GB201808325D0 - Apparatus For Monitoring A Coating - Google Patents

Apparatus For Monitoring A Coating

Info

Publication number
GB201808325D0
GB201808325D0 GBGB1808325.3A GB201808325A GB201808325D0 GB 201808325 D0 GB201808325 D0 GB 201808325D0 GB 201808325 A GB201808325 A GB 201808325A GB 201808325 D0 GB201808325 D0 GB 201808325D0
Authority
GB
United Kingdom
Prior art keywords
monitoring
coating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB1808325.3A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3d Automated Metrology Inspection Ltd
Original Assignee
3d Automated Metrology Inspection Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3d Automated Metrology Inspection Ltd filed Critical 3d Automated Metrology Inspection Ltd
Priority to GBGB1808325.3A priority Critical patent/GB201808325D0/en
Publication of GB201808325D0 publication Critical patent/GB201808325D0/en
Priority to GB1907178.6A priority patent/GB2575543A/en
Priority to PCT/GB2019/051404 priority patent/WO2019224534A1/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09—Shape and layout
    • H05K2201/09818—Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
    • H05K2201/09918—Optically detected marks used for aligning tool relative to the PCB, e.g. for mounting of components
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/07—Treatments involving liquids, e.g. plating, rinsing
    • H05K2203/0756—Uses of liquids, e.g. rinsing, coating, dissolving
    • H05K2203/0759—Forming a polymer layer by liquid coating, e.g. a non-metallic protective coating or an organic bonding layer
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
GBGB1808325.3A 2018-05-21 2018-05-21 Apparatus For Monitoring A Coating Ceased GB201808325D0 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
GBGB1808325.3A GB201808325D0 (en) 2018-05-21 2018-05-21 Apparatus For Monitoring A Coating
GB1907178.6A GB2575543A (en) 2018-05-21 2019-05-21 Apparatus for monitoring a coating
PCT/GB2019/051404 WO2019224534A1 (en) 2018-05-21 2019-05-21 Apparatus for monitoring a coating

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB1808325.3A GB201808325D0 (en) 2018-05-21 2018-05-21 Apparatus For Monitoring A Coating

Publications (1)

Publication Number Publication Date
GB201808325D0 true GB201808325D0 (en) 2018-07-11

Family

ID=62812532

Family Applications (2)

Application Number Title Priority Date Filing Date
GBGB1808325.3A Ceased GB201808325D0 (en) 2018-05-21 2018-05-21 Apparatus For Monitoring A Coating
GB1907178.6A Withdrawn GB2575543A (en) 2018-05-21 2019-05-21 Apparatus for monitoring a coating

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB1907178.6A Withdrawn GB2575543A (en) 2018-05-21 2019-05-21 Apparatus for monitoring a coating

Country Status (2)

Country Link
GB (2) GB201808325D0 (en)
WO (1) WO2019224534A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11497124B2 (en) * 2020-06-09 2022-11-08 Io Tech Group Ltd. Methods for printing conformal materials on component edges at high resolution
CN117091516B (en) * 2022-05-12 2024-05-28 广州镭晨智能装备科技有限公司 Method, system and storage medium for detecting thickness of circuit board protective layer

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10204943B4 (en) * 2002-02-07 2005-04-21 Leica Microsystems Jena Gmbh Method for determining layer thicknesses
US8315834B2 (en) * 2003-12-17 2012-11-20 Siemens Energy, Inc. System and method for measuring coating thickness
FR2872897B1 (en) * 2004-07-06 2006-10-13 Commissariat Energie Atomique OPTICAL DEVICE FOR MEASURING THE THICKNESS OF AT LEAST PARTIALLY TRANSPARENT MEDIA
EP1643209B1 (en) * 2004-09-30 2020-11-04 Ansaldo Energia IP UK Limited Method for measuring a coating thickness
US20080158572A1 (en) * 2006-12-27 2008-07-03 Honeywell, Inc. System and method for measurement of thickness of thin films
EP2312267A1 (en) * 2009-10-19 2011-04-20 Siemens Aktiengesellschaft Device and method for measuring thickness of coating with laser triangulation
US9593939B1 (en) * 2013-12-30 2017-03-14 Flextronics Ap, Llc Glue thickness inspection (GTI)
KR101848173B1 (en) * 2016-11-24 2018-05-24 한양대학교 산학협력단 Apparatus and method for printed circuit board coating inspection

Also Published As

Publication number Publication date
GB201907178D0 (en) 2019-07-03
WO2019224534A1 (en) 2019-11-28
GB2575543A (en) 2020-01-15

Similar Documents

Publication Publication Date Title
GB2568478B (en) Apparatus for monitoring a fluid
PL3634201T3 (en) Apparatus for performing a bronchoscopy
EP3937767A4 (en) Apparatus for monitoring a subject
EP3973177C0 (en) Fluid monitoring apparatus
GB2572767B (en) Apparatus for monitoring a measurand
GB201907178D0 (en) Apparatus for monitoring a coating
GB201811428D0 (en) Apparatus for manufacturing a container
GB2613124B (en) Apparatus for monitoring a fluid
GB201909538D0 (en) Deposition apparatus
GB201811425D0 (en) Apparatus for manufacturing a container
EP3801937A4 (en) A cleaning arrangement for a coating apparatus
GB201818145D0 (en) A mounting apparatus
EP3615225A4 (en) A coating apparatus
GB201811426D0 (en) Apparatus for manufacturing a container
GB201819732D0 (en) Apparatus for monitoring a fluid
GB201817278D0 (en) Apparatus for monitoring a fluid
GB201909175D0 (en) Apparatus for monitoring
GB201817069D0 (en) A cartridge for spraying apparatus
GB201817066D0 (en) A cartridge for a spraying apparatus
GB201804685D0 (en) Apparatus for a decorator
GB201819486D0 (en) Golf-swing monitoring apparatus
GB2599260B (en) Monitoring control apparatus
GB201812596D0 (en) System for monitoring a component
AU2018901980A0 (en) A cleaning arrangement for a coating apparatus
GB201918068D0 (en) A spraying apparatus

Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)