall of a magnetic section formed in a magnetic thin film, having a predetermined soft magnetic material layer pattern distributed on said magnetic thin#film, and magnetic field generating means for applying a magnetic field parallel to the film surface of said magnetic thin film to said soft magnetic material layer pattern, a potential well formed in said magnetic thin film by the magnetized soft magnetic material layer pattern being moved along said magnetic wall by varying the direction of the magnetic field by said generating means, and with said movement, the Bloch lines trapped in said potential well being transferred.

6. A Bloch line memory according to Claim 5, wherein said magnetic thin film has a spacer layer formed thereon, and said soft magnetic material layer pattern is formed on said spacer layer.

7. A Bloch line memory according to Claim 6, wherein said spacer layer is formed of SiO2.

8. A Bloch memory substantially as described with reference to figures 4 to 7 of the drawings.

9. A method of operating of Bloch memory, substantially as described with reference to figures 4 to 7 of the drawings.