GB1200688A - Electronic test apparatus for the automatic examination of a characteristic curve of a circuit element - Google Patents

Electronic test apparatus for the automatic examination of a characteristic curve of a circuit element

Info

Publication number
GB1200688A
GB1200688A GB45761/68A GB4576168A GB1200688A GB 1200688 A GB1200688 A GB 1200688A GB 45761/68 A GB45761/68 A GB 45761/68A GB 4576168 A GB4576168 A GB 4576168A GB 1200688 A GB1200688 A GB 1200688A
Authority
GB
United Kingdom
Prior art keywords
test
network
photo
characteristic
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB45761/68A
Inventor
Erwin Martin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to GB45761/68A priority Critical patent/GB1200688A/en
Publication of GB1200688A publication Critical patent/GB1200688A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2894—Aspects of quality control [QC]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Radiation (AREA)

Abstract

1,200,688. Testing characteristics of circuit elements. SIEMENS A. G. Sept.26, 1968, No.45761/68. Heading G1U. To test whether a circuit element P has a required characteristic curve over a particular range a test signal U1 varying over that range is applied to the element P, and the resultant output U2 from P is applied to a network E having a transfer characteristic which varies in an equal and opposite manner to the expected variation in U2 so that if P has the required characteristic the output U3 of network E is substantially constant. A measuring instrument M is used to determine whether the output U3 remains between fixed upper and lower limits as the test signal Ul varies. In the example shown for testing the frequency characteristic of a filter, the network E comprises an amplifier having a frequency dependant feedback path, the test signal being swept over a required frequency range during the test. The meter M is a mirror galvanometer, and if, during the test, the light beam strikes upper or lower limit photodiodes F1, F2 a pulse is emitted which operates a control device St to reject the filter under test and give an audible or visual warning. If greater selectivity is required four limit-valve photo-diodes may be provided. In a sequential testing system each test cycle is initiated by the lower limit photo-diodeF2 which responds as the light beam first moves past it to trigger the generator G. Should the photo-diode not respond within a given period a timer unit T indicates that the test sequence has been interrupted.
GB45761/68A 1968-09-26 1968-09-26 Electronic test apparatus for the automatic examination of a characteristic curve of a circuit element Expired GB1200688A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB45761/68A GB1200688A (en) 1968-09-26 1968-09-26 Electronic test apparatus for the automatic examination of a characteristic curve of a circuit element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB45761/68A GB1200688A (en) 1968-09-26 1968-09-26 Electronic test apparatus for the automatic examination of a characteristic curve of a circuit element

Publications (1)

Publication Number Publication Date
GB1200688A true GB1200688A (en) 1970-07-29

Family

ID=10438484

Family Applications (1)

Application Number Title Priority Date Filing Date
GB45761/68A Expired GB1200688A (en) 1968-09-26 1968-09-26 Electronic test apparatus for the automatic examination of a characteristic curve of a circuit element

Country Status (1)

Country Link
GB (1) GB1200688A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102348992A (en) * 2009-03-09 2012-02-08 罗伯特·博世有限公司 Method for monitoring the electrical properties of a load circuit controlled in clocked fashion and circuit arrangement for carrying out the method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102348992A (en) * 2009-03-09 2012-02-08 罗伯特·博世有限公司 Method for monitoring the electrical properties of a load circuit controlled in clocked fashion and circuit arrangement for carrying out the method

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PLNP Patent lapsed through nonpayment of renewal fees