FR2935068B1 - Procede de preparation d'un substrat en zno en partie ou en totalite semi-isolant ou dope de type p, substrats obtenus, et dispositifs electroniques, electrooptiques ou optoelectroniques les comprenant - Google Patents

Procede de preparation d'un substrat en zno en partie ou en totalite semi-isolant ou dope de type p, substrats obtenus, et dispositifs electroniques, electrooptiques ou optoelectroniques les comprenant

Info

Publication number
FR2935068B1
FR2935068B1 FR0855598A FR0855598A FR2935068B1 FR 2935068 B1 FR2935068 B1 FR 2935068B1 FR 0855598 A FR0855598 A FR 0855598A FR 0855598 A FR0855598 A FR 0855598A FR 2935068 B1 FR2935068 B1 FR 2935068B1
Authority
FR
France
Prior art keywords
substrate
electrooptic
insulating
preparing
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0855598A
Other languages
English (en)
Other versions
FR2935068A1 (fr
Inventor
Maurice Couchaud
Celine Chevalier
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR0855598A priority Critical patent/FR2935068B1/fr
Priority to US12/536,897 priority patent/US8216926B2/en
Priority to EP09167651.0A priority patent/EP2154712B1/fr
Priority to JP2009187811A priority patent/JP2010042989A/ja
Publication of FR2935068A1 publication Critical patent/FR2935068A1/fr
Application granted granted Critical
Publication of FR2935068B1 publication Critical patent/FR2935068B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/16Oxides
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B31/00Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
    • C30B31/04Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor by contacting with diffusion materials in the liquid state
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/34Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies not provided for in groups H01L21/0405, H01L21/0445, H01L21/06, H01L21/16 and H01L21/18 with or without impurities, e.g. doping materials
    • H01L21/38Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions
    • H01L21/388Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions using diffusion into or out of a solid from or into a liquid phase, e.g. alloy diffusion processes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/12Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/22Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only AIIBVI compounds
    • H01L29/227Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only AIIBVI compounds further characterised by the doping material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0083Processes for devices with an active region comprising only II-VI compounds

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Materials Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Inorganic Chemistry (AREA)
  • Ceramic Engineering (AREA)
  • Led Devices (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
FR0855598A 2008-08-14 2008-08-14 Procede de preparation d'un substrat en zno en partie ou en totalite semi-isolant ou dope de type p, substrats obtenus, et dispositifs electroniques, electrooptiques ou optoelectroniques les comprenant Expired - Fee Related FR2935068B1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR0855598A FR2935068B1 (fr) 2008-08-14 2008-08-14 Procede de preparation d'un substrat en zno en partie ou en totalite semi-isolant ou dope de type p, substrats obtenus, et dispositifs electroniques, electrooptiques ou optoelectroniques les comprenant
US12/536,897 US8216926B2 (en) 2008-08-14 2009-08-06 Method of producing a partly or completely semi-insulating or p-type doped ZnO substrate, substrates obtained, and electronic, electro-optic or optoelectronic devices comprising them
EP09167651.0A EP2154712B1 (fr) 2008-08-14 2009-08-11 Procédé de préparation d'un substrat en ZnO en partie ou en totalité semi-isolant ou dopé de type P, substrats obtenus, et dispositifs électroniques, électrooptiques ou optoélectroniques les comprenant.
JP2009187811A JP2010042989A (ja) 2008-08-14 2009-08-13 部分的に又は完全に半絶縁性の又はp型ドーピングされたZnO基板を製造する方法、得られた基板、及び、それを備える電子装置、光電子装置または電気光学装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0855598A FR2935068B1 (fr) 2008-08-14 2008-08-14 Procede de preparation d'un substrat en zno en partie ou en totalite semi-isolant ou dope de type p, substrats obtenus, et dispositifs electroniques, electrooptiques ou optoelectroniques les comprenant

Publications (2)

Publication Number Publication Date
FR2935068A1 FR2935068A1 (fr) 2010-02-19
FR2935068B1 true FR2935068B1 (fr) 2011-02-25

Family

ID=40510492

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0855598A Expired - Fee Related FR2935068B1 (fr) 2008-08-14 2008-08-14 Procede de preparation d'un substrat en zno en partie ou en totalite semi-isolant ou dope de type p, substrats obtenus, et dispositifs electroniques, electrooptiques ou optoelectroniques les comprenant

Country Status (4)

Country Link
US (1) US8216926B2 (fr)
EP (1) EP2154712B1 (fr)
JP (1) JP2010042989A (fr)
FR (1) FR2935068B1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20110135293A (ko) * 2010-06-10 2011-12-16 삼성전자주식회사 p형 Zn 산화물 나노 와이어의 제조 방법 및 p형 Zn 산화물을 포함하는 전자 소자
US11268196B2 (en) * 2018-10-31 2022-03-08 Arizona Board Of Regents On Behalf Of Arizona State University Lithium lanthanum zirconate thin films

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2717256B2 (ja) * 1988-03-16 1998-02-18 社団法人生産技術振興協会 半導体結晶
US6936101B2 (en) 2002-06-24 2005-08-30 Cermet, Inc. Semi-insulating bulk zinc oxide single crystal
WO2006009782A2 (fr) * 2004-06-17 2006-01-26 On International, Inc. Semi-conducteurs des groupes ii-vi de type p persistants
US7723154B1 (en) * 2005-10-19 2010-05-25 North Carolina State University Methods of forming zinc oxide based II-VI compound semiconductor layers with shallow acceptor conductivities
JP4212599B2 (ja) * 2006-03-24 2009-01-21 三洋電機株式会社 半導体素子及び半導体素子の製造方法

Also Published As

Publication number Publication date
EP2154712B1 (fr) 2013-07-24
FR2935068A1 (fr) 2010-02-19
US20100200850A1 (en) 2010-08-12
US8216926B2 (en) 2012-07-10
EP2154712A1 (fr) 2010-02-17
JP2010042989A (ja) 2010-02-25

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Effective date: 20160429