GB1315945A - Electron microscopes and microanalysers - Google Patents

Electron microscopes and microanalysers

Info

Publication number
GB1315945A
GB1315945A GB460471A GB1315945DA GB1315945A GB 1315945 A GB1315945 A GB 1315945A GB 460471 A GB460471 A GB 460471A GB 1315945D A GB1315945D A GB 1315945DA GB 1315945 A GB1315945 A GB 1315945A
Authority
GB
United Kingdom
Prior art keywords
mode
current
specimen surface
lens
switching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB460471A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cambridge Scientific Instruments Ltd
Original Assignee
Cambridge Scientific Instruments Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cambridge Scientific Instruments Ltd filed Critical Cambridge Scientific Instruments Ltd
Publication of GB1315945A publication Critical patent/GB1315945A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H01J37/256Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

1315945 Electron microscopes CAMBRIDGE SCIENTIFIC INSTRUMENTS Ltd 10 Feb 1972 [12 Feb 1971] 4604/71 Heading H1D [Also in Division G1] A scanning electron beam micro-analyser has provision for switching back and forth continuously between a first mode of operation in which the beam scans back and forth over a region of a specimen surface, and a second mode in which the beam rocks angularly about a fixed point on the specimen surface, Fig. 2, to cyclicly vary the angle of incidence of the beam. As shown, the device includes focusing coils L1, L2, and L3, and two pairs each of upper and lower scanning coils UC and LC (only one pair of each shown). The first image of the source is formed at point P2 in both modes, the lower deflection coil LC being switched on and off, with simultaneous change of the deflection current fed to the coils UC, to move the second image of the electron source from the specimen surface, corresponding to the rocking mode shown in Fig. 2, to the aperture of the lens L3 (Fig. 1 not shown), to provide the area scanning mode. In an alternative arrangement, Fig. 3, switching to the area scanning mode is achieved merely by an increase in current to the lens L3, raising the second image point above the specimen surface as shown, the resultant partial defocusing being accepted. Either the secondary or the backscattered electrons, the X-rays produced, or the specimen current, is detected and amplitude modulates the beam of a synchronously scanned cathode ray tube. Reference is made to the use of more than one detector, e.g. for back-scattered electrons and for X-rays respectively, and to the use of a conical or spiral, rather than rectangular, scan in the rocking mode. A circuit is described (Fig. 4, not shown), for switching the deflection current or the current to lens L3, with simultaneous change of gain of an amplifier in the detector circuit, and transfer of the detector output from a first to a second cathode ray tube.
GB460471A 1971-02-12 1971-02-12 Electron microscopes and microanalysers Expired GB1315945A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB460471 1971-02-12

Publications (1)

Publication Number Publication Date
GB1315945A true GB1315945A (en) 1973-05-09

Family

ID=9780309

Family Applications (1)

Application Number Title Priority Date Filing Date
GB460471A Expired GB1315945A (en) 1971-02-12 1971-02-12 Electron microscopes and microanalysers

Country Status (3)

Country Link
US (1) US3786271A (en)
DE (1) DE2205877A1 (en)
GB (1) GB1315945A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4420686A (en) * 1981-01-29 1983-12-13 Kabushiki Kaisha Akashi Seisakusho Scanning electron microscope or similar equipment capable of displaying simultaneously a plurality of images of specimen
GB2208035A (en) * 1987-05-28 1989-02-15 Jeol Ltd Analytical electron microscope
GB2221567A (en) * 1988-07-25 1990-02-07 Hitachi Ltd Scanning electron microscope

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3942005A (en) * 1974-12-12 1976-03-02 Hitachi, Ltd. Electron scanning apparatus
US4095104A (en) * 1975-09-01 1978-06-13 U.S. Philips Corporation Electron microscope
JP2773614B2 (en) * 1993-12-28 1998-07-09 日本電気株式会社 Handwritten figure input device
US6566885B1 (en) * 1999-12-14 2003-05-20 Kla-Tencor Multiple directional scans of test structures on semiconductor integrated circuits
US7655482B2 (en) * 2000-04-18 2010-02-02 Kla-Tencor Chemical mechanical polishing test structures and methods for inspecting the same

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3502870A (en) * 1967-07-05 1970-03-24 Hitachi Ltd Apparatus for simultaneously displaying a plurality of images of an object being analyzed in an electron beam device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4420686A (en) * 1981-01-29 1983-12-13 Kabushiki Kaisha Akashi Seisakusho Scanning electron microscope or similar equipment capable of displaying simultaneously a plurality of images of specimen
GB2208035A (en) * 1987-05-28 1989-02-15 Jeol Ltd Analytical electron microscope
GB2208035B (en) * 1987-05-28 1992-03-18 Jeol Ltd Analytical electron microscope
GB2221567A (en) * 1988-07-25 1990-02-07 Hitachi Ltd Scanning electron microscope
US4983832A (en) * 1988-07-25 1991-01-08 Hitachi, Ltd. Scanning electron microscope
GB2221567B (en) * 1988-07-25 1992-11-11 Hitachi Ltd Scanning electron microscope

Also Published As

Publication number Publication date
DE2205877A1 (en) 1972-08-24
US3786271A (en) 1974-01-15

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PLNP Patent lapsed through nonpayment of renewal fees