FR3117287B1 - DEVICE FOR THE ELECTRICAL CHARACTERIZATION OF A SAMPLE BY ITS REAR FACE - Google Patents

DEVICE FOR THE ELECTRICAL CHARACTERIZATION OF A SAMPLE BY ITS REAR FACE Download PDF

Info

Publication number
FR3117287B1
FR3117287B1 FR2012862A FR2012862A FR3117287B1 FR 3117287 B1 FR3117287 B1 FR 3117287B1 FR 2012862 A FR2012862 A FR 2012862A FR 2012862 A FR2012862 A FR 2012862A FR 3117287 B1 FR3117287 B1 FR 3117287B1
Authority
FR
France
Prior art keywords
sample
groups
electrical characterization
layer
photovoltaic material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR2012862A
Other languages
French (fr)
Other versions
FR3117287A1 (en
Inventor
Olivier Bonino
Wilfried Favre
Léo Basset
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA, Commissariat a lEnergie Atomique et aux Energies Alternatives CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR2012862A priority Critical patent/FR3117287B1/en
Publication of FR3117287A1 publication Critical patent/FR3117287A1/en
Application granted granted Critical
Publication of FR3117287B1 publication Critical patent/FR3117287B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • H02S50/15—Testing of PV devices, e.g. of PV modules or single PV cells using optical means, e.g. using electroluminescence
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Photovoltaic Devices (AREA)

Abstract

Dispositif (100) de caractérisation électrique d’un échantillon (10) comprenant au moins une couche (12) de matériau photovoltaïque et plusieurs groupes de plots de mesure TLM (18) répartis sur plusieurs régions d’une première face (14) de la couche de matériau photovoltaïque, le dispositif de caractérisation électrique comprenant : - un support (102) configuré pour supporter mécaniquement l’échantillon et comportant plusieurs groupes d’éléments de contact (110) indépendants, chacun des groupes d’éléments de contact étant configuré pour être en contact électriquement avec un des groupes de plots de mesure TLM lorsque la première face de la couche de matériau photovoltaïque est disposée contre le support ; - un dispositif de mesure I-V (124) auquel les éléments de contact sont couplés électriquement ; et dans lequel le dispositif de caractérisation électrique est configuré pour réaliser des mesures I-V avec chaque groupe d’éléments de contact indépendamment des autres groupes d’éléments de contact. Figure pour l’abrégé : figure 3.Device (100) for electrical characterization of a sample (10) comprising at least one layer (12) of photovoltaic material and several groups of TLM measurement pads (18) distributed over several regions of a first face (14) of the layer of photovoltaic material, the electrical characterization device comprising: - a support (102) configured to mechanically support the sample and comprising several groups of independent contact elements (110), each of the groups of contact elements being configured to be in electrical contact with one of the groups of TLM measurement pads when the first face of the layer of photovoltaic material is placed against the support; - an I-V meter (124) to which the contact elements are electrically coupled; and wherein the electrical characterization device is configured to perform I-V measurements with each contact element group independently of the other contact element groups. Figure for abstract: figure 3.

FR2012862A 2020-12-08 2020-12-08 DEVICE FOR THE ELECTRICAL CHARACTERIZATION OF A SAMPLE BY ITS REAR FACE Active FR3117287B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR2012862A FR3117287B1 (en) 2020-12-08 2020-12-08 DEVICE FOR THE ELECTRICAL CHARACTERIZATION OF A SAMPLE BY ITS REAR FACE

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR2012862 2020-12-08
FR2012862A FR3117287B1 (en) 2020-12-08 2020-12-08 DEVICE FOR THE ELECTRICAL CHARACTERIZATION OF A SAMPLE BY ITS REAR FACE

Publications (2)

Publication Number Publication Date
FR3117287A1 FR3117287A1 (en) 2022-06-10
FR3117287B1 true FR3117287B1 (en) 2023-07-28

Family

ID=74758979

Family Applications (1)

Application Number Title Priority Date Filing Date
FR2012862A Active FR3117287B1 (en) 2020-12-08 2020-12-08 DEVICE FOR THE ELECTRICAL CHARACTERIZATION OF A SAMPLE BY ITS REAR FACE

Country Status (1)

Country Link
FR (1) FR3117287B1 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102000358B1 (en) * 2017-09-29 2019-07-15 주식회사 맥사이언스 Apparatus for Measuring Characteristic for Solar Cell Using Controlling of LED Light
CN108462470B (en) * 2018-04-23 2019-08-06 河海大学常州校区 A kind of solar cell local voltage current capability test and validation method
US10938342B2 (en) * 2018-04-25 2021-03-02 Kyoshin Electric Co., Ltd. Probe and solar battery cell measurement apparatus

Also Published As

Publication number Publication date
FR3117287A1 (en) 2022-06-10

Similar Documents

Publication Publication Date Title
US4744246A (en) Flow sensor on insulator
Dong et al. Fabrication of a micromachined two-dimensional wind sensor by Au–Au wafer bonding technology
DE60001333D1 (en) APPARATUS FOR LOCALIZING MANUFACTURING ERRORS IN A SUBSTRATE FOR A PHOTOVOLTAIC COMPONENT
FR3117287B1 (en) DEVICE FOR THE ELECTRICAL CHARACTERIZATION OF A SAMPLE BY ITS REAR FACE
FR3024920A1 (en) INTEGRATED CIRCUIT CHIP WITH DERIVED CORRECTED TEMPERATURE
Tamizhmani et al. Regional soiling stations for PV: Soling loss analysis
US3495170A (en) Method for the indirect measurement of resistivities and impurity concentrations in a semiconductor body including an epitaxial film
GB587996A (en) An improved means for measuring flow of heat
CN102565600B (en) Method for determining and testing ohmic contact between black silicon material and metal electrode
TW429306B (en) Wafer sensor for measuring temperature distribution
US20150318822A1 (en) Reducing unequal biasing in solar cell testing
FR3097385B1 (en) DEVICE AND METHOD FOR LOCAL ELECTRICAL CHARACTERIZATION OF PHOTOVOLTAIC CELLS
JPS55146019A (en) Pressure detector of semiconductor
GB923153A (en) Semiconductor strain gauge
Bilger et al. Excess noise measurements in ion-implanted silicon resistors
Kruse et al. Impact of contacting geometries on measured fill factors
US20210003628A1 (en) Systems and methods for measuring electrical characteristics of a material using a non-destructive multi-point probe
FR3123450B1 (en) Device for measuring the voltage of one or more electrochemical cell(s)
RU220808U1 (en) Optical radiation receiver
Akter et al. Electrical characterization and doping uniformity measurement during crystalline silicon solar cell fabrication using hot probe method
FR2788115A1 (en) MOUNTING A TEMPERATURE SENSOR IN A HOB
RU135131U1 (en) INTEGRAL PRESSURE CONVERTER
EP3417492B1 (en) Thermoelectric device
McConnell et al. Measurement of the electrical resistance of metal-thermoelectric semiconductor contacts
JPS61202151A (en) Moisture/temperature detector

Legal Events

Date Code Title Description
PLFP Fee payment

Year of fee payment: 2

PLSC Publication of the preliminary search report

Effective date: 20220610

PLFP Fee payment

Year of fee payment: 3

PLFP Fee payment

Year of fee payment: 4