GB201008064D0 - Surface coating on ion source - Google Patents
Surface coating on ion sourceInfo
- Publication number
- GB201008064D0 GB201008064D0 GBGB1008064.6A GB201008064A GB201008064D0 GB 201008064 D0 GB201008064 D0 GB 201008064D0 GB 201008064 A GB201008064 A GB 201008064A GB 201008064 D0 GB201008064 D0 GB 201008064D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- ion source
- surface coating
- coating
- ion
- source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0908246A GB0908246D0 (en) | 2009-05-13 | 2009-05-13 | Surface coating on ion source |
Publications (3)
Publication Number | Publication Date |
---|---|
GB201008064D0 true GB201008064D0 (en) | 2010-06-30 |
GB2471156A GB2471156A (en) | 2010-12-22 |
GB2471156B GB2471156B (en) | 2014-04-23 |
Family
ID=40833946
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0908246A Ceased GB0908246D0 (en) | 2009-05-13 | 2009-05-13 | Surface coating on ion source |
GB201008064A Active GB2471156B (en) | 2009-05-13 | 2010-05-13 | Surface coating on ion source |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0908246A Ceased GB0908246D0 (en) | 2009-05-13 | 2009-05-13 | Surface coating on ion source |
Country Status (2)
Country | Link |
---|---|
GB (2) | GB0908246D0 (en) |
WO (1) | WO2010130999A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AT14861U1 (en) * | 2015-03-02 | 2016-07-15 | Plansee Se | ion implanter |
GB2567853B (en) * | 2017-10-26 | 2020-07-29 | Isotopx Ltd | Gas-source mass spectrometer comprising an electron source |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3356843A (en) * | 1965-02-01 | 1967-12-05 | Gen Electric | Mass spectrometer electron beam ion source having means for focusing the electron beam |
JPH01255140A (en) * | 1988-04-05 | 1989-10-12 | Denki Kagaku Kogyo Kk | Arc chamber for ion source |
US5340983A (en) * | 1992-05-18 | 1994-08-23 | The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University | Method and apparatus for mass analysis using slow monochromatic electrons |
JP3066783B2 (en) * | 1992-11-16 | 2000-07-17 | 東京エレクトロン株式会社 | Electrode material and plasma processing apparatus using the same |
US6239440B1 (en) * | 1996-03-27 | 2001-05-29 | Thermoceramix, L.L.C. | Arc chamber for an ion implantation system |
US7838842B2 (en) * | 1999-12-13 | 2010-11-23 | Semequip, Inc. | Dual mode ion source for ion implantation |
JP3787549B2 (en) * | 2002-10-25 | 2006-06-21 | 株式会社日立ハイテクノロジーズ | Mass spectrometer and mass spectrometry method |
US20080223409A1 (en) * | 2003-12-12 | 2008-09-18 | Horsky Thomas N | Method and apparatus for extending equipment uptime in ion implantation |
-
2009
- 2009-05-13 GB GB0908246A patent/GB0908246D0/en not_active Ceased
-
2010
- 2010-05-13 WO PCT/GB2010/000958 patent/WO2010130999A1/en active Application Filing
- 2010-05-13 GB GB201008064A patent/GB2471156B/en active Active
Also Published As
Publication number | Publication date |
---|---|
GB2471156B (en) | 2014-04-23 |
GB0908246D0 (en) | 2009-06-24 |
GB2471156A (en) | 2010-12-22 |
WO2010130999A1 (en) | 2010-11-18 |
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