GB1520730A - Combination of a thyristor chain and a test device - Google Patents

Combination of a thyristor chain and a test device

Info

Publication number
GB1520730A
GB1520730A GB50794/75A GB5079475A GB1520730A GB 1520730 A GB1520730 A GB 1520730A GB 50794/75 A GB50794/75 A GB 50794/75A GB 5079475 A GB5079475 A GB 5079475A GB 1520730 A GB1520730 A GB 1520730A
Authority
GB
United Kingdom
Prior art keywords
terminals
voltage
test unit
thyristor
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB50794/75A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ABB Norden Holding AB
Original Assignee
ASEA AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ASEA AB filed Critical ASEA AB
Publication of GB1520730A publication Critical patent/GB1520730A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/263—Circuits therefor for testing thyristors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
GB50794/75A 1974-12-12 1975-12-11 Combination of a thyristor chain and a test device Expired GB1520730A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE7415574A SE390781B (sv) 1974-12-12 1974-12-12 Kombination av en tyristorkoppling och en provanordning for tyristorerna i denna

Publications (1)

Publication Number Publication Date
GB1520730A true GB1520730A (en) 1978-08-09

Family

ID=20322973

Family Applications (1)

Application Number Title Priority Date Filing Date
GB50794/75A Expired GB1520730A (en) 1974-12-12 1975-12-11 Combination of a thyristor chain and a test device

Country Status (8)

Country Link
US (1) US4056776A (enExample)
JP (1) JPS51108567A (enExample)
CA (1) CA1025129A (enExample)
CH (1) CH604188A5 (enExample)
DE (1) DE2552577A1 (enExample)
FR (1) FR2294452A1 (enExample)
GB (1) GB1520730A (enExample)
SE (1) SE390781B (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4357645A (en) * 1981-05-13 1982-11-02 Control Concepts Inc. System for detecting faulty SCR's
EP0478811A1 (de) * 1990-10-01 1992-04-08 Asea Brown Boveri Ag Verfahren zum Prüfen eines Leistungshalbleiter-Bauelements sowie Vorrichtung zur Durchführung des Verfahrens
DE4324982A1 (de) * 1993-07-26 1995-02-02 Abb Management Ag Verfahren und Schaltungsanordnung zur Messung der Sperrschichttemperatur eines GTO-Thyristors
GB9325281D0 (en) * 1993-12-10 1994-02-16 Texas Indstruments Limited Improvements in and relating to the testing of semiconductor devices
US6078173A (en) * 1996-04-08 2000-06-20 General Electric Company Simultaneous self test of multiple inverters in an AC motor system
CN102486517B (zh) * 2010-12-01 2015-11-25 中国电力科学研究院 冲击电压复合的高压直流输电换流阀故障电流试验方法
KR101326327B1 (ko) * 2012-05-22 2013-11-11 명지대학교 산학협력단 사이리스터 밸브의 합성 시험 장치
US8896334B2 (en) * 2012-06-28 2014-11-25 Eaton Corporation System for measuring soft starter current and method of making same
DE102014105719B4 (de) 2014-04-23 2015-11-26 Ge Energy Power Conversion Gmbh Schaltungsvorrichtung mit einer Thyristorschaltung sowie ein Verfahren zum Prüfen der Thyristorschaltung
FR3040840B1 (fr) * 2015-09-04 2018-11-02 Schneider Electric Industries Sas Systeme de demarrage progressif d'un moteur electrique
CN113286653A (zh) 2018-10-30 2021-08-20 科莱恩国际有限公司 脱氢催化剂及其制备和使用方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3199026A (en) * 1961-05-01 1965-08-03 Gen Precision Inc D.-c. clamp-on meter including a hall plate flux detector
DE1564574A1 (de) * 1966-04-23 1969-11-06 Siemens Ag Pruefeinrichtung fuer einen Thyristor
US3582774A (en) * 1969-03-13 1971-06-01 Ford Motor Co Circuit impedance measuring device employing clamp on magnetic current sensor

Also Published As

Publication number Publication date
US4056776A (en) 1977-11-01
SE7415574L (sv) 1976-06-14
SE390781B (sv) 1977-01-17
DE2552577A1 (de) 1976-06-16
CA1025129A (en) 1978-01-24
FR2294452A1 (fr) 1976-07-09
FR2294452B1 (enExample) 1982-03-19
JPS51108567A (enExample) 1976-09-25
CH604188A5 (enExample) 1978-08-31

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee