GB1234183A - - Google Patents

Info

Publication number
GB1234183A
GB1234183A GB3825067A GB1234183DA GB1234183A GB 1234183 A GB1234183 A GB 1234183A GB 3825067 A GB3825067 A GB 3825067A GB 1234183D A GB1234183D A GB 1234183DA GB 1234183 A GB1234183 A GB 1234183A
Authority
GB
United Kingdom
Prior art keywords
coil
aug
cone
degrees
angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3825067A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of GB1234183A publication Critical patent/GB1234183A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/10Lenses
    • H01J37/14Lenses magnetic
    • H01J37/141Electromagnetic lenses

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

1,234,183. Electron beam focusing apparatus. MINISTER OF TECHNOLOGY 13 Aug., 1968 [18 Aug., 1967], No. 38250/67. Heading HiD. A focusing lens for an electron probe microanalysis apparatus or the like comprises a coil 20 of frusto-conical shape, thereby increasing the angle # 2 within which may be placed a detector D for measuring X-rays emitted by the specimen 19. The coil may comprise a plurality (e.g. six) of separate concurrently laid lengths of conducting wire extending between conductive segments provided at each end of the cone (Fig. 1, not shown). A cooling block may be arranged within the coil (Fig. 4, not shown), and the coil may be surrounded by a sheath of material of high magnetic permeability (Fig. 5, not shown). The distance between points on the axis where the field of the coil is half the maximum field should be not less than twice the distance d, and the slant height of the coil should be at least five times its radial depth. The half-angle of the cone is preferably 45 degrees and should be between 20 and 85 degrees.
GB3825067A 1967-08-18 1967-08-18 Expired GB1234183A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB3825067 1967-08-18

Publications (1)

Publication Number Publication Date
GB1234183A true GB1234183A (en) 1971-06-03

Family

ID=10402251

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3825067A Expired GB1234183A (en) 1967-08-18 1967-08-18

Country Status (5)

Country Link
US (1) US3707628A (en)
DE (1) DE1764835A1 (en)
FR (1) FR1594573A (en)
GB (1) GB1234183A (en)
NL (1) NL6811733A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2238426A (en) * 1989-11-16 1991-05-29 Jeol Ltd Electromagnetic lens.

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1594465A (en) * 1977-03-23 1981-07-30 Nat Res Dev Electron beam apparatus
FR2477827A1 (en) * 1980-03-04 1981-09-11 Cgr Mev ACCELERATOR DEVICE OF CHARGED PARTICLES OPERATING IN METRIC WAVES
US4541890A (en) * 1982-06-01 1985-09-17 International Business Machines Corporation Hall ion generator for working surfaces with a low energy high intensity ion beam
JPS6091544A (en) * 1983-10-24 1985-05-22 Anelva Corp Auger mass spectrometer device
JP2772821B2 (en) * 1989-05-30 1998-07-09 セイコーインスツルメンツ株式会社 Electron beam equipment
US5079428A (en) * 1989-08-31 1992-01-07 Bell Communications Research, Inc. Electron microscope with an asymmetrical immersion lens
US5311028A (en) * 1990-08-29 1994-05-10 Nissin Electric Co., Ltd. System and method for producing oscillating magnetic fields in working gaps useful for irradiating a surface with atomic and molecular ions
JP2809917B2 (en) * 1992-01-13 1998-10-15 富士通株式会社 Charged particle beam exposure method and apparatus
JP2816458B2 (en) * 1992-02-24 1998-10-27 株式会社村田製作所 Saddle deflection coil
US7345287B2 (en) * 2005-09-30 2008-03-18 Applied Materials, Inc. Cooling module for charged particle beam column elements
US10486232B2 (en) * 2015-04-21 2019-11-26 Varian Semiconductor Equipment Associates, Inc. Semiconductor manufacturing device with embedded fluid conduits

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL145716B (en) * 1964-06-06 1975-04-15 Philips Nv ELECTRON BEAM DEVICE.
US3346736A (en) * 1964-09-22 1967-10-10 Applied Res Lab Inc Electron probe apparatus having an objective lens with an aperture for restricting fluid flow
US3374349A (en) * 1966-11-14 1968-03-19 Victor G. Macres Electron probe having a specific shortfocal length magnetic lens and light microscope

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2238426A (en) * 1989-11-16 1991-05-29 Jeol Ltd Electromagnetic lens.
GB2238426B (en) * 1989-11-16 1994-04-13 Jeol Ltd Electromagnetic lens

Also Published As

Publication number Publication date
DE1764835A1 (en) 1971-11-04
NL6811733A (en) 1969-02-20
FR1594573A (en) 1970-06-08
US3707628A (en) 1972-12-26

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PLNP Patent lapsed through nonpayment of renewal fees