GB1176088A - Temperature Compensated Zener Diode. - Google Patents

Temperature Compensated Zener Diode.

Info

Publication number
GB1176088A
GB1176088A GB40946/67A GB4094667A GB1176088A GB 1176088 A GB1176088 A GB 1176088A GB 40946/67 A GB40946/67 A GB 40946/67A GB 4094667 A GB4094667 A GB 4094667A GB 1176088 A GB1176088 A GB 1176088A
Authority
GB
United Kingdom
Prior art keywords
zones
series
junctions
substrate
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB40946/67A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Micronas GmbH
ITT Inc
Original Assignee
Deutsche ITT Industries GmbH
ITT Industries Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19661539867 external-priority patent/DE1539867C3/de
Application filed by Deutsche ITT Industries GmbH, ITT Industries Inc filed Critical Deutsche ITT Industries GmbH
Publication of GB1176088A publication Critical patent/GB1176088A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/201Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D1/00 or H10D8/00, e.g. RLC circuits
    • H10D84/204Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D1/00 or H10D8/00, e.g. RLC circuits of combinations of diodes or capacitors or resistors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00Subject matter not provided for in other groups of this subclass

Landscapes

  • Electrodes Of Semiconductors (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Bipolar Integrated Circuits (AREA)
GB40946/67A 1951-01-28 1967-09-07 Temperature Compensated Zener Diode. Expired GB1176088A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DED0051079 1966-09-13
DE19661539867 DE1539867C3 (de) 1966-09-13 1966-09-13 Temperaturkompensierte Z-Diode und Verfahren zu ihrer Herstellung

Publications (1)

Publication Number Publication Date
GB1176088A true GB1176088A (en) 1970-01-01

Family

ID=25752810

Family Applications (1)

Application Number Title Priority Date Filing Date
GB40946/67A Expired GB1176088A (en) 1951-01-28 1967-09-07 Temperature Compensated Zener Diode.

Country Status (2)

Country Link
FR (1) FR1549324A (enrdf_load_stackoverflow)
GB (1) GB1176088A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3999205A (en) * 1975-04-03 1976-12-21 Rca Corporation Rectifier structure for a semiconductor integrated circuit device
US4005471A (en) * 1975-03-17 1977-01-25 International Business Machines Corporation Semiconductor resistor having a high value resistance for use in an integrated circuit semiconductor device
US4200877A (en) * 1976-12-23 1980-04-29 Hitachi, Ltd. Temperature-compensated voltage reference diode with intermediate polycrystalline layer
WO2002003473A1 (de) 2000-07-05 2002-01-10 Robert Bosch Gmbh Anordnung mit p-dotierten und n-dotierten halbleiterschichten sowie verfahren zu deren herstellung

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1188398B (it) * 1986-02-18 1988-01-07 Sgs Microelettronica Spa Struttura integrata di protezione da scariche elettrostatische e dispositivo a semiconduttore incorporante la stessa

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4005471A (en) * 1975-03-17 1977-01-25 International Business Machines Corporation Semiconductor resistor having a high value resistance for use in an integrated circuit semiconductor device
US3999205A (en) * 1975-04-03 1976-12-21 Rca Corporation Rectifier structure for a semiconductor integrated circuit device
US4200877A (en) * 1976-12-23 1980-04-29 Hitachi, Ltd. Temperature-compensated voltage reference diode with intermediate polycrystalline layer
WO2002003473A1 (de) 2000-07-05 2002-01-10 Robert Bosch Gmbh Anordnung mit p-dotierten und n-dotierten halbleiterschichten sowie verfahren zu deren herstellung

Also Published As

Publication number Publication date
DE1539867A1 (de) 1970-05-21
DE1539867B2 (enrdf_load_stackoverflow) 1974-05-09
FR1549324A (enrdf_load_stackoverflow) 1968-12-13

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