GB1308971A - Electron beam deflection apparatus - Google Patents

Electron beam deflection apparatus

Info

Publication number
GB1308971A
GB1308971A GB1174970A GB1174970A GB1308971A GB 1308971 A GB1308971 A GB 1308971A GB 1174970 A GB1174970 A GB 1174970A GB 1174970 A GB1174970 A GB 1174970A GB 1308971 A GB1308971 A GB 1308971A
Authority
GB
United Kingdom
Prior art keywords
insulator
membrane
coil
scanning
electron beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1174970A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Publication of GB1308971A publication Critical patent/GB1308971A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/09Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields

Abstract

1308971 Electron beam deflecting apparatus NIHON DENSHI KK 11 March 1970 [17 March 1969] 11749/70 Heading H1D Electron beam deflection apparatus, particularly scanning apparatus, such as a scanning electron microscope, comprises at least one deflection coil in the evacuated volume to generate a deflection field with at least one component at right angles to the beam path, and an electrical insulator between the coil and beam path with an electrically conductive membrane of thickness 500 Š to 10<SP>5</SP> Š (e.g. 10<SP>3</SP> Š) on the inner surface of the insulator. The insulator may be glass, e.g. quartz glass, or a plastics material and the membrane Au or Cr, Cu, Ti or Al for instance, pasted or evaporated on the insulator. The construction ensures electrons do not strike the coil, the membrane eliminating charging of insulator 13 while the membrane thickness reduces eddy currents at high scanning frequencies such as 15À75 kHz and as in TV scanning. Coil supporter 12 may be plastic, member 13 supported by brass or other non- magnetic members 15, 16 with intervening Ag foil 17 and end plates 18, 19. In Fig. 1 (not shown), membrane (5) is connected to metal plates (6), (7), the latter being earthed.
GB1174970A 1969-03-17 1970-03-11 Electron beam deflection apparatus Expired GB1308971A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019369 1969-03-17

Publications (1)

Publication Number Publication Date
GB1308971A true GB1308971A (en) 1973-03-07

Family

ID=12020326

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1174970A Expired GB1308971A (en) 1969-03-17 1970-03-11 Electron beam deflection apparatus

Country Status (4)

Country Link
US (1) US3634684A (en)
DE (1) DE2012431B2 (en)
FR (1) FR2034981A1 (en)
GB (1) GB1308971A (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3787696A (en) * 1972-03-15 1974-01-22 Etec Corp Scanning electron microscope electron-optical column construction
FR2520553A1 (en) * 1982-01-22 1983-07-29 Cameca ELECTRONIC OPTICAL APPARATUS COMPRISING PYROLYTIC GRAPHITE ELEMENTS
FR2597259A1 (en) * 1986-04-15 1987-10-16 Thomson Csf ELECTRONIC BEAM DEVICE FOR PROJECTING THE IMAGE OF AN OBJECT ON A SAMPLE
JP3117950B2 (en) * 1998-05-21 2000-12-18 セイコーインスツルメンツ株式会社 Charged particle device
US7863563B2 (en) * 2007-03-08 2011-01-04 International Business Machines Corporation Carbon tube for electron beam application
EP3333877A1 (en) * 2016-12-07 2018-06-13 JEOL Ltd. Liner tube and electron microscope
EP3338857B1 (en) * 2016-12-21 2021-08-11 RaySearch Laboratories AB System and method for determining a treatment plan for active ion beam treatment
EP3591685A1 (en) * 2018-07-06 2020-01-08 FEI Company Electron microscope with improved imaging resolution

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB516620A (en) * 1938-06-02 1940-01-08 Francois Joseph Gerard Van Den Improvements in cathode ray tubes
US2213176A (en) * 1939-06-06 1940-08-27 Rca Corp Television transmitting tube
US2959705A (en) * 1952-09-18 1960-11-08 American Optical Corp Shielded tube and method of making the same

Also Published As

Publication number Publication date
DE2012431A1 (en) 1970-09-24
DE2012431B2 (en) 1974-02-21
FR2034981A1 (en) 1970-12-18
US3634684A (en) 1972-01-11

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee