GB1315945A - Electron microscopes and microanalysers - Google Patents
Electron microscopes and microanalysersInfo
- Publication number
- GB1315945A GB1315945A GB460471A GB1315945DA GB1315945A GB 1315945 A GB1315945 A GB 1315945A GB 460471 A GB460471 A GB 460471A GB 1315945D A GB1315945D A GB 1315945DA GB 1315945 A GB1315945 A GB 1315945A
- Authority
- GB
- United Kingdom
- Prior art keywords
- mode
- current
- specimen surface
- lens
- switching
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
- H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
1315945 Electron microscopes CAMBRIDGE SCIENTIFIC INSTRUMENTS Ltd 10 Feb 1972 [12 Feb 1971] 4604/71 Heading H1D [Also in Division G1] A scanning electron beam micro-analyser has provision for switching back and forth continuously between a first mode of operation in which the beam scans back and forth over a region of a specimen surface, and a second mode in which the beam rocks angularly about a fixed point on the specimen surface, Fig. 2, to cyclicly vary the angle of incidence of the beam. As shown, the device includes focusing coils L1, L2, and L3, and two pairs each of upper and lower scanning coils UC and LC (only one pair of each shown). The first image of the source is formed at point P2 in both modes, the lower deflection coil LC being switched on and off, with simultaneous change of the deflection current fed to the coils UC, to move the second image of the electron source from the specimen surface, corresponding to the rocking mode shown in Fig. 2, to the aperture of the lens L3 (Fig. 1 not shown), to provide the area scanning mode. In an alternative arrangement, Fig. 3, switching to the area scanning mode is achieved merely by an increase in current to the lens L3, raising the second image point above the specimen surface as shown, the resultant partial defocusing being accepted. Either the secondary or the backscattered electrons, the X-rays produced, or the specimen current, is detected and amplitude modulates the beam of a synchronously scanned cathode ray tube. Reference is made to the use of more than one detector, e.g. for back-scattered electrons and for X-rays respectively, and to the use of a conical or spiral, rather than rectangular, scan in the rocking mode. A circuit is described (Fig. 4, not shown), for switching the deflection current or the current to lens L3, with simultaneous change of gain of an amplifier in the detector circuit, and transfer of the detector output from a first to a second cathode ray tube.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB460471 | 1971-02-12 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1315945A true GB1315945A (en) | 1973-05-09 |
Family
ID=9780309
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB460471A Expired GB1315945A (en) | 1971-02-12 | 1971-02-12 | Electron microscopes and microanalysers |
Country Status (3)
Country | Link |
---|---|
US (1) | US3786271A (en) |
DE (1) | DE2205877A1 (en) |
GB (1) | GB1315945A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4420686A (en) * | 1981-01-29 | 1983-12-13 | Kabushiki Kaisha Akashi Seisakusho | Scanning electron microscope or similar equipment capable of displaying simultaneously a plurality of images of specimen |
GB2208035A (en) * | 1987-05-28 | 1989-02-15 | Jeol Ltd | Analytical electron microscope |
GB2221567A (en) * | 1988-07-25 | 1990-02-07 | Hitachi Ltd | Scanning electron microscope |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3942005A (en) * | 1974-12-12 | 1976-03-02 | Hitachi, Ltd. | Electron scanning apparatus |
US4095104A (en) * | 1975-09-01 | 1978-06-13 | U.S. Philips Corporation | Electron microscope |
JP2773614B2 (en) * | 1993-12-28 | 1998-07-09 | 日本電気株式会社 | Handwritten figure input device |
US6566885B1 (en) * | 1999-12-14 | 2003-05-20 | Kla-Tencor | Multiple directional scans of test structures on semiconductor integrated circuits |
US7655482B2 (en) * | 2000-04-18 | 2010-02-02 | Kla-Tencor | Chemical mechanical polishing test structures and methods for inspecting the same |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3502870A (en) * | 1967-07-05 | 1970-03-24 | Hitachi Ltd | Apparatus for simultaneously displaying a plurality of images of an object being analyzed in an electron beam device |
-
1971
- 1971-02-12 GB GB460471A patent/GB1315945A/en not_active Expired
-
1972
- 1972-02-08 DE DE19722205877 patent/DE2205877A1/en active Pending
- 1972-02-14 US US00225968A patent/US3786271A/en not_active Expired - Lifetime
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4420686A (en) * | 1981-01-29 | 1983-12-13 | Kabushiki Kaisha Akashi Seisakusho | Scanning electron microscope or similar equipment capable of displaying simultaneously a plurality of images of specimen |
GB2208035A (en) * | 1987-05-28 | 1989-02-15 | Jeol Ltd | Analytical electron microscope |
GB2208035B (en) * | 1987-05-28 | 1992-03-18 | Jeol Ltd | Analytical electron microscope |
GB2221567A (en) * | 1988-07-25 | 1990-02-07 | Hitachi Ltd | Scanning electron microscope |
US4983832A (en) * | 1988-07-25 | 1991-01-08 | Hitachi, Ltd. | Scanning electron microscope |
GB2221567B (en) * | 1988-07-25 | 1992-11-11 | Hitachi Ltd | Scanning electron microscope |
Also Published As
Publication number | Publication date |
---|---|
DE2205877A1 (en) | 1972-08-24 |
US3786271A (en) | 1974-01-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB1128107A (en) | Scanning electron microscope | |
US3833811A (en) | Scanning electron microscope with improved means for focusing | |
GB1444109A (en) | Apparatus and method for generating x-rays | |
GB919299A (en) | Method and apparatus for the working of material by means of a beam of charge carriers | |
US3795809A (en) | Scanning electron microscope with conversion means to produce a diffraction pattern | |
DE3763273D1 (en) | CATHODE RAY TUBES AND COLOR DISPLAY DEVICE. | |
GB1315945A (en) | Electron microscopes and microanalysers | |
US3717761A (en) | Scanning electron microscope | |
GB1284061A (en) | Electron beam apparatus | |
US3886305A (en) | Automatic contrast and dark level control for scanning electron microscopes | |
US3857034A (en) | Scanning charged beam particle beam microscope | |
GB1514339A (en) | Slit-scanning image converter tube | |
GB1276364A (en) | A stereo scanning electron microscope and scanning apparatus therefor | |
US3748467A (en) | Scanning electron microscope | |
US3872305A (en) | Convertible scanning electron microscope | |
US2979622A (en) | Thermal image converter | |
US3887834A (en) | Cathode-ray tube having an electric cylinder lens for the dynamic correction of electrostatic deflection defocusing | |
USRE29500E (en) | Scanning charged beam particle beam microscope | |
US3549883A (en) | Scanning electron microscope wherein an image is formed as a function of specimen current | |
US4752715A (en) | Television camera tube | |
GB463896A (en) | Improvements in or relating to oscillights or cathode ray tubes | |
JPS54100669A (en) | Electron-beam unit | |
GB1030042A (en) | Improvements in or relating to microanalysers | |
GB661366A (en) | Arrangement for the secondary intensity control of cathode rays | |
US2795728A (en) | Television circuits |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed [section 19, patents act 1949] | ||
PLNP | Patent lapsed through nonpayment of renewal fees |