GB1239797A - Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base. - Google Patents

Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base.

Info

Publication number
GB1239797A
GB1239797A GB40962/68A GB4096268A GB1239797A GB 1239797 A GB1239797 A GB 1239797A GB 40962/68 A GB40962/68 A GB 40962/68A GB 4096268 A GB4096268 A GB 4096268A GB 1239797 A GB1239797 A GB 1239797A
Authority
GB
United Kingdom
Prior art keywords
coating
ray fluorescence
filter
base
atomic number
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB40962/68A
Other languages
English (en)
Inventor
Robert Curtis Hill
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3M Co
Original Assignee
Minnesota Mining and Manufacturing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US505479A priority Critical patent/US3417243A/en
Priority to AU42375/68A priority patent/AU408547B2/en
Application filed by Minnesota Mining and Manufacturing Co filed Critical Minnesota Mining and Manufacturing Co
Priority to DE19681798125 priority patent/DE1798125A1/de
Priority to BE719998D priority patent/BE719998A/xx
Priority to GB40962/68A priority patent/GB1239797A/en
Priority to AT833568A priority patent/AT300420B/de
Publication of GB1239797A publication Critical patent/GB1239797A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB40962/68A 1965-10-28 1968-08-27 Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base. Expired GB1239797A (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
US505479A US3417243A (en) 1965-10-28 1965-10-28 Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base
AU42375/68A AU408547B2 (en) 1965-10-28 1968-08-21 Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base
DE19681798125 DE1798125A1 (de) 1965-10-28 1968-08-27 Verfahren und Vorrichtung zur Roentgenfluoreszenzmessung eines gewaehlten Elementes hoeherer Atomzahl in einem UEberzug auf einer Unterlage
BE719998D BE719998A (cg-RX-API-DMAC10.html) 1965-10-28 1968-08-27
GB40962/68A GB1239797A (en) 1965-10-28 1968-08-27 Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base.
AT833568A AT300420B (de) 1965-10-28 1968-08-27 Verfahren zur Bestimmung der Masse eines Überzuges

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US505479A US3417243A (en) 1965-10-28 1965-10-28 Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base
GB40962/68A GB1239797A (en) 1965-10-28 1968-08-27 Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base.

Publications (1)

Publication Number Publication Date
GB1239797A true GB1239797A (en) 1971-07-21

Family

ID=26264550

Family Applications (1)

Application Number Title Priority Date Filing Date
GB40962/68A Expired GB1239797A (en) 1965-10-28 1968-08-27 Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base.

Country Status (5)

Country Link
US (1) US3417243A (cg-RX-API-DMAC10.html)
AU (1) AU408547B2 (cg-RX-API-DMAC10.html)
BE (1) BE719998A (cg-RX-API-DMAC10.html)
DE (1) DE1798125A1 (cg-RX-API-DMAC10.html)
GB (1) GB1239797A (cg-RX-API-DMAC10.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10034747A1 (de) * 2000-07-18 2002-02-07 Manfred Liphardt Verfahren und Vorrichtung zur Feststellung der Dicke eines Beschichtungswerkstoffs auf einem Trägerwerkstoff
CN108508052A (zh) * 2018-06-11 2018-09-07 西北核技术研究所 基于参考元素的x射线荧光薄层质量厚度测量系统及方法

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3525863A (en) * 1967-12-28 1970-08-25 Minnesota Mining & Mfg Differential emission x-ray gauging apparatus and method using two monochromatic x-ray beams of balanced intensity
JPS5847659B2 (ja) * 1975-08-12 1983-10-24 日新製鋼株式会社 ゴウキンカアエンテツバンノ ゴウキンカドノ ソクテイホウホウ
US4085329A (en) * 1976-05-03 1978-04-18 Hughes Aircraft Company Hard X-ray and fluorescent X-ray detection of alignment marks for precision mask alignment
FI59489C (fi) * 1978-11-21 1981-08-10 Enso Gutzeit Oy Foerfarande foer maetning av belaeggningsmaengder
US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
CN100593116C (zh) * 2006-04-10 2010-03-03 上海爱斯特电子有限公司 X荧光多元素分析仪
US8724774B2 (en) * 2009-08-04 2014-05-13 Rapiscan Systems, Inc. Method and system for extracting spectroscopic information from images and waveforms
US9224573B2 (en) 2011-06-09 2015-12-29 Rapiscan Systems, Inc. System and method for X-ray source weight reduction
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
KR102609389B1 (ko) * 2019-01-30 2023-12-01 노드슨 코포레이션 복사선-기반의 두께 게이지
WO2021246998A1 (en) * 2020-06-01 2021-12-09 American Science And Engineering, Inc. Systems and methods for controlling image contrast in an x-ray system
US11193898B1 (en) 2020-06-01 2021-12-07 American Science And Engineering, Inc. Systems and methods for controlling image contrast in an X-ray system
US12385854B2 (en) 2022-07-26 2025-08-12 Rapiscan Holdings, Inc. Methods and systems for performing on-the-fly automatic calibration adjustments of X-ray inspection systems

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2926257A (en) * 1955-05-16 1960-02-23 Friedman Herbert Method of measuring the thickness of thin coatings

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10034747A1 (de) * 2000-07-18 2002-02-07 Manfred Liphardt Verfahren und Vorrichtung zur Feststellung der Dicke eines Beschichtungswerkstoffs auf einem Trägerwerkstoff
CN108508052A (zh) * 2018-06-11 2018-09-07 西北核技术研究所 基于参考元素的x射线荧光薄层质量厚度测量系统及方法
CN108508052B (zh) * 2018-06-11 2023-10-20 西北核技术研究所 基于参考元素的x射线荧光薄层质量厚度测量系统及方法

Also Published As

Publication number Publication date
AU4237568A (en) 1970-02-26
AU408547B2 (en) 1970-11-27
BE719998A (cg-RX-API-DMAC10.html) 1969-02-27
US3417243A (en) 1968-12-17
DE1798125A1 (de) 1972-01-20

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