FR2970783B1 - Procede de controle predictif du fonctionnement d'un equipement electronique, equipement electronique et dispositif de controle - Google Patents

Procede de controle predictif du fonctionnement d'un equipement electronique, equipement electronique et dispositif de controle

Info

Publication number
FR2970783B1
FR2970783B1 FR1100233A FR1100233A FR2970783B1 FR 2970783 B1 FR2970783 B1 FR 2970783B1 FR 1100233 A FR1100233 A FR 1100233A FR 1100233 A FR1100233 A FR 1100233A FR 2970783 B1 FR2970783 B1 FR 2970783B1
Authority
FR
France
Prior art keywords
electronic equipment
control device
predictive monitoring
predictive
monitoring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1100233A
Other languages
English (en)
Other versions
FR2970783A1 (fr
Inventor
Didier Regis
Marc Gatti
Damien Jugie
Sebastien Thomas
Guillaume Duc
Jean Luc Danger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thales SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thales SA filed Critical Thales SA
Priority to FR1100233A priority Critical patent/FR2970783B1/fr
Priority to US13/358,138 priority patent/US9470734B2/en
Publication of FR2970783A1 publication Critical patent/FR2970783A1/fr
Application granted granted Critical
Publication of FR2970783B1 publication Critical patent/FR2970783B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2817—Environmental-, stress-, or burn-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0892—Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value
FR1100233A 2011-01-26 2011-01-26 Procede de controle predictif du fonctionnement d'un equipement electronique, equipement electronique et dispositif de controle Active FR2970783B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR1100233A FR2970783B1 (fr) 2011-01-26 2011-01-26 Procede de controle predictif du fonctionnement d'un equipement electronique, equipement electronique et dispositif de controle
US13/358,138 US9470734B2 (en) 2011-01-26 2012-01-25 Method for predictively controlling the operation of an electronic component, electronic equipment and control device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1100233A FR2970783B1 (fr) 2011-01-26 2011-01-26 Procede de controle predictif du fonctionnement d'un equipement electronique, equipement electronique et dispositif de controle

Publications (2)

Publication Number Publication Date
FR2970783A1 FR2970783A1 (fr) 2012-07-27
FR2970783B1 true FR2970783B1 (fr) 2014-04-11

Family

ID=44785885

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1100233A Active FR2970783B1 (fr) 2011-01-26 2011-01-26 Procede de controle predictif du fonctionnement d'un equipement electronique, equipement electronique et dispositif de controle

Country Status (2)

Country Link
US (1) US9470734B2 (fr)
FR (1) FR2970783B1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150066415A1 (en) * 2013-05-10 2015-03-05 United States Of America As Represented By The Secretary Of The Navy Apparatus and Method for Measuring Microelectronic Electromagnetic Emissions to Detect Characteristics
US10107855B1 (en) * 2014-11-07 2018-10-23 Xilinx, Inc. Electromagnetic verification of integrated circuits

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4815077A (en) * 1987-01-28 1989-03-21 Westinghouse Electric Corp. Test system for electronic devices with radio frequency signature extraction means
US5684523A (en) * 1990-11-15 1997-11-04 Ricoh Company, Ltd. Optical line printhead and an LED chip used therefor
US6160517A (en) * 1998-01-20 2000-12-12 Dell Usa, Llp Method and apparatus for testing electronic systems using electromagnetic emissions profiles
AU2001281101A1 (en) * 2000-08-03 2002-02-18 Qualcomm Incorporated System, method, and apparatus for electromagnetic compatibility-driven product design
CA2522396A1 (fr) * 2003-04-25 2004-11-11 Visioneered Image Systems, Inc. Affichage/source d'eclairage a del ayant la capacite de surveiller la luminosite des del individuelles, et procede de calibrage
KR100882679B1 (ko) * 2007-09-14 2009-02-06 삼성모바일디스플레이주식회사 발광표시장치 및 그의 제조방법
US8242793B2 (en) * 2009-03-17 2012-08-14 International Business Machines Corporation Electromagnetic profiling to validate electronic device authenticity
EP2334144A1 (fr) * 2009-09-07 2011-06-15 Nxp B.V. Test de DEL

Also Published As

Publication number Publication date
FR2970783A1 (fr) 2012-07-27
US9470734B2 (en) 2016-10-18
US20120215473A1 (en) 2012-08-23

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