GB0216232D0 - Non-destructive observation of profile roughness - Google Patents

Non-destructive observation of profile roughness

Info

Publication number
GB0216232D0
GB0216232D0 GB0216232A GB0216232A GB0216232D0 GB 0216232 D0 GB0216232 D0 GB 0216232D0 GB 0216232 A GB0216232 A GB 0216232A GB 0216232 A GB0216232 A GB 0216232A GB 0216232 D0 GB0216232 D0 GB 0216232D0
Authority
GB
United Kingdom
Prior art keywords
profile roughness
destructive observation
destructive
observation
roughness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB0216232A
Other versions
GB2390684A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DenseLight Semiconductors Pte Ltd
Original Assignee
DenseLight Semiconductors Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DenseLight Semiconductors Pte Ltd filed Critical DenseLight Semiconductors Pte Ltd
Priority to GB0216232A priority Critical patent/GB2390684A/en
Publication of GB0216232D0 publication Critical patent/GB0216232D0/en
Publication of GB2390684A publication Critical patent/GB2390684A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/2806—Means for preparing replicas of specimens, e.g. for microscopal analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Treatments Of Macromolecular Shaped Articles (AREA)
  • Optical Integrated Circuits (AREA)
GB0216232A 2002-07-12 2002-07-12 Non-destructive observation of profile roughness Withdrawn GB2390684A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB0216232A GB2390684A (en) 2002-07-12 2002-07-12 Non-destructive observation of profile roughness

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB0216232A GB2390684A (en) 2002-07-12 2002-07-12 Non-destructive observation of profile roughness

Publications (2)

Publication Number Publication Date
GB0216232D0 true GB0216232D0 (en) 2002-08-21
GB2390684A GB2390684A (en) 2004-01-14

Family

ID=9940351

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0216232A Withdrawn GB2390684A (en) 2002-07-12 2002-07-12 Non-destructive observation of profile roughness

Country Status (1)

Country Link
GB (1) GB2390684A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114018662A (en) * 2021-10-18 2022-02-08 大连理工大学 Nondestructive testing method for deep hole inner surface morphology and roughness
CN114264275A (en) * 2021-12-28 2022-04-01 中国建筑材料科学研究总院有限公司 Nondestructive testing method for surface roughness of micro-nano grating

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7900497B2 (en) 2007-12-04 2011-03-08 Hitachi Global Storage Technologies Netherlands B.V. System, method and apparatus for obtaining true roughness of granular media

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3853805A (en) * 1972-11-10 1974-12-10 North American Rockwell Silicone elastomeric material
JPS5249055A (en) * 1975-10-16 1977-04-19 Power Reactor & Nuclear Fuel Dev Corp Method of measuring surface roughness
GB2064806B (en) * 1979-12-04 1984-05-10 Tokyo Metropolitan Government Polymeric replica film of specimen for electron microscopy and preparation method and apparatus thereof
GB8610065D0 (en) * 1986-04-24 1986-05-29 Rollins V Replicating techniques & compounds
FR2722001B1 (en) * 1994-06-30 1996-08-02 Snecma PROCESS FOR THE NON-DESTRUCTIVE CHARACTERIZATION OF THE SURFACE CONDITION OF A PART

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114018662A (en) * 2021-10-18 2022-02-08 大连理工大学 Nondestructive testing method for deep hole inner surface morphology and roughness
CN114264275A (en) * 2021-12-28 2022-04-01 中国建筑材料科学研究总院有限公司 Nondestructive testing method for surface roughness of micro-nano grating

Also Published As

Publication number Publication date
GB2390684A (en) 2004-01-14

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)