FR2557703B1 - METHOD FOR CONTROLLING INTEGRATED CIRCUITS AND INTEGRATED CIRCUIT SYSTEMS - Google Patents

METHOD FOR CONTROLLING INTEGRATED CIRCUITS AND INTEGRATED CIRCUIT SYSTEMS

Info

Publication number
FR2557703B1
FR2557703B1 FR8400066A FR8400066A FR2557703B1 FR 2557703 B1 FR2557703 B1 FR 2557703B1 FR 8400066 A FR8400066 A FR 8400066A FR 8400066 A FR8400066 A FR 8400066A FR 2557703 B1 FR2557703 B1 FR 2557703B1
Authority
FR
France
Prior art keywords
circuit systems
controlling
integrated circuit
integrated circuits
integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8400066A
Other languages
French (fr)
Other versions
FR2557703A1 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to FR8400066A priority Critical patent/FR2557703B1/en
Publication of FR2557703A1 publication Critical patent/FR2557703A1/en
Application granted granted Critical
Publication of FR2557703B1 publication Critical patent/FR2557703B1/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
FR8400066A 1984-01-04 1984-01-04 METHOD FOR CONTROLLING INTEGRATED CIRCUITS AND INTEGRATED CIRCUIT SYSTEMS Expired FR2557703B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8400066A FR2557703B1 (en) 1984-01-04 1984-01-04 METHOD FOR CONTROLLING INTEGRATED CIRCUITS AND INTEGRATED CIRCUIT SYSTEMS

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8400066A FR2557703B1 (en) 1984-01-04 1984-01-04 METHOD FOR CONTROLLING INTEGRATED CIRCUITS AND INTEGRATED CIRCUIT SYSTEMS

Publications (2)

Publication Number Publication Date
FR2557703A1 FR2557703A1 (en) 1985-07-05
FR2557703B1 true FR2557703B1 (en) 1986-07-25

Family

ID=9299821

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8400066A Expired FR2557703B1 (en) 1984-01-04 1984-01-04 METHOD FOR CONTROLLING INTEGRATED CIRCUITS AND INTEGRATED CIRCUIT SYSTEMS

Country Status (1)

Country Link
FR (1) FR2557703B1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1873537B1 (en) * 2006-06-29 2011-02-16 St Microelectronics S.A. Detection of type of detector of disturbance peaks in the power supply of an integrated circuit

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4045736A (en) * 1971-09-27 1977-08-30 Ibm Corporation Method for composing electrical test patterns for testing ac parameters in integrated circuits
GB2058366B (en) * 1979-08-02 1983-03-30 Post Office Testing of integrated circuits

Also Published As

Publication number Publication date
FR2557703A1 (en) 1985-07-05

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Legal Events

Date Code Title Description
ST Notification of lapse