FR2969302B1 - Procede et dispositif de test pour un dispositif de protection contre les tensions transitoires - Google Patents

Procede et dispositif de test pour un dispositif de protection contre les tensions transitoires

Info

Publication number
FR2969302B1
FR2969302B1 FR1161732A FR1161732A FR2969302B1 FR 2969302 B1 FR2969302 B1 FR 2969302B1 FR 1161732 A FR1161732 A FR 1161732A FR 1161732 A FR1161732 A FR 1161732A FR 2969302 B1 FR2969302 B1 FR 2969302B1
Authority
FR
France
Prior art keywords
testing
protection against
transient voltages
against transient
voltages
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1161732A
Other languages
English (en)
Other versions
FR2969302A1 (fr
Inventor
Peter Michael Tyler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GE Aviation Systems Ltd
Original Assignee
GE Aviation Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GE Aviation Systems Ltd filed Critical GE Aviation Systems Ltd
Publication of FR2969302A1 publication Critical patent/FR2969302A1/fr
Application granted granted Critical
Publication of FR2969302B1 publication Critical patent/FR2969302B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/005—Testing of electric installations on transport means
    • G01R31/008—Testing of electric installations on transport means on air- or spacecraft, railway rolling stock or sea-going vessels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Protection Of Static Devices (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
FR1161732A 2010-12-17 2011-12-15 Procede et dispositif de test pour un dispositif de protection contre les tensions transitoires Active FR2969302B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB1021430.2A GB2486488A (en) 2010-12-17 2010-12-17 Testing a transient voltage protection device
GB1120802.2A GB2486536B (en) 2010-12-17 2011-12-05 Testing of a transient voltage protection device

Publications (2)

Publication Number Publication Date
FR2969302A1 FR2969302A1 (fr) 2012-06-22
FR2969302B1 true FR2969302B1 (fr) 2014-08-29

Family

ID=43598554

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1161732A Active FR2969302B1 (fr) 2010-12-17 2011-12-15 Procede et dispositif de test pour un dispositif de protection contre les tensions transitoires

Country Status (8)

Country Link
US (1) US9411016B2 (fr)
JP (1) JP5903261B2 (fr)
CN (1) CN102608445B (fr)
BR (1) BRPI1105399A2 (fr)
CA (1) CA2762329C (fr)
DE (1) DE102011056547A1 (fr)
FR (1) FR2969302B1 (fr)
GB (2) GB2486488A (fr)

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US10250033B2 (en) * 2015-12-01 2019-04-02 Hamilton Sundstrand Corporation Transient voltage suppressor having built-in-test capability for solid state power controllers
CN105932648A (zh) * 2016-05-20 2016-09-07 上海电机学院 一种用于直流配电系统的负载安全保护装置
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US10401420B2 (en) * 2017-12-08 2019-09-03 Hamilton Sundstrand Corporation Voltage suppressor test circuit and method of testing a voltage suppressor
FR3075391B1 (fr) * 2017-12-18 2020-07-17 Safran Electronics & Defense Circuit de surveillance d'un composant de protection contre la foudre
CN108732490B (zh) * 2018-08-31 2024-02-23 成都天箭科技股份有限公司 微波固态功率放大器全自动无人老炼试验和寿命试验系统
CN112134453B (zh) 2020-09-08 2021-10-29 台达电子企业管理（上海）有限公司 启动控制方法及系统、尖峰电压检测电路及方法
DE102021118817B3 (de) 2021-07-21 2022-11-17 Lisa Dräxlmaier GmbH Verfahren zum überwachen eines schaltbaren halbleiterbauelements und überwachungsvorrichtung für ein halbleiterbauelement

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Also Published As

Publication number Publication date
GB2486536B (en) 2015-12-16
CN102608445A (zh) 2012-07-25
GB201021430D0 (en) 2011-02-02
GB2486536A (en) 2012-06-20
JP5903261B2 (ja) 2016-04-13
US9411016B2 (en) 2016-08-09
BRPI1105399A2 (pt) 2014-01-14
GB2486488A (en) 2012-06-20
JP2012137486A (ja) 2012-07-19
CA2762329C (fr) 2018-11-06
DE102011056547A1 (de) 2012-06-21
FR2969302A1 (fr) 2012-06-22
CA2762329A1 (fr) 2012-06-17
GB201120802D0 (en) 2012-01-11
US20120153963A1 (en) 2012-06-21
CN102608445B (zh) 2016-01-06

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