GB1140367A - Improvements in and relating to mass spectrometers - Google Patents

Improvements in and relating to mass spectrometers

Info

Publication number
GB1140367A
GB1140367A GB12371/66A GB1237166A GB1140367A GB 1140367 A GB1140367 A GB 1140367A GB 12371/66 A GB12371/66 A GB 12371/66A GB 1237166 A GB1237166 A GB 1237166A GB 1140367 A GB1140367 A GB 1140367A
Authority
GB
United Kingdom
Prior art keywords
probe structure
sample
sample holders
laser beam
ionization
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB12371/66A
Inventor
John Stewart Heath
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Associated Electrical Industries Ltd
Original Assignee
Associated Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Associated Electrical Industries Ltd filed Critical Associated Electrical Industries Ltd
Priority to GB12371/66A priority Critical patent/GB1140367A/en
Priority to DE19671598013 priority patent/DE1598013A1/en
Priority to FR99537A priority patent/FR1520867A/en
Priority to US624592A priority patent/US3596087A/en
Publication of GB1140367A publication Critical patent/GB1140367A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/18—Ion sources; Ion guns using spark ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0495—Vacuum locks; Valves

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

1,140,367. Ion sources. ASSOCIATED ELECTRICAL INDUSTRIES Ltd. 21 March, 1967, No. 12371/66. Heading H1D. In a mass spectrometer solid sample ion source arrangement an insertion probe structure, demountably carrying at one end at least one solid sample, is introduced into the ionization chamber through a vacuum lock without breaking the vacuum, the ionization means is separate from the probe structure and a preliminary ion-etching cleansing action on the sample may be effected by a discharge in argon between the sample and an annular anode 9. The ionization means may comprise an external laser beam generator the laser beam entering the ionization chamber through a window, or, as in the arrangement shown, arc- or spark-electrode structures 11, 12. The probe structure 3 insertable through a rotary vacuum lock 5 of the type described in Specification 1,092,803 comprises an inner rod (shown in dotted outline) movable to an extent determined by a key K to effect a transfer of the sample holders 25, 26 to slotted electrode clips 15, 16. The sample holders 25, 26 are pivotally mounted on an end member 27 of the probe structure 3 and a withdrawal motion of the inner rod followed by a rotation causes eccentrically positioned projections 28b to displace the sample holders from upright positions into the positions shown. A subsequent movement of the probe structure lifts the pivots for the sample holders clear of the slots therein; the electrode structures 11, 12 can then be swung aside and the probe structure withdrawn.
GB12371/66A 1966-03-21 1966-03-21 Improvements in and relating to mass spectrometers Expired GB1140367A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
GB12371/66A GB1140367A (en) 1966-03-21 1966-03-21 Improvements in and relating to mass spectrometers
DE19671598013 DE1598013A1 (en) 1966-03-21 1967-03-20 Ion source for mass spectrometer
FR99537A FR1520867A (en) 1966-03-21 1967-03-20 Ion sources for mass spectrometers
US624592A US3596087A (en) 1966-03-21 1967-03-20 Spark source mass spectrometers and sample insertion probe therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB12371/66A GB1140367A (en) 1966-03-21 1966-03-21 Improvements in and relating to mass spectrometers

Publications (1)

Publication Number Publication Date
GB1140367A true GB1140367A (en) 1969-01-15

Family

ID=10003317

Family Applications (1)

Application Number Title Priority Date Filing Date
GB12371/66A Expired GB1140367A (en) 1966-03-21 1966-03-21 Improvements in and relating to mass spectrometers

Country Status (3)

Country Link
US (1) US3596087A (en)
DE (1) DE1598013A1 (en)
GB (1) GB1140367A (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4532816A (en) * 1983-07-25 1985-08-06 The Perkin-Elmer Corporation Sample vessel
DE2837715A1 (en) * 1978-08-30 1980-03-13 Leybold Heraeus Gmbh & Co Kg METHOD FOR ANALYZING ORGANIC SUBSTANCES
DE2942386C2 (en) * 1979-10-19 1984-01-12 Ulrich Dr. 8000 München Boesl Ion source
US4388531A (en) * 1981-03-06 1983-06-14 Finnigan Corporation Ionizer having interchangeable ionization chamber
US6864091B1 (en) * 2000-08-31 2005-03-08 Symyx Technologies, Inc. Sampling probe
EP2396803A4 (en) 2009-02-12 2016-10-26 Ibis Biosciences Inc Ionization probe assemblies
WO2012162036A1 (en) * 2011-05-20 2012-11-29 Purdue Research Foundation (Prf) Systems and methods for analyzing a sample
JP6025406B2 (en) * 2012-06-04 2016-11-16 株式会社日立ハイテクノロジーズ Mass spectrometer
CN106575598B (en) * 2014-08-01 2020-04-28 安捷伦科技有限公司 Plasma cleaning of mass spectrometer
US20170110308A1 (en) * 2015-10-20 2017-04-20 Advion Inc. Inert Atmospheric Solids Analysis Probe System

Also Published As

Publication number Publication date
US3596087A (en) 1971-07-27
DE1598013A1 (en) 1970-08-20

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