GB1513635A - Test data generator - Google Patents

Test data generator

Info

Publication number
GB1513635A
GB1513635A GB26976/76A GB2697676A GB1513635A GB 1513635 A GB1513635 A GB 1513635A GB 26976/76 A GB26976/76 A GB 26976/76A GB 2697676 A GB2697676 A GB 2697676A GB 1513635 A GB1513635 A GB 1513635A
Authority
GB
United Kingdom
Prior art keywords
bit
output signal
mfm
output
bits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB26976/76A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NCR Voyix Corp
Original Assignee
NCR Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NCR Corp filed Critical NCR Corp
Publication of GB1513635A publication Critical patent/GB1513635A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318392—Generation of test inputs, e.g. test vectors, patterns or sequences for sequential circuits
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1816—Testing
    • G11B20/182—Testing using test patterns
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/02—Recording, reproducing, or erasing methods; Read, write or erase circuits therefor
    • G11B5/09—Digital recording
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/84—Generating pulses having a predetermined statistical distribution of a parameter, e.g. random pulse generators

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Signal Processing (AREA)
  • Nonlinear Science (AREA)
  • Signal Processing For Digital Recording And Reproducing (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
GB26976/76A 1975-07-07 1976-06-29 Test data generator Expired GB1513635A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/594,145 US3996612A (en) 1975-07-07 1975-07-07 Test code generator

Publications (1)

Publication Number Publication Date
GB1513635A true GB1513635A (en) 1978-06-07

Family

ID=24377721

Family Applications (1)

Application Number Title Priority Date Filing Date
GB26976/76A Expired GB1513635A (en) 1975-07-07 1976-06-29 Test data generator

Country Status (6)

Country Link
US (1) US3996612A (enExample)
JP (1) JPS5210035A (enExample)
CA (1) CA1060108A (enExample)
DE (1) DE2630160C3 (enExample)
FR (1) FR2317707A1 (enExample)
GB (1) GB1513635A (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58161116A (ja) * 1982-03-19 1983-09-24 Matsushita Electric Ind Co Ltd デイスク再生装置
US4520408A (en) * 1983-02-22 1985-05-28 Vsp Labs, Inc. Clock signal synchronization apparatus and method for decoding self-clocking encoded data
US4612586A (en) * 1984-06-05 1986-09-16 Memorex Corporation Method for measuring timing asymmetry in a magnetic storage system
JPS61105778A (ja) * 1984-06-05 1986-05-23 メモレツクス・コ−ポレ−シヨン 磁気記憶装置システムの検査方法
DE102004033266A1 (de) * 2004-07-09 2006-02-02 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung und Verfahren zur Positionsmessung

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3641526A (en) * 1969-12-29 1972-02-08 Ibm Intra-record resynchronization
US3821798A (en) * 1972-02-18 1974-06-28 Ibm Resynchronizable recording system
US3864735A (en) * 1973-09-12 1975-02-04 Burroughs Corp Read/write system for high density magnetic recording

Also Published As

Publication number Publication date
DE2630160C3 (de) 1979-06-28
FR2317707A1 (fr) 1977-02-04
FR2317707B1 (enExample) 1979-07-20
DE2630160B2 (de) 1978-10-26
DE2630160A1 (de) 1977-01-13
US3996612A (en) 1976-12-07
CA1060108A (en) 1979-08-07
JPS5210035A (en) 1977-01-26

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
746 Register noted 'licences of right' (sect. 46/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19930629