GB1037742A - Method and apparatus for detecting components of a gas mixture by ionisation and measurement of the ion current - Google Patents

Method and apparatus for detecting components of a gas mixture by ionisation and measurement of the ion current

Info

Publication number
GB1037742A
GB1037742A GB9592/63A GB959263A GB1037742A GB 1037742 A GB1037742 A GB 1037742A GB 9592/63 A GB9592/63 A GB 9592/63A GB 959263 A GB959263 A GB 959263A GB 1037742 A GB1037742 A GB 1037742A
Authority
GB
United Kingdom
Prior art keywords
ionization
helium
different
chamber
proportions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB9592/63A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ATLAS MESS und ANALYSENTECHNIK GmbH
Original Assignee
ATLAS MESS und ANALYSENTECHNIK GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ATLAS MESS und ANALYSENTECHNIK GmbH filed Critical ATLAS MESS und ANALYSENTECHNIK GmbH
Publication of GB1037742A publication Critical patent/GB1037742A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/62Detectors specially adapted therefor
    • G01N30/64Electrical detectors
    • G01N30/70Electron capture detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622Ion mobility spectrometry
    • G01N27/623Ion mobility spectrometry combined with mass spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/64Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
    • G01N27/66Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber and measuring current or voltage
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00Ion beam tubes
    • H01J27/02Ion sources; Ion guns
    • H01J27/20Ion sources; Ion guns using particle beam bombardment, e.g. ionisers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J41/00Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas; Discharge tubes for evacuation by diffusion of ions
    • H01J41/02Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas
    • H01J41/04Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas with ionisation by means of thermionic cathodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Molecular Biology (AREA)
  • Engineering & Computer Science (AREA)
  • Combustion & Propulsion (AREA)
  • Toxicology (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Examining Or Testing Airtightness (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

1,037,742. Discharge apparatus. ATLAS MERS-UND ANALYSENTECHNIK G.m.b.H. March 11, 1963 [March 10, 1962], No. 9592/63. Heading H1D. [Also in Division G1] To detect components in a gas it is ionized at two or more different energies so that the ionization probabilities of the different components are in different proportions in the different ionization chambers. Thus the total ion currents may be used to evaluate the proportions of the components in the mixture. In the embodiment of Fig. 1 an electron beam passes through a first ionization chamber 6 and then has its energy increased before passing through a second ionization chamber 7. The magnet 14, 15 serves to focus the electron beam. The apparatus may be used to determine the proportions in a binary mixture from the ion currents to collectors 19 and 20. The apparatus may also be used as a leak detector in a high vacuum apparatus. In this case the energy of the electron beam in the first chamber is preferably below the ionization value for the probe gas such as helium and the energy in the second chamber is arranged to give as high an ionization of helium as possible. The bridge circuit 23 is first balanced in the absence of helium so that when the apparatus is sprayed with helium a very sensitive response is produced to a leak. In another embodiment, Fig. 2 (not shown), the ionization chambers are connected between a gas chromatography column and a mass spectrometer. This arrangement uses parallel electron beams of different energies in the two chambers.
GB9592/63A 1951-01-28 1963-03-11 Method and apparatus for detecting components of a gas mixture by ionisation and measurement of the ion current Expired GB1037742A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19511698533 DE1698533A1 (en) 1951-01-28 1951-01-28 High vacuum ion source assembly
DEA0039680 1962-03-10

Publications (1)

Publication Number Publication Date
GB1037742A true GB1037742A (en) 1966-08-03

Family

ID=25754628

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9592/63A Expired GB1037742A (en) 1951-01-28 1963-03-11 Method and apparatus for detecting components of a gas mixture by ionisation and measurement of the ion current

Country Status (2)

Country Link
DE (1) DE1698533A1 (en)
GB (1) GB1037742A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102495266A (en) * 2011-12-04 2012-06-13 中国航天科技集团公司第五研究院第五一〇研究所 Ion current detection device for magnetic deflection mass spectrograph

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102495266A (en) * 2011-12-04 2012-06-13 中国航天科技集团公司第五研究院第五一〇研究所 Ion current detection device for magnetic deflection mass spectrograph
CN102495266B (en) * 2011-12-04 2013-11-20 中国航天科技集团公司第五研究院第五一〇研究所 Ion current detection device for magnetic deflection mass spectrograph

Also Published As

Publication number Publication date
DE1698533B2 (en) 1974-05-09
DE1698533A1 (en) 1972-01-20

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