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Apparatus for the investigation of the internal friction and shear modulus(Torsional pendulum type apparatus for measuring internal friction, logarithmic decrement and shear modulus of samples in room temperature to melting point range)
Optical and electrical properties of amorphous elemental semiconductors(Optical and electrical properties of amorphous elemental semiconductors, using cryostat)
EMR 6130(DADS system 2) on line station: Radiation effects semiconductor tester(On-line laboratory station connected to real time/time-sharing EMR 6130 computer for semiconductor radiation effects studies)
The application of regression analysis to the evaluation of instrument calibrations(Application of regression analysis in conversion of flight test instrument calibration data into analytical form for digital computer analysis)
Aerospace system test and evaluation complex- ASTEC(Automatic testing and evaluation system for launch-vehicle digital computer and data adapter of Saturn IB/Saturn V guidance system)