FR3054312B1 - METHOD AND DEVICE FOR MEASURING THE THICKNESS OF A METAL COATING - Google Patents

METHOD AND DEVICE FOR MEASURING THE THICKNESS OF A METAL COATING Download PDF

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Publication number
FR3054312B1
FR3054312B1 FR1657117A FR1657117A FR3054312B1 FR 3054312 B1 FR3054312 B1 FR 3054312B1 FR 1657117 A FR1657117 A FR 1657117A FR 1657117 A FR1657117 A FR 1657117A FR 3054312 B1 FR3054312 B1 FR 3054312B1
Authority
FR
France
Prior art keywords
coating
thickness
measuring
metal coating
calculate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1657117A
Other languages
French (fr)
Other versions
FR3054312A1 (en
Inventor
Jacques Rivenez
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre Technique des Industries Mecaniques CETIM
Original Assignee
Centre Technique des Industries Mecaniques CETIM
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre Technique des Industries Mecaniques CETIM filed Critical Centre Technique des Industries Mecaniques CETIM
Priority to FR1657117A priority Critical patent/FR3054312B1/en
Priority to PCT/FR2017/052075 priority patent/WO2018020148A1/en
Publication of FR3054312A1 publication Critical patent/FR3054312A1/en
Application granted granted Critical
Publication of FR3054312B1 publication Critical patent/FR3054312B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • G01B17/02—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
    • G01B17/025—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness for measuring thickness of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/46—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H5/00—Measuring propagation velocity of ultrasonic, sonic or infrasonic waves, e.g. of pressure waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02854—Length, thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0423—Surface waves, e.g. Rayleigh waves, Love waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects

Abstract

L'invention concerne un procédé et un dispositif de mesure de l'épaisseur d'un revêtement métallique d'un substrat, ledit procédé étant du type comprenant les étapes suivantes: on fournit un substrat (10) revêtu d'un revêtement métallique (12), ledit revêtement métallique présentant une surface de revêtement ; et, on émet des ondes ultrasonores à ladite surface de revêtement selon une composante normale à ladite surface de revêtement et on enregistre un signal réfléchi pour pouvoir calculer l'épaisseur dudit revêtement. On transforme ledit signal réfléchi en signal fréquentiel pour pouvoir déterminer une différence de fréquences représentative de ladite épaisseur dudit revêtement (12) de façon à calculer l'épaisseur dudit revêtement.The invention relates to a method and a device for measuring the thickness of a metallic coating of a substrate, said method being of the type comprising the following steps: providing a substrate (10) coated with a metallic coating (12). ), said metallic coating having a coating surface; and, ultrasonic waves are emitted at said coating surface according to a component normal to said coating surface and a reflected signal is recorded in order to be able to calculate the thickness of said coating. Said reflected signal is transformed into a frequency signal in order to be able to determine a frequency difference representative of said thickness of said coating (12) so as to calculate the thickness of said coating.

FR1657117A 2016-07-25 2016-07-25 METHOD AND DEVICE FOR MEASURING THE THICKNESS OF A METAL COATING Active FR3054312B1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR1657117A FR3054312B1 (en) 2016-07-25 2016-07-25 METHOD AND DEVICE FOR MEASURING THE THICKNESS OF A METAL COATING
PCT/FR2017/052075 WO2018020148A1 (en) 2016-07-25 2017-07-25 Method and device for measuring the thickness of a metallic coating

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1657117 2016-07-25
FR1657117A FR3054312B1 (en) 2016-07-25 2016-07-25 METHOD AND DEVICE FOR MEASURING THE THICKNESS OF A METAL COATING

Publications (2)

Publication Number Publication Date
FR3054312A1 FR3054312A1 (en) 2018-01-26
FR3054312B1 true FR3054312B1 (en) 2020-11-27

Family

ID=57906681

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1657117A Active FR3054312B1 (en) 2016-07-25 2016-07-25 METHOD AND DEVICE FOR MEASURING THE THICKNESS OF A METAL COATING

Country Status (2)

Country Link
FR (1) FR3054312B1 (en)
WO (1) WO2018020148A1 (en)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5305239A (en) * 1989-10-04 1994-04-19 The Texas A&M University System Ultrasonic non-destructive evaluation of thin specimens
US5271274A (en) * 1991-08-14 1993-12-21 The Board Of Trustees Of The Leland Stanford Junior University Thin film process monitoring techniques using acoustic waves
GB0021114D0 (en) * 2000-08-29 2000-10-11 Univ Sheffield Method and apparatus for determining thickness of lubricant film
KR100671418B1 (en) * 2003-12-22 2007-01-18 재단법인 포항산업과학연구원 Method for Measuring Thickness of Metal Sheet by using Electromagnetic Acoustic Transducer
JP4884925B2 (en) * 2006-11-07 2012-02-29 新日本製鐵株式会社 Plating thickness measuring device, plating thickness measuring method, program, and computer-readable storage medium
GB2545704A (en) * 2015-12-22 2017-06-28 Univ Sheffield Continuous wave ultrasound for analysis of a surface

Also Published As

Publication number Publication date
WO2018020148A1 (en) 2018-02-01
FR3054312A1 (en) 2018-01-26

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