GB1376228A - Analyzer employing magneto-optic rotation - Google Patents

Analyzer employing magneto-optic rotation

Info

Publication number
GB1376228A
GB1376228A GB3423472A GB3423472A GB1376228A GB 1376228 A GB1376228 A GB 1376228A GB 3423472 A GB3423472 A GB 3423472A GB 3423472 A GB3423472 A GB 3423472A GB 1376228 A GB1376228 A GB 1376228A
Authority
GB
United Kingdom
Prior art keywords
cell
photo
component
output
pulsed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3423472A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of GB1376228A publication Critical patent/GB1376228A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/09—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on magneto-optical elements, e.g. exhibiting Faraday effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N2021/218—Measuring properties of electrooptical or magnetooptical media

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
GB3423472A 1971-08-02 1972-07-21 Analyzer employing magneto-optic rotation Expired GB1376228A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US16833271A 1971-08-02 1971-08-02

Publications (1)

Publication Number Publication Date
GB1376228A true GB1376228A (en) 1974-12-04

Family

ID=22611084

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3423472A Expired GB1376228A (en) 1971-08-02 1972-07-21 Analyzer employing magneto-optic rotation

Country Status (3)

Country Link
US (1) US3740151A (US07714131-20100511-C00024.png)
JP (1) JPS4825595A (US07714131-20100511-C00024.png)
GB (1) GB1376228A (US07714131-20100511-C00024.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108680511A (zh) * 2018-05-18 2018-10-19 南京信息工程大学 一种基于圆偏振光的反射增强型旋光仪

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2365793A1 (fr) * 1976-09-23 1978-04-21 France Etat Ellipsometre a birefringent tournant en son application a la photo-elasticimetrie
FR2381300A1 (fr) * 1977-02-21 1978-09-15 France Etat Photo-elasticimetre dynamique a birefringent tournant
DE2758723A1 (de) * 1977-12-29 1979-07-12 Siemens Ag Verfahren zur magnetooptischen strommessung
US4589776A (en) * 1982-09-27 1986-05-20 Chiratech, Inc. Method and apparatus for measuring optical properties of materials
GB8625530D0 (en) * 1986-10-24 1986-11-26 Goodall D M Optical apparatus
US4818881A (en) * 1987-05-04 1989-04-04 The United States Of America As Represented By The Secretary Of The Army High-sensitivity infrared polarimeter
JPH0734373B2 (ja) * 1989-11-15 1995-04-12 ヒロセ電機株式会社 コネクタ
JPH0630263B2 (ja) * 1989-11-17 1994-04-20 ヒロセ電機株式会社 多芯ケーブル用コネクタ
JPH0722029B2 (ja) * 1989-11-17 1995-03-08 ヒロセ電機株式会社 多芯ケーブル用コネクタ
JPH0637573Y2 (ja) * 1990-03-15 1994-09-28 ヒロセ電機株式会社 シールド電線用ボードインコネクタ構造
JPH0452368U (US07714131-20100511-C00024.png) * 1990-09-10 1992-05-01
JPH0452370U (US07714131-20100511-C00024.png) * 1990-09-10 1992-05-01
JPH0452369U (US07714131-20100511-C00024.png) * 1990-09-10 1992-05-01
JPH089900Y2 (ja) * 1990-09-10 1996-03-21 ヒロセ電機株式会社 電気コネクタ
JPH0722054Y2 (ja) * 1990-09-11 1995-05-17 ヒロセ電機株式会社 電気コネクタ
JPH0727572Y2 (ja) * 1990-09-11 1995-06-21 ヒロセ電機株式会社 電気コネクタ
US6166807A (en) * 1995-11-16 2000-12-26 Matsushita Electric Industrial Co., Ltd. Method of urinalysis, urinalysis apparatus, method of measuring angle of rotation and polarimeter
US5706087A (en) * 1996-10-04 1998-01-06 The Board Of Regents Of The University Of Nebraska Electromagnetic beam directing means-sample analysis system stage, and method of use
TW407201B (en) * 1997-09-09 2000-10-01 Matsushita Electric Ind Co Ltd Sample cell for polarimetry, polarimeter, and polarimetry
JP3332149B2 (ja) * 1997-09-24 2002-10-07 松下電器産業株式会社 光学特性測定用被検試料の輸液方法、輸液装置及びこれを用いた旋光計
US20050002032A1 (en) * 2001-11-06 2005-01-06 Wijntjes Geert Johannes Non-contact optical polarization angle encoder
WO2003040662A1 (en) * 2001-11-06 2003-05-15 Visidyne, Inc. Non-contact optical polarization angle encoder
EP1676107A4 (en) 2003-10-10 2008-03-26 Stheno Corp OPTICAL DIFFERENTIAL TECHNOLOGY FOR CHIRAL ANALYSIS
US7092085B1 (en) 2004-01-20 2006-08-15 Desa Richard J Sample holder with intense magnetic field
JP2007536519A (ja) * 2004-05-04 2007-12-13 ステノ コーポレイション ダブルリファレンスロックイン検出器
JP2008505316A (ja) * 2004-06-30 2008-02-21 ステノ コーポレイション カイロオプティカル・ヘテロダインシステム及び方法
US20060001509A1 (en) * 2004-06-30 2006-01-05 Gibbs Phillip R Systems and methods for automated resonant circuit tuning
WO2006052644A2 (en) * 2004-11-05 2006-05-18 Optical Finesse, Llc Apparatus and methods to measure optical rotation with electro-optic polarization modulation
DE112008004262T5 (de) * 2008-12-23 2013-01-31 Abb Research Ltd. Sauerstoffkonzentrations-Messvorrichtung
CN102359865B (zh) * 2011-08-17 2013-10-30 中国科学院西安光学精密机械研究所 一种线偏振光磁光效应检测方法及其装置
JP6346446B2 (ja) * 2013-02-14 2018-06-20 株式会社リコー 原子発振器、ｃｐｔ共鳴の検出方法及び磁気センサ
US10126172B1 (en) * 2017-10-16 2018-11-13 King Fahd University Of Petroleum And Minerals Faraday rotator device

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3312141A (en) * 1962-04-23 1967-04-04 Applied Physics Corp System for measuring optical activity of materials
FR1543244A (fr) * 1967-07-04 1968-10-25 Comp Generale Electricite Procédé et dispositif de mesure de la densité électronique d'un plasma

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108680511A (zh) * 2018-05-18 2018-10-19 南京信息工程大学 一种基于圆偏振光的反射增强型旋光仪
CN108680511B (zh) * 2018-05-18 2023-08-25 南京信息工程大学 一种基于圆偏振光的反射增强型旋光仪

Also Published As

Publication number Publication date
DE2236251B2 (de) 1976-05-20
JPS4825595A (US07714131-20100511-C00024.png) 1973-04-03
US3740151A (en) 1973-06-19
DE2236251A1 (de) 1973-02-15

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PLNP Patent lapsed through nonpayment of renewal fees