FR3081564B1 - Dispositif de projection et procédé de projection - Google Patents

Dispositif de projection et procédé de projection Download PDF

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Publication number
FR3081564B1
FR3081564B1 FR1905591A FR1905591A FR3081564B1 FR 3081564 B1 FR3081564 B1 FR 3081564B1 FR 1905591 A FR1905591 A FR 1905591A FR 1905591 A FR1905591 A FR 1905591A FR 3081564 B1 FR3081564 B1 FR 3081564B1
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FR
France
Prior art keywords
projection
mirror surface
object space
unit
areas
Prior art date
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Active
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FR1905591A
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English (en)
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FR3081564A1 (fr
Inventor
Anika Brahm
Claudia Reinlein
Ingo Gebhart
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Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Original Assignee
Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
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Application filed by Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV filed Critical Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Publication of FR3081564A1 publication Critical patent/FR3081564A1/fr
Application granted granted Critical
Publication of FR3081564B1 publication Critical patent/FR3081564B1/fr
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
    • G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/18—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical projection, e.g. combination of mirror and condenser and objective
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/18—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors
    • G02B7/182—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors for mirrors
    • G02B7/185—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors for mirrors with means for adjusting the shape of the mirror surface

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Dispositif de projection et procédé de projection. L'invention concerne un dispositif de projection (4) comprenant : une unité d'éclairage (7) pour émettre de la lumière (L) ; et une unité de projection (8) ayant une surface miroir, l'unité de projection (8) étant conçue pour projeter la lumière (L) émise par le dispositif d'éclairage (7) au moyen de la surface miroir dans un espace objet (2) et pour la former en différents motifs lumineux spatialement structurés (16a, 16b) dans l'espace objet (2). Le dispositif de projection (4) se distingue par le fait que la surface miroir est déformable, au moins par zones, et que l'unité de projection (8), pour former les différents motifs lumineux spatialement structurés (16a, 16b) dans l'espace objet (2), comporte au moins un actionneur (12a, 12b) pour déformer la surface miroir, au moins par zones. L'invention concerne en outre un procédé de projection, un dispositif (1) et un procédé de détection d'un contour tridimensionnel (3) Figure pour l'abrégé : Fig. 1
FR1905591A 2018-05-28 2019-05-27 Dispositif de projection et procédé de projection Active FR3081564B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102018208417.3A DE102018208417A1 (de) 2018-05-28 2018-05-28 Projektionsvorrichtung und Projektionsverfahren
DEDE102018208417.3 2018-05-28

Publications (2)

Publication Number Publication Date
FR3081564A1 FR3081564A1 (fr) 2019-11-29
FR3081564B1 true FR3081564B1 (fr) 2024-04-26

Family

ID=68499444

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1905591A Active FR3081564B1 (fr) 2018-05-28 2019-05-27 Dispositif de projection et procédé de projection

Country Status (4)

Country Link
US (1) US11029145B2 (fr)
CH (1) CH715045B1 (fr)
DE (1) DE102018208417A1 (fr)
FR (1) FR3081564B1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020052300A1 (fr) * 2018-09-14 2020-03-19 南昌欧菲生物识别技术有限公司 Module de projection, dispositif d'imagerie tridimensionnelle à lumière structurée et dispositif électronique
CN112729246B (zh) * 2020-12-08 2022-12-16 广东省科学院智能制造研究所 一种基于双目结构光的黑色表面物体深度图像测量方法
CN114001668B (zh) * 2021-11-04 2022-07-19 海伯森技术（深圳）有限公司 反光物体表面的三维测量系统及其测量方法和存储介质

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US4725144A (en) * 1986-02-25 1988-02-16 R & D Associates Optic element testing method and apparatus
US5083857A (en) * 1990-06-29 1992-01-28 Texas Instruments Incorporated Multi-level deformable mirror device
US5504504A (en) * 1994-07-13 1996-04-02 Texas Instruments Incorporated Method of reducing the visual impact of defects present in a spatial light modulator display
US6028672A (en) * 1996-09-30 2000-02-22 Zheng J. Geng High speed three dimensional imaging method
DE19633686C2 (de) * 1996-08-12 1998-08-20 Fraunhofer Ges Forschung Vorrichtung und Verfahren zur Vermessung von Entfernungen und/oder räumlichen Koordinaten von Gegenständen und/oder deren zeitlicher Änderung
DE19639999C2 (de) * 1996-09-18 1998-08-20 Omeca Messtechnik Gmbh Verfahren und Vorrichtung für die 3D-Messung
JP4136067B2 (ja) * 1997-05-02 2008-08-20 キヤノン株式会社 検出装置及びそれを用いた露光装置
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JP2004247947A (ja) * 2003-02-13 2004-09-02 Olympus Corp 光学装置
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US7428997B2 (en) * 2003-07-29 2008-09-30 Microvision, Inc. Method and apparatus for illuminating a field-of-view and capturing an image
WO2006109308A1 (fr) * 2005-04-12 2006-10-19 Sharon Ehrlich Procede d'imagerie en temps reel et systeme utilisant une lumiere structuree
US7518780B2 (en) * 2005-08-08 2009-04-14 Lawrence Livermore National Laboratory, Llc Nanolaminate deformable mirrors
GB0920752D0 (en) * 2009-11-26 2010-01-13 Univ St Andrews Laser
DE102011010265A1 (de) * 2011-02-01 2012-08-02 Friedrich-Schiller-Universität Jena Verfahren zur dreidimensionalen Rekonstruktion von Objekten unter Verwendung von Streifenprojektionsmustern
DE102011014779A1 (de) * 2011-03-15 2012-09-20 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und Verfahren zur Vermessung eines Gegenstandes
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Also Published As

Publication number Publication date
US11029145B2 (en) 2021-06-08
CH715045B1 (de) 2022-10-31
US20190360799A1 (en) 2019-11-28
FR3081564A1 (fr) 2019-11-29
DE102018208417A1 (de) 2019-11-28
CH715045A2 (de) 2019-11-29

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