GB1309502A - Semiconductor device and method of making the same - Google Patents
Semiconductor device and method of making the sameInfo
- Publication number
- GB1309502A GB1309502A GB3321971A GB3321971A GB1309502A GB 1309502 A GB1309502 A GB 1309502A GB 3321971 A GB3321971 A GB 3321971A GB 3321971 A GB3321971 A GB 3321971A GB 1309502 A GB1309502 A GB 1309502A
- Authority
- GB
- United Kingdom
- Prior art keywords
- type
- region
- ring
- diffused
- transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000000758 substrate Substances 0.000 abstract 4
- 238000002955 isolation Methods 0.000 abstract 2
- 238000009792 diffusion process Methods 0.000 abstract 1
- 239000012535 impurity Substances 0.000 abstract 1
- 230000004048 modification Effects 0.000 abstract 1
- 238000012986 modification Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0112—Integrating together multiple components covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating multiple BJTs
- H10D84/0119—Integrating together multiple components covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating multiple BJTs the components including complementary BJTs
- H10D84/0121—Integrating together multiple components covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating multiple BJTs the components including complementary BJTs the complementary BJTs being vertical BJTs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/761—PN junctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/60—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
- H10D84/67—Complementary BJTs
- H10D84/673—Vertical complementary BJTs
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Bipolar Transistors (AREA)
- Bipolar Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP45062437A JPS50278B1 (enrdf_load_stackoverflow) | 1970-07-16 | 1970-07-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1309502A true GB1309502A (en) | 1973-03-14 |
Family
ID=13200155
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB3321971A Expired GB1309502A (en) | 1970-07-16 | 1971-07-15 | Semiconductor device and method of making the same |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPS50278B1 (enrdf_load_stackoverflow) |
CA (1) | CA936624A (enrdf_load_stackoverflow) |
GB (1) | GB1309502A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2543739A1 (fr) * | 1983-03-30 | 1984-10-05 | Radiotechnique Compelec | Procede de realisation d'un transistor bipolaire haute tension |
CN118091384A (zh) * | 2024-04-29 | 2024-05-28 | 杭州广立微电子股份有限公司 | Sdb隔离测试结构的生成方法、sdb隔离测试结构和存储介质 |
-
1970
- 1970-07-16 JP JP45062437A patent/JPS50278B1/ja active Pending
-
1971
- 1971-07-15 GB GB3321971A patent/GB1309502A/en not_active Expired
- 1971-07-15 CA CA118326A patent/CA936624A/en not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2543739A1 (fr) * | 1983-03-30 | 1984-10-05 | Radiotechnique Compelec | Procede de realisation d'un transistor bipolaire haute tension |
EP0126499A1 (fr) * | 1983-03-30 | 1984-11-28 | Rtc-Compelec | Procédé de réalisation d'un transistor bipolaire haute tension |
CN118091384A (zh) * | 2024-04-29 | 2024-05-28 | 杭州广立微电子股份有限公司 | Sdb隔离测试结构的生成方法、sdb隔离测试结构和存储介质 |
Also Published As
Publication number | Publication date |
---|---|
JPS50278B1 (enrdf_load_stackoverflow) | 1975-01-07 |
CA936624A (en) | 1973-11-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed [section 19, patents act 1949] | ||
PCNP | Patent ceased through non-payment of renewal fee |