GB1392448A - Optical indpection - Google Patents

Optical indpection

Info

Publication number
GB1392448A
GB1392448A GB2921371A GB2921371A GB1392448A GB 1392448 A GB1392448 A GB 1392448A GB 2921371 A GB2921371 A GB 2921371A GB 2921371 A GB2921371 A GB 2921371A GB 1392448 A GB1392448 A GB 1392448A
Authority
GB
United Kingdom
Prior art keywords
camera
arrangement
speckle
patterns
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2921371A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NAT RES DEV
National Research Development Corp UK
Original Assignee
NAT RES DEV
National Research Development Corp UK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NAT RES DEV, National Research Development Corp UK filed Critical NAT RES DEV
Priority to GB2921371A priority Critical patent/GB1392448A/en
Priority to US00264007A priority patent/US3816649A/en
Priority to FR727222379A priority patent/FR2143204B1/fr
Priority to CA145,293A priority patent/CA985039A/en
Priority to IT69005/72A priority patent/IT960440B/it
Priority to AU43752/72A priority patent/AU471611B2/en
Priority to DE2230650A priority patent/DE2230650C2/de
Publication of GB1392448A publication Critical patent/GB1392448A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/164—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by holographic interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02094—Speckle interferometers, i.e. for detecting changes in speckle pattern

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Holo Graphy (AREA)
GB2921371A 1971-06-22 1971-06-22 Optical indpection Expired GB1392448A (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
GB2921371A GB1392448A (en) 1971-06-22 1971-06-22 Optical indpection
US00264007A US3816649A (en) 1971-06-22 1972-06-19 Optical inspection
FR727222379A FR2143204B1 (cg-RX-API-DMAC7.html) 1971-06-22 1972-06-21
CA145,293A CA985039A (en) 1971-06-22 1972-06-21 Optical inspection
IT69005/72A IT960440B (it) 1971-06-22 1972-06-21 Procedimento ed apparecchio di ispezione ottica di oggetti con impiego di tecniche televisive
AU43752/72A AU471611B2 (en) 1971-06-22 1972-06-22 Optical inspection
DE2230650A DE2230650C2 (de) 1971-06-22 1972-06-22 Verfahren und Vorrichtung zur optischen Untersuchung einer Oberfläche

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB2921371A GB1392448A (en) 1971-06-22 1971-06-22 Optical indpection

Publications (1)

Publication Number Publication Date
GB1392448A true GB1392448A (en) 1975-04-30

Family

ID=10287949

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2921371A Expired GB1392448A (en) 1971-06-22 1971-06-22 Optical indpection

Country Status (7)

Country Link
US (1) US3816649A (cg-RX-API-DMAC7.html)
AU (1) AU471611B2 (cg-RX-API-DMAC7.html)
CA (1) CA985039A (cg-RX-API-DMAC7.html)
DE (1) DE2230650C2 (cg-RX-API-DMAC7.html)
FR (1) FR2143204B1 (cg-RX-API-DMAC7.html)
GB (1) GB1392448A (cg-RX-API-DMAC7.html)
IT (1) IT960440B (cg-RX-API-DMAC7.html)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2811288A1 (de) * 1977-03-15 1978-10-19 Nat Res Dev Verfahren und vorrichtung zum pruefen von flaechen
GB2150284A (en) * 1983-11-23 1985-06-26 Kearney And Trecker Marwin Lim Inspecting articles
GB2180644A (en) * 1985-09-16 1987-04-01 Nat Res Dev Interferometric measurement apparatus
US4744035A (en) * 1983-07-16 1988-05-10 National Research Development Corporation Inspecting textile products
EP0251501A3 (en) * 1986-06-05 1988-08-24 National Research Development Corporation Method for optical inspection involving laser speckle pattern interferometry
GB2309777A (en) * 1996-02-05 1997-08-06 Secretary Trade Ind Brit Narrow angle scattering speckle interferometer
US5671042A (en) * 1992-02-18 1997-09-23 Illinois Institute Of Technology Holomoire strain analyzer
CN110793453A (zh) * 2019-10-10 2020-02-14 北京科技大学 适用于三维曲面异形结构的简易快速人工散斑制备方法

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1460861A (en) * 1974-03-05 1977-01-06 Nat Res Dev Interferrometers
US4025195A (en) * 1974-07-22 1977-05-24 Itek Corporation Image subtraction/addition system
US4277127A (en) * 1979-12-03 1981-07-07 The United States Of America As Represented By The Secretary Of The Army Dopler extended depth of field imaging system with coherent object illumination
US4425039A (en) 1982-05-07 1984-01-10 Industrial Holographics, Inc. Apparatus for the practice of double exposure interferometric non-destructive testing
US4620223A (en) * 1982-09-03 1986-10-28 Industrial Holographics, Inc. Interferometric deformation analysis system
GB8529429D0 (en) * 1985-11-29 1986-01-08 Preater R W T Test apparatus
US4747683A (en) * 1986-01-17 1988-05-31 Eye Research Institute Of Retina Foundation Method and device for in vivo wetting determinations
US4818110A (en) * 1986-05-06 1989-04-04 Kla Instruments Corporation Method and apparatus of using a two beam interference microscope for inspection of integrated circuits and the like
US4815856A (en) * 1986-06-05 1989-03-28 Storage Technology Partners Ii Method and apparatus for measuring the absolute thickness of dust defocus layers
US4887899A (en) * 1987-12-07 1989-12-19 Hung Yau Y Apparatus and method for electronic analysis of test objects
US4913547A (en) * 1988-01-29 1990-04-03 Moran Steven E Optically phased-locked speckle pattern interferometer
US5004345A (en) * 1988-12-05 1991-04-02 Hung Yau Y Dual-lens shearing interferometer
US5094528A (en) * 1990-05-25 1992-03-10 Laser Technology, Inc. Apparatus and method for performing electronic shearography
DE4039972A1 (de) * 1990-12-14 1992-06-17 Man Technologie Gmbh Verfahren und einrichtung zur erfassung der oberflaechendeformation von bauteilen mittels elektronischer speckle-interferometrie
DE4108062A1 (de) * 1991-03-13 1992-09-17 Man Technologie Gmbh Vorrichtung zur interferometrischen messung von objekten
US5245409A (en) * 1991-11-27 1993-09-14 Arvin Industries, Inc. Tube seam weld inspection device
US5257089A (en) * 1992-06-15 1993-10-26 United Technologies Corporation Optical head for shearography
DE19650325A1 (de) * 1996-12-04 1998-06-10 Ettemeyer Gmbh & Co Mes Und Pr Verfahren und Vorrichtung zur Ermittlung von Verformungen und Dehnungen an gekrümmten Körpern
US6188483B1 (en) 1997-12-03 2001-02-13 Dr. Ettemeyer Gmbh & Co. Method and apparatus for determining deformation and elongation on curved bodies
US6580514B1 (en) * 1999-04-28 2003-06-17 Nec Corporation Non-contact silicon melt surface evaluation method and system
US20030067537A1 (en) * 2001-10-04 2003-04-10 Myers Kenneth J. System and method for three-dimensional data acquisition
FR2849245B1 (fr) * 2002-12-20 2006-02-24 Thales Sa Procede d'authentification et d'identification optique d'objets et dispositif de mise en oeuvre
US7436504B2 (en) * 2003-09-10 2008-10-14 Shear Graphics, Llc Non-destructive testing and imaging
GB0809037D0 (en) * 2008-05-19 2008-06-25 Renishaw Plc Video Probe

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2811288A1 (de) * 1977-03-15 1978-10-19 Nat Res Dev Verfahren und vorrichtung zum pruefen von flaechen
US4744035A (en) * 1983-07-16 1988-05-10 National Research Development Corporation Inspecting textile products
GB2150284A (en) * 1983-11-23 1985-06-26 Kearney And Trecker Marwin Lim Inspecting articles
US4637054A (en) * 1983-11-23 1987-01-13 Kearney & Trecker Marwin Limited Inspecting articles
GB2180644A (en) * 1985-09-16 1987-04-01 Nat Res Dev Interferometric measurement apparatus
GB2180644B (en) * 1985-09-16 1989-08-16 Nat Res Dev Interferometric measurement method and apparatus
US4832494A (en) * 1986-06-05 1989-05-23 National Research Development Corporation Optical inspection
EP0251501A3 (en) * 1986-06-05 1988-08-24 National Research Development Corporation Method for optical inspection involving laser speckle pattern interferometry
US5671042A (en) * 1992-02-18 1997-09-23 Illinois Institute Of Technology Holomoire strain analyzer
GB2309777A (en) * 1996-02-05 1997-08-06 Secretary Trade Ind Brit Narrow angle scattering speckle interferometer
GB2309777B (en) * 1996-02-05 2000-09-06 Secretary Trade Ind Brit Interferometer
CN110793453A (zh) * 2019-10-10 2020-02-14 北京科技大学 适用于三维曲面异形结构的简易快速人工散斑制备方法
CN110793453B (zh) * 2019-10-10 2021-02-26 北京科技大学 适用于三维曲面异形结构的简易快速人工散斑制备方法

Also Published As

Publication number Publication date
CA985039A (en) 1976-03-09
IT960440B (it) 1973-11-20
FR2143204A1 (cg-RX-API-DMAC7.html) 1973-02-02
FR2143204B1 (cg-RX-API-DMAC7.html) 1973-07-13
AU471611B2 (en) 1976-04-29
AU4375272A (en) 1974-01-03
DE2230650C2 (de) 1983-09-22
DE2230650A1 (de) 1972-12-28
US3816649A (en) 1974-06-11

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
732 Registration of transactions, instruments or events in the register (sect. 32/1977)
PE20 Patent expired after termination of 20 years