GB1518695A - Methods of testing electrical components - Google Patents

Methods of testing electrical components

Info

Publication number
GB1518695A
GB1518695A GB4713075A GB4713075A GB1518695A GB 1518695 A GB1518695 A GB 1518695A GB 4713075 A GB4713075 A GB 4713075A GB 4713075 A GB4713075 A GB 4713075A GB 1518695 A GB1518695 A GB 1518695A
Authority
GB
United Kingdom
Prior art keywords
performance
testing
electrical components
temperatures
nov
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4713075A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Post Office
Original Assignee
Post Office
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Post Office filed Critical Post Office
Priority to GB4713075A priority Critical patent/GB1518695A/en
Publication of GB1518695A publication Critical patent/GB1518695A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Abstract

1518695 Testing electrical components POST OFFICE 10 Nov 1976 [14 Nov 1975] 47130/75 Heading G1U An electrical component used at a normal value of an environmental condition (temperature, humidity, voltage) is tested by measuring the times taken for the performance of the component to deteriorate from a first level to a second level at several values of the condition which impose more stress than the normal value, while allowing the performance to recover to the first value between measurements. The method is applied to sample testing of microcircuit operational amplifiers at elevated temperatures and it is shown that these devices can recover at the elevated temperatures, and that the performance at these temperatures enables a faster prediction of incipient failure than the prior art testing at normal temperatures.
GB4713075A 1976-11-10 1976-11-10 Methods of testing electrical components Expired GB1518695A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB4713075A GB1518695A (en) 1976-11-10 1976-11-10 Methods of testing electrical components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB4713075A GB1518695A (en) 1976-11-10 1976-11-10 Methods of testing electrical components

Publications (1)

Publication Number Publication Date
GB1518695A true GB1518695A (en) 1978-07-19

Family

ID=10443848

Family Applications (1)

Application Number Title Priority Date Filing Date
GB4713075A Expired GB1518695A (en) 1976-11-10 1976-11-10 Methods of testing electrical components

Country Status (1)

Country Link
GB (1) GB1518695A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0175932A1 (en) * 1984-09-10 1986-04-02 International Business Machines Corporation Method for determination of optimum parameters for stress screening of electronic components and circuit boards
GB2405496A (en) * 2003-08-27 2005-03-02 Agilent Technologies Inc A method for evaluating the aging of components

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0175932A1 (en) * 1984-09-10 1986-04-02 International Business Machines Corporation Method for determination of optimum parameters for stress screening of electronic components and circuit boards
GB2405496A (en) * 2003-08-27 2005-03-02 Agilent Technologies Inc A method for evaluating the aging of components
US7146292B2 (en) 2003-08-27 2006-12-05 Avago Technologies Fiber Ip (Singapore) Pte. Ltd. Method and a system for evaluating aging of components, and computer program product therefor
GB2405496B (en) * 2003-08-27 2007-02-07 Agilent Technologies Inc A method and a system for evaluating aging of components, and computer program product therefor

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Legal Events

Date Code Title Description
PS Patent sealed
746 Register noted 'licences of right' (sect. 46/1977)
PCNP Patent ceased through non-payment of renewal fee