FR2978546B1 - Methode et dispositif d'evaluation de la resistance d'un materiau a partir du taux surfacique d'inclusions - Google Patents

Methode et dispositif d'evaluation de la resistance d'un materiau a partir du taux surfacique d'inclusions

Info

Publication number
FR2978546B1
FR2978546B1 FR1156913A FR1156913A FR2978546B1 FR 2978546 B1 FR2978546 B1 FR 2978546B1 FR 1156913 A FR1156913 A FR 1156913A FR 1156913 A FR1156913 A FR 1156913A FR 2978546 B1 FR2978546 B1 FR 2978546B1
Authority
FR
France
Prior art keywords
inclusions
resistance
stress cycles
evaluating
per unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1156913A
Other languages
English (en)
Other versions
FR2978546A1 (fr
Inventor
Laurent Ferrer
Marie-Noelle Hinard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Safran Aircraft Engines SAS
Original Assignee
SNECMA SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SNECMA SAS filed Critical SNECMA SAS
Priority to FR1156913A priority Critical patent/FR2978546B1/fr
Publication of FR2978546A1 publication Critical patent/FR2978546A1/fr
Application granted granted Critical
Publication of FR2978546B1 publication Critical patent/FR2978546B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/32—Investigating strength properties of solid materials by application of mechanical stress by applying repeated or pulsating forces
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/136—Segmentation; Edge detection involving thresholding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0014—Type of force applied
    • G01N2203/0016—Tensile or compressive
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058—Kind of property studied
    • G01N2203/006—Crack, flaws, fracture or rupture
    • G01N2203/0067—Fracture or rupture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/0202—Control of the test
    • G01N2203/0212—Theories, calculations
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30136—Metal

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR1156913A 2011-07-28 2011-07-28 Methode et dispositif d'evaluation de la resistance d'un materiau a partir du taux surfacique d'inclusions Active FR2978546B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR1156913A FR2978546B1 (fr) 2011-07-28 2011-07-28 Methode et dispositif d'evaluation de la resistance d'un materiau a partir du taux surfacique d'inclusions

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1156913A FR2978546B1 (fr) 2011-07-28 2011-07-28 Methode et dispositif d'evaluation de la resistance d'un materiau a partir du taux surfacique d'inclusions

Publications (2)

Publication Number Publication Date
FR2978546A1 FR2978546A1 (fr) 2013-02-01
FR2978546B1 true FR2978546B1 (fr) 2013-08-16

Family

ID=44681303

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1156913A Active FR2978546B1 (fr) 2011-07-28 2011-07-28 Methode et dispositif d'evaluation de la resistance d'un materiau a partir du taux surfacique d'inclusions

Country Status (1)

Country Link
FR (1) FR2978546B1 (fr)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4857425B2 (ja) * 2001-03-23 2012-01-18 株式会社産学連携機構九州 金属材料の長寿命疲労強度設計法
FR2937736B1 (fr) * 2008-10-27 2011-01-07 Snecma Comptage d'inclusions sur alliages par analyse d'images

Also Published As

Publication number Publication date
FR2978546A1 (fr) 2013-02-01

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