AU2003218590A8 - Measurement of optical properties - Google Patents

Measurement of optical properties

Info

Publication number
AU2003218590A8
AU2003218590A8 AU2003218590A AU2003218590A AU2003218590A8 AU 2003218590 A8 AU2003218590 A8 AU 2003218590A8 AU 2003218590 A AU2003218590 A AU 2003218590A AU 2003218590 A AU2003218590 A AU 2003218590A AU 2003218590 A8 AU2003218590 A8 AU 2003218590A8
Authority
AU
Australia
Prior art keywords
measurement
optical properties
properties
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003218590A
Other versions
AU2003218590A1 (en
Inventor
Rudolf Walti
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Haag Streit AG
Original Assignee
Haag Streit AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Haag Streit AG filed Critical Haag Streit AG
Publication of AU2003218590A8 publication Critical patent/AU2003218590A8/en
Publication of AU2003218590A1 publication Critical patent/AU2003218590A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02007—Two or more frequencies or sources used for interferometric measurement
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/102—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for optical coherence tomography [OCT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02027—Two or more interferometric channels or interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02049—Interferometers characterised by particular mechanical design details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/35—Mechanical variable delay line
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Surgery (AREA)
  • Biophysics (AREA)
  • Ophthalmology & Optometry (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Medical Informatics (AREA)
  • Molecular Biology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Eye Examination Apparatus (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
AU2003218590A 2002-04-18 2003-04-17 Measurement of optical properties Abandoned AU2003218590A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CH6532002 2002-04-18
CH653/02 2002-04-18
PCT/CH2003/000257 WO2003086180A2 (en) 2002-04-18 2003-04-17 Measurement of optical properties

Publications (2)

Publication Number Publication Date
AU2003218590A8 true AU2003218590A8 (en) 2003-10-27
AU2003218590A1 AU2003218590A1 (en) 2003-10-27

Family

ID=29220553

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003218590A Abandoned AU2003218590A1 (en) 2002-04-18 2003-04-17 Measurement of optical properties

Country Status (5)

Country Link
EP (1) EP1494575B1 (en)
JP (1) JP4287290B2 (en)
AU (1) AU2003218590A1 (en)
DE (1) DE50308223D1 (en)
WO (1) WO2003086180A2 (en)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT501056B1 (en) * 2004-02-06 2007-04-15 Zeiss Carl Meditec Ag SHORT COHERENCE INTERFEROMETRICAL LENGTH MEASUREMENT AT THE EYE
AT500501B1 (en) * 2004-06-14 2008-11-15 Zeiss Carl Meditec Ag DEVICE FOR MEASURING PARTIAL ELEMENTS ON THE EYE BY MEANS OF FOURIER-DOMAIN SHORT COHERENCE INTERFEROMETRY
JP4761774B2 (en) * 2005-01-12 2011-08-31 東京エレクトロン株式会社 Temperature / thickness measuring device, temperature / thickness measuring method, temperature / thickness measuring system, control system, control method
DE102005005816A1 (en) * 2005-02-04 2006-08-17 Carl Zeiss Meditec Ag Device for determining the position of mutually distanced regions in transparent and / or diffuse objects
EP1785690A1 (en) * 2005-11-10 2007-05-16 Haag-Streit Ag Method and device for determining an object s geometric characteristics
WO2007065670A2 (en) * 2005-12-06 2007-06-14 Carl Zeiss Meditec Ag Interferometric sample measurement
DE102005058220A1 (en) * 2005-12-06 2007-06-14 Carl Zeiss Meditec Ag Interferometric sample measurement
WO2008115060A1 (en) 2007-03-20 2008-09-25 Topcon Europe Medical Bv. Apparatus and method for observing an eye, as well as oct-module
DE102007046507A1 (en) * 2007-09-28 2009-04-02 Carl Zeiss Meditec Ag Kurzkoheränz interferometer
CZ302107B6 (en) * 2007-11-15 2010-10-20 Univerzita Palackého Device for contactless sensing and quantitative evaluation of movement of human eye or general physical objects
KR100939538B1 (en) * 2007-12-14 2010-02-03 (주) 인텍플러스 Apparatus for measuring three dimension
WO2010017954A2 (en) 2008-08-12 2010-02-18 Carl Zeiss Meditec Ag Optical coherence reflectometry with depth resolution
US8017905B2 (en) 2008-08-29 2011-09-13 Wavelight Ag Method for energy calibration of a pulsed laser system
JP5550258B2 (en) * 2009-05-08 2014-07-16 キヤノン株式会社 Optical coherence tomography system
MX2012003848A (en) * 2009-09-30 2012-05-08 Wavelight Gmbh Device for ophthalmological laser surgery.
EP2327953B1 (en) * 2009-11-20 2013-06-19 Mitutoyo Corporation Apparatus and method for determining a height map of a surface through both interferometric and non interferometric measurements.
JP5397817B2 (en) * 2010-02-05 2014-01-22 国立大学法人名古屋大学 Interference measuring apparatus and measuring method
JP2011214969A (en) * 2010-03-31 2011-10-27 Canon Inc Imaging apparatus and imaging method
EP2446812B1 (en) * 2010-10-26 2016-12-28 Haag-Streit Ag Device for examining eyes with digital imaging
KR101282932B1 (en) 2010-10-26 2013-07-05 한국표준과학연구원 Visibility Enhanced Low Coherence Interferometer
KR101267879B1 (en) 2010-10-26 2013-05-27 한국표준과학연구원 Visibility Enhanced Interferometer
DE102010055350A1 (en) * 2010-12-20 2012-06-21 Carl Zeiss Meditec Ag Apparatus for the interferometric measurement of the eye length and the anterior eye portion
ITPI20120009A1 (en) * 2012-01-24 2013-07-25 Visia Imaging S R L "A METHOD TO REDUCE THE TIME OF THE MEASUREMENT TO SCANNING THE EYE AXIAL LENGTH AND DEVICE TO IMPLEMENT THIS METHOD"
US20160022484A1 (en) * 2014-07-25 2016-01-28 Novartis Ag Optical coherence tomography-augmented surgical instruments and systems and methods for correcting undesired movement of surgical instruments
WO2016153571A1 (en) 2015-03-25 2016-09-29 Optimedica Corporation Multiple depth optical coherence tomography system and method and laser eye surgery system incorporating the same
JP6691365B2 (en) * 2015-09-30 2020-04-28 株式会社トプコン Ophthalmic equipment
FI20165576A (en) * 2016-07-11 2018-01-12 Photono Oy Apparatus and method for measuring optical thickness of a layer
AU2018211563A1 (en) * 2017-01-30 2019-05-23 Alcon Inc. System and method for cutting a flap using polarization sensitive optical coherence tomography
CN112965099B (en) * 2021-02-10 2023-03-14 上海市农业科学院 Energy measuring method of electron accelerator
WO2024041775A1 (en) * 2022-08-25 2024-02-29 Heidelberg Engineering Gmbh Device for measuring the length of an object

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2614273C3 (en) * 1976-04-02 1979-02-15 Fa. Carl Zeiss, 7920 Heidenheim Combination device for eye examination
GB8903725D0 (en) * 1989-02-18 1989-04-05 Cambridge Consultants Coherent tracking sensor
DE4331635C2 (en) * 1992-12-22 2001-03-15 Zeiss Carl Fa Illumination device for an operating microscope with optically-mechanically coupled observer tubes
DE59609787D1 (en) * 1995-05-04 2002-11-14 Haag Streit Ag Koeniz DEVICE FOR MEASURING THE THICKNESS OF TRANSPARENT OBJECTS
US6137585A (en) * 1998-05-15 2000-10-24 Laser Diagnostic Technologies, Inc. Method and apparatus for recording three-dimensional distribution of light backscattering potential in transparent and semi-transparent structures
US6256102B1 (en) * 1999-04-27 2001-07-03 University Of Central Florida Dual-beam low-coherence interferometer with improved signal-to-noise ratio
EP1232377B1 (en) * 1999-11-24 2004-03-31 Haag-Streit Ag Method and device for measuring the optical properties of at least two regions located at a distance from one another in a transparent and/or diffuse object

Also Published As

Publication number Publication date
EP1494575B1 (en) 2007-09-19
EP1494575A2 (en) 2005-01-12
WO2003086180A2 (en) 2003-10-23
AU2003218590A1 (en) 2003-10-27
JP4287290B2 (en) 2009-07-01
JP2005527280A (en) 2005-09-15
WO2003086180A3 (en) 2004-02-26
DE50308223D1 (en) 2007-10-31

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase