FR3034577B1 - Dispositif et procede de caracterisation d’une impulsion laser femtoseconde - Google Patents

Dispositif et procede de caracterisation d’une impulsion laser femtoseconde Download PDF

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Publication number
FR3034577B1
FR3034577B1 FR1552704A FR1552704A FR3034577B1 FR 3034577 B1 FR3034577 B1 FR 3034577B1 FR 1552704 A FR1552704 A FR 1552704A FR 1552704 A FR1552704 A FR 1552704A FR 3034577 B1 FR3034577 B1 FR 3034577B1
Authority
FR
France
Prior art keywords
laser pulse
characterizing
trace
detector
femtosecond laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1552704A
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English (en)
Other versions
FR3034577A1 (fr
Inventor
Pierre Bejot
Franck Billard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Universite de Bourgogne
Original Assignee
Centre National de la Recherche Scientifique CNRS
Universite de Bourgogne
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS, Universite de Bourgogne filed Critical Centre National de la Recherche Scientifique CNRS
Priority to FR1552704A priority Critical patent/FR3034577B1/fr
Priority to PCT/EP2016/056913 priority patent/WO2016156391A1/fr
Priority to EP16713865.0A priority patent/EP3278407A1/fr
Publication of FR3034577A1 publication Critical patent/FR3034577A1/fr
Application granted granted Critical
Publication of FR3034577B1 publication Critical patent/FR3034577B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/0014—Monitoring arrangements not otherwise provided for
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/005—Optical devices external to the laser cavity, specially adapted for lasers, e.g. for homogenisation of the beam or for manipulating laser pulses, e.g. pulse shaping
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Semiconductor Lasers (AREA)

Abstract

Le dispositif pour la caractérisation d'une impulsion laser (Pu), comprend : ▪ Un bi-prisme de Fresnel (BPF) séparant un faisceau laser incident ; ▪ Un détecteur (CAM) comprenant au moins un détecteur linéaire semi-conducteur disposé dans une zone de recouvrement dans laquelle les faisceaux séparés interfèrent et génèrent une trace par absorption de deux photons d'au moins deux faisceaux séparés par le bi-prisme de Fresnel, la dite trace générée comportant des informations caractérisant l'impulsion laser (Pu) ; ▪ un calculateur (K) traitant un signal issu du détecteur (CAM) produit par la génération de la trace pour en déduire une durée d'impulsion laser.
FR1552704A 2015-03-31 2015-03-31 Dispositif et procede de caracterisation d’une impulsion laser femtoseconde Expired - Fee Related FR3034577B1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR1552704A FR3034577B1 (fr) 2015-03-31 2015-03-31 Dispositif et procede de caracterisation d’une impulsion laser femtoseconde
PCT/EP2016/056913 WO2016156391A1 (fr) 2015-03-31 2016-03-30 Dispositif et procede de caracterisation d'une impulsion laser femtoseconde
EP16713865.0A EP3278407A1 (fr) 2015-03-31 2016-03-30 Dispositif et procede de caracterisation d'une impulsion laser femtoseconde

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1552704 2015-03-31
FR1552704A FR3034577B1 (fr) 2015-03-31 2015-03-31 Dispositif et procede de caracterisation d’une impulsion laser femtoseconde

Publications (2)

Publication Number Publication Date
FR3034577A1 FR3034577A1 (fr) 2016-10-07
FR3034577B1 true FR3034577B1 (fr) 2018-05-25

Family

ID=53776722

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1552704A Expired - Fee Related FR3034577B1 (fr) 2015-03-31 2015-03-31 Dispositif et procede de caracterisation d’une impulsion laser femtoseconde

Country Status (3)

Country Link
EP (1) EP3278407A1 (fr)
FR (1) FR3034577B1 (fr)
WO (1) WO2016156391A1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3117206B1 (fr) 2020-12-03 2022-11-11 Univ Bourgogne Caracterisation d’une impulsion de rayonnement par fenetrage optique resolu en temps
CN117168632B (zh) * 2023-07-07 2024-02-27 北京大学 一种激光脉冲脉宽单发自相关测量装置及其标定方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9614363D0 (en) * 1996-07-09 1996-09-04 Council Cent Lab Res Councils Optical pulse autocorrelator
US6504612B2 (en) * 2000-11-14 2003-01-07 Georgia Tech Research Corporation Electromagnetic wave analyzer
CN103389163A (zh) * 2013-07-19 2013-11-13 中国科学院上海光学精密机械研究所 空间分辨二维单次自相关仪

Also Published As

Publication number Publication date
WO2016156391A1 (fr) 2016-10-06
FR3034577A1 (fr) 2016-10-07
EP3278407A1 (fr) 2018-02-07

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