GB2058366B - Testing of integrated circuits - Google Patents

Testing of integrated circuits

Info

Publication number
GB2058366B
GB2058366B GB8024411A GB8024411A GB2058366B GB 2058366 B GB2058366 B GB 2058366B GB 8024411 A GB8024411 A GB 8024411A GB 8024411 A GB8024411 A GB 8024411A GB 2058366 B GB2058366 B GB 2058366B
Authority
GB
United Kingdom
Prior art keywords
testing
integrated circuits
circuits
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB8024411A
Other versions
GB2058366A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Post Office
Original Assignee
Post Office
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Post Office filed Critical Post Office
Priority to GB8024411A priority Critical patent/GB2058366B/en
Publication of GB2058366A publication Critical patent/GB2058366A/en
Application granted granted Critical
Publication of GB2058366B publication Critical patent/GB2058366B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
GB8024411A 1979-08-02 1980-07-25 Testing of integrated circuits Expired GB2058366B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB8024411A GB2058366B (en) 1979-08-02 1980-07-25 Testing of integrated circuits

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB7927009 1979-08-02
GB8024411A GB2058366B (en) 1979-08-02 1980-07-25 Testing of integrated circuits

Publications (2)

Publication Number Publication Date
GB2058366A GB2058366A (en) 1981-04-08
GB2058366B true GB2058366B (en) 1983-03-30

Family

ID=26272413

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8024411A Expired GB2058366B (en) 1979-08-02 1980-07-25 Testing of integrated circuits

Country Status (1)

Country Link
GB (1) GB2058366B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2557703B1 (en) * 1984-01-04 1986-07-25 Vladimirsky Ruslan METHOD FOR CONTROLLING INTEGRATED CIRCUITS AND INTEGRATED CIRCUIT SYSTEMS
FR2591349B1 (en) * 1985-12-10 1988-03-04 Telecommunications Sa PROCESS FOR TESTING A TREATMENT PLATE WITH DIRECT INJECTION INPUT CIRCUITS AND TREATMENT PLATE ARRANGED FOR THIS TEST
US4862070A (en) * 1987-10-30 1989-08-29 Teradyne, Inc. Apparatus for testing input pin leakage current of a device under test

Also Published As

Publication number Publication date
GB2058366A (en) 1981-04-08

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Legal Events

Date Code Title Description
732 Registration of transactions, instruments or events in the register (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee