GB1008545A - Analyzing device for electron beam micro-probe - Google Patents
Analyzing device for electron beam micro-probeInfo
- Publication number
- GB1008545A GB1008545A GB3534962A GB3534962A GB1008545A GB 1008545 A GB1008545 A GB 1008545A GB 3534962 A GB3534962 A GB 3534962A GB 3534962 A GB3534962 A GB 3534962A GB 1008545 A GB1008545 A GB 1008545A
- Authority
- GB
- United Kingdom
- Prior art keywords
- plate
- electron
- samples
- electron beam
- sample carrying
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
Abstract
1,008,545. X-ray tubes; electron beam apparatus. COMMUNAUTE EUROPEENE DE L'ENERGIE ATOMIQUE (EURATOM). Sept. 17, 1962 [Sept. 29, 1961], No. 35349/62. Heading H1D. An electron beam microprobe for X-ray and electron diffraction analysis has a specimen holder which comprises (a) a base-plate 1 provided with slideways 2, 3 and a stop 4, (b) an insulating plate 7, and (c) a metallic mounting plate 17 carrying an electron trap 29 and a plurality of sample carrying subassemblies 20, 21, the plate 17 being provided with apertures for thimble(s) 14, 15, 16 which are supported on plate 7 and which contain massive reference samples. The sample carrying subassemblies 20, 21 comprise non-magnetic flexible blades rigidly fixed at one end. The blades are provided at the other end with flared holes 22 which bear against sample carrying grids 27 resting in holders 26. Set-screws 24 are provided. A central hole 44 is also provided in plate 17 for the passage of the beam for beam centring purposes. A contact screw 33 permits connection of the plate 17 to the base-plate 1, which is earthed. By measurements of the currents taken from the electron trap, massive and thin samples and of the current transmitted through the thin samples, the absorption of electrons in the samples can be determined.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
BE485105 | 1961-09-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1008545A true GB1008545A (en) | 1965-10-27 |
Family
ID=3844607
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB3534962A Expired GB1008545A (en) | 1961-09-29 | 1962-09-27 | Analyzing device for electron beam micro-probe |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB1008545A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2133930A (en) * | 1983-01-08 | 1984-08-01 | Canon Kk | Workpiece carriages |
-
1962
- 1962-09-27 GB GB3534962A patent/GB1008545A/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2133930A (en) * | 1983-01-08 | 1984-08-01 | Canon Kk | Workpiece carriages |
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