GB1418552A - Semiconductor storage devices - Google Patents

Semiconductor storage devices

Info

Publication number
GB1418552A
GB1418552A GB3004073A GB3004073A GB1418552A GB 1418552 A GB1418552 A GB 1418552A GB 3004073 A GB3004073 A GB 3004073A GB 3004073 A GB3004073 A GB 3004073A GB 1418552 A GB1418552 A GB 1418552A
Authority
GB
United Kingdom
Prior art keywords
arrays
array
switches
decoder
semiconductor storage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3004073A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of GB1418552A publication Critical patent/GB1418552A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/83—Masking faults in memories by using spares or by reconfiguring using programmable devices with reduced power consumption
    • G11C29/832—Masking faults in memories by using spares or by reconfiguring using programmable devices with reduced power consumption with disconnection of faulty elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Static Random-Access Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
GB3004073A 1972-06-30 1973-06-25 Semiconductor storage devices Expired GB1418552A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26782772A 1972-06-30 1972-06-30

Publications (1)

Publication Number Publication Date
GB1418552A true GB1418552A (en) 1975-12-24

Family

ID=23020290

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3004073A Expired GB1418552A (en) 1972-06-30 1973-06-25 Semiconductor storage devices

Country Status (7)

Country Link
US (1) US3750116A (US06312121-20011106-C00033.png)
JP (1) JPS5440183B2 (US06312121-20011106-C00033.png)
CA (1) CA1019835A (US06312121-20011106-C00033.png)
DE (1) DE2332555A1 (US06312121-20011106-C00033.png)
FR (1) FR2191203B1 (US06312121-20011106-C00033.png)
GB (1) GB1418552A (US06312121-20011106-C00033.png)
IT (1) IT982699B (US06312121-20011106-C00033.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2387459A (en) * 2001-12-04 2003-10-15 Samsung Electronics Co Ltd Cache memory capable of selecting its size so as to exclude defective cells to present a reduced cache memory size to the processor.

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4024509A (en) * 1975-06-30 1977-05-17 Honeywell Information Systems, Inc. CCD register array addressing system including apparatus for by-passing selected arrays
JPS5857838B2 (ja) * 1980-12-29 1983-12-22 富士通株式会社 デコ−ド回路
US4963769A (en) * 1989-05-08 1990-10-16 Cypress Semiconductor Circuit for selective power-down of unused circuitry
US5946257A (en) 1996-07-24 1999-08-31 Micron Technology, Inc. Selective power distribution circuit for an integrated circuit
US20030074610A1 (en) * 2001-10-16 2003-04-17 Umax Data Systems Inc. Method for improving utilization of a defective memory device in an image processing system
JP2009093205A (ja) * 2009-02-02 2009-04-30 Hinomoto Gosei Jushi Seisakusho:Kk 分子模型

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3402398A (en) * 1964-08-31 1968-09-17 Bunker Ramo Plural content addressed memories with a common sensing circuit
US3422402A (en) * 1965-12-29 1969-01-14 Ibm Memory systems for using storage devices containing defective bits
US3588830A (en) * 1968-01-17 1971-06-28 Ibm System for using a memory having irremediable bad bits
US3659275A (en) * 1970-06-08 1972-04-25 Cogar Corp Memory correction redundancy system
US3688280A (en) * 1970-09-22 1972-08-29 Ibm Monolithic memory system with bi-level powering for reduced power consumption

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2387459A (en) * 2001-12-04 2003-10-15 Samsung Electronics Co Ltd Cache memory capable of selecting its size so as to exclude defective cells to present a reduced cache memory size to the processor.
GB2387459B (en) * 2001-12-04 2005-11-23 Samsung Electronics Co Ltd Cache memory capable of selecting size thereof and processor chip having the same

Also Published As

Publication number Publication date
FR2191203A1 (US06312121-20011106-C00033.png) 1974-02-01
JPS4945650A (US06312121-20011106-C00033.png) 1974-05-01
US3750116A (en) 1973-07-31
CA1019835A (en) 1977-10-25
FR2191203B1 (US06312121-20011106-C00033.png) 1976-04-30
DE2332555A1 (de) 1974-01-17
IT982699B (it) 1974-10-21
JPS5440183B2 (US06312121-20011106-C00033.png) 1979-12-01

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee