FR2839061A1 - Micromechanical component comprising a substrate with an insulating layer and provided with a furrowed zone and a three layer closing zone for the furrowed structure - Google Patents
Micromechanical component comprising a substrate with an insulating layer and provided with a furrowed zone and a three layer closing zone for the furrowed structure Download PDFInfo
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- FR2839061A1 FR2839061A1 FR0305333A FR0305333A FR2839061A1 FR 2839061 A1 FR2839061 A1 FR 2839061A1 FR 0305333 A FR0305333 A FR 0305333A FR 0305333 A FR0305333 A FR 0305333A FR 2839061 A1 FR2839061 A1 FR 2839061A1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00642—Manufacture or treatment of devices or systems in or on a substrate for improving the physical properties of a device
- B81C1/0069—Thermal properties, e.g. improve thermal insulation
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0214—Biosensors; Chemical sensors
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0278—Temperature sensors
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/03—Static structures
- B81B2203/0323—Grooves
- B81B2203/0338—Channels
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- Microelectronics & Electronic Packaging (AREA)
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- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
Description
Domaine de ['invention La presente invention concerne un composantField of the invention The present invention relates to a component
micromecamicromeca
nique comportant un substrat.picnic with a substrate.
L'invention concerne egalement un procede de fabrication The invention also relates to a manufacturing method
s d'un tel composant.s of such a component.
Etat de la technique Bien que la presente invention puisse s'appliquer a des composants micromecaniques et des structures micromecaniques quel conques, en particulier des capteurs et des actionneurs? elle sera decrite 0 dans le cas de son probleme de base rapporte a un capteur chimique en micromecanique realisable selon la technique de la mecanique de surface du silicium comme par e:emple un capteur de qualite d'air Les capteurs de qualite d'air anciens ont ete realises avec une matiere sensible aux gaz sur une ceramique. La matiere sensible aux s gaz change de resistance et/ou de propriete dielectrique suivant la concentration du gaz detecte. Pour avoir une bonne sensibilite il faut chauffer la matiere sensible aux gaz. L'inconvenient est l'utilisation de la ceramique et de ltencombrement relativement important du point de vue State of the art Although the present invention can be applied to micromechanical components and micromechanical structures which conches, in particular sensors and actuators? it will be described 0 in the case of its basic problem related to a chemical sensor in micromechanics achievable according to the technique of the silicon surface mechanics as for example: an air quality sensor The old air quality sensors were made with a gas sensitive material on a ceramic. The gas sensitive material changes resistance and / or dielectric property according to the concentration of the detected gas. To have a good sensitivity it is necessary to heat the gas-sensitive material. The downside is the use of ceramic and relatively large space from the point of view
du chauffage propre a utiliser et du temps de reponse long. clean heating to use and long response time.
Recemment on fabrique des capteurs chimiques reposant sur des effete thermiques, et appliquant des procedes de micromecanique en bloc. Dans ces procedes de micromecanique en bloc on realise par exemple une membrane par un procede de gravure complique a partir du cote arriere. Une telle membrane est necessaire pour assurer ['isolation Recently, chemical sensors based on thermal effects have been manufactured, applying bulk micromechanical methods. In these block micromechanical processes, a membrane is produced for example by a complicated etching process from the rear side. Such a membrane is necessary to ensure insulation.
2s thermique des resistances par fils chauffants sur la face avant du capteur. 2s thermal resistances by heating wires on the front face of the sensor.
La mise en structure de la membrane se fait habituellement par un proce de de gravure par chimie humide a la potasse KOH. Selon ce procede il faut monter la plaquette dans une bote de gravure. Ce procede, avec un procede de face arriere, integre, ou procede de gravure par KOH, est tres The setting up of the membrane is usually done by an etching process by wet chemistry with KOH potash. According to this process, the plate must be mounted in an engraving box. This process, with a back side, integrated process, or KOH etching process, is very
complique et entrane des frais considerables. complicates and entails considerable costs.
But de ['invention La presente invention a pour but de developper un compo sant micromecanique selon un procede de fabrication plus simple et plus economique avec une zone de face avant isolee permettant de recevoir par AIM OF THE INVENTION The aim of the present invention is to develop a micromechanical component according to a simpler and more economical manufacturing process with an isolated front face zone making it possible to receive by
ss exemple une installation de capteur. ss example a sensor installation.
A cet effet, ['invention concerne un composant micromeca nique du type defini ci-dessus, caracterise par une couche d'isolation electrique et/ou thermique prevue dans le substrat et adjacente a la face avant du substrat, une structure en sillons prevue dans la zone dtisolation et ayant un rapport d'aspect superieur a ['unite et une zone de fermeture To this end, the invention relates to a micromechanical component of the type defined above, characterized by a layer of electrical and / or thermal insulation provided in the substrate and adjacent to the front face of the substrate, a grooved structure provided in the insulation zone and having an aspect ratio greater than the unit and a closing zone
prevue sur la zone d'isolation pour fermer la structure en sillons. provided on the insulation zone to close the structure in grooves.
L'invention concerne egalement un procede de fabrication s d'un tel composant, procede caracterise en ce quton forme une structure en sillons sur une surface principale du substrat, comportant des sillons et un nombre correspondent d'entretois es entre le s sillons, on forme une The invention also relates to a method for manufacturing such a component, a method characterized in that it forms a groove structure on a main surface of the substrate, comprising grooves and a corresponding number of spacers between the grooves, form one
zone d'isolation sur la structure resultante adjacente a la surface princi- insulation zone on the resulting structure adjacent to the main surface
pale du substrat et une structure de sillons modifiee et on realise une blade of the substrate and a modified groove structure and a
0 zone de fermeture pour fermer la structure de sillons modifiee. 0 closing zone to close the modified groove structure.
L'objet de la presente invention convient notamment pour la fabrication d'un capteur chimique de detection de CO, NOx ou d'autres gaz. Selon ce procede on realise ['isolation thermique entre les resistances chauffantes et le substrat par une couche dtisolation de face avant realisee selon ['invention. Dans cette realisation decrite a titre d'exemple on obtient un capteur de qualite d'air ayant les avantages suivants: - faible consommation de puissance du fait du bon decouplage thermi que, integration d'un element de capteur sur une puce, o - integration possible d'un circuit sur ltelement capteur, - tres faible encombrement avec une geometric quelconque de la plage d'isolation, - temps de reponse reduit du fait de la masse faible qutil faut mettre en temperature, - exploitation possible par vole capacitive ou resistive, - matiere differente pour la resistance ou ['electrode de chauffage et/ou de mesure, The object of the present invention is particularly suitable for the manufacture of a chemical sensor for detecting CO, NOx or other gases. According to this process, the thermal insulation between the heating resistors and the substrate is carried out by a front face insulation layer produced according to the invention. In this embodiment described by way of example, an air quality sensor is obtained having the following advantages: - low power consumption due to the good thermal decoupling, integration of a sensor element on a chip, o - integration possible of a circuit on the sensor element, - very small footprint with any geometric of the insulation range, - response time reduced due to the low mass that must be brought to temperature, - operation possible by capacitive or resistive flight, - different material for the resistance or the heating and / or measurement electrode,
- plusieurs matieres sensibles aux gaz peuvent s'utiliser sur un substrat. - several materials sensitive to gases can be used on a substrate.
Pour realiser un tel capteur il suffit senlement d'etapes de To make such a sensor, all you need is steps
procede en micromecanique de surface, c'est-a-dire seulement des proce- process in surface micromechanics, that is to say only processes
des de traitement de la face avant. On supprime ainsi des procedes cou- treatment of the front panel. This eliminates common processes
teux de traitement de la face arriere comme par exemple la gravure par tents for treatment of the rear face such as for example etching by
KOH a ['aide d'une bote de gravure pour donner la structure a la mem- KOH using an engraving box to give structure to the mem-
brane. La suppression de l'etape de gravure par KOH de la face arriere brane. The removal of the engraving step by KOH from the rear face
permet egalement une miniaturisation des composants micromecaniques. also allows miniaturization of micromechanical components.
Un autre avantage reside dans l'utilisation de rayures ou de particules sur Another advantage lies in the use of scratches or particles on
la face avant de la plaquette car il n'est plus necessaire de prevoir des pro- the front of the plate because it is no longer necessary to provide
cedes inverses.reverse cedes.
Un autre avantage reside dans le remplacement de la mem- Another advantage lies in the replacement of the mem-
brane necessaire jusqu'alors pour ['isolation par un bloc d'isolation plus brane needed until now for insulation by an insulation block plus
compact. Cela permet d'eviter les ruptures de membrane lorsquton appli- compact. This will prevent ruptured membranes when applied
que la structure de capteur de face avant, par exemple sous la forme d'une pate chimiquement sensible. Enfin, seules quelques etapes de gene- ration de couche et de photolithogravure vent necessaires pour obtenir le than the front face sensor structure, for example in the form of a chemically sensitive paste. Finally, only a few stages of layer generation and photolithography are necessary to obtain the
bloc d'isolation de face avant selon ['invention. front face insulation block according to the invention.
Selon un developpement avantageux, le substrat est en sili- According to an advantageous development, the substrate is made of silicon.
cium et la zone d'isolation en dioxyde de silicium ou en une combinaison o de diode de silicium et de cavites (celles-ci vent mises sous vice ou se cium and the silicon dioxide insulation zone or a combination o of silicon diode and cavities (these are put under vice or
trouvent dans des conditions normales). found under normal conditions).
Suivant une autre caracteristique, la zone de fermeture comprend une premiere couche de dioxyde de silicium et au-dessus de According to another characteristic, the closure zone comprises a first layer of silicon dioxide and above
celle-ci une couche de nitrure de silicium. this one a layer of silicon nitride.
Selon un autre developpement preferential, la couche de nitrure de silicium est integree dans une seconde couche de dioxyde de silicium. According to another preferential development, the layer of silicon nitride is integrated into a second layer of silicon dioxide.
Selon un autre developpement preferential, la zone de fer- According to another preferential development, the iron zone
meture comporte une installation de capteur pour detecter une propriete meture includes a sensor installation to detect a property
electrique d'un milieu prevu a cet endroit. electric of a medium planned at this place.
Selon un autre developpement preferential, la zone de fer- According to another preferential development, the iron zone
meture comporte une installation de chauffage pour chauffer le milieu. meture includes a heating system to heat the environment.
Selon un autre developpement preferential, le composant est un capteur de qualite d'air et le milieu est un milieu sensible aug gaz 2s et ['installation de capteur est une installation de detection de capacite According to another preferential development, the component is an air quality sensor and the medium is a medium sensitive to 2s gas and the sensor installation is a capacity detection installation.
et/ou de detection de resistance.and / or resistance detection.
Dessins La presente invention sera decrite ci-apres de maniere plus detaillee a ['aide d'un exemple de realisation represente schematiquement dans les dessins annexes dans lesquels: Drawings The present invention will be described below in more detail with the aid of an exemplary embodiment shown schematically in the accompanying drawings in which:
- les figures la- lg montrent des etapes de fabrication d'un capteur chi- - Figures la-lg show steps for manufacturing a chi-
mique sous la forme d'un capteur de qualite d'air correspondent a un premier exemple de realisation de ['invention, - la figure 2 est une vue de dessus d'un capteur chimique selon la figure 1. mique in the form of an air quality sensor correspond to a first embodiment of the invention, - Figure 2 is a top view of a chemical sensor according to Figure 1.
Description d'exemples de realisation Description of implementation examples
Dans les figures on utilisera les memes references pour de- In the figures we will use the same references to de-
signer les memes composants ou des composants de meme fonction. sign the same components or components of the same function.
Les figures la-g montrent les etapes de fabrication d'un capteur chimique sous la forme d'un capteur de qualite d'air selon un Figures la-g show the stages of manufacturing a chemical sensor in the form of an air quality sensor according to a
premier mode de realisation de la presente invention. first embodiment of the present invention.
Selon la figure la, la reference 1 designe un substrat en si- According to FIG. 1 a, the reference 1 designates a substrate in
s licium sous la forme d'une plaquette en silicium. Le substrat ntest pas ne- s silicon in the form of a silicon wafer. The substrate is not ne-
cessairement une plaquette en silicium. I1 peut stagir par exemple egalement de la couche superieure d'un substrat a plusieurs couches par a silicon wafer. I1 can for example also form the upper layer of a multi-layer substrate by
exemple d'une plaquette et d'une couche epitaxiale. example of a plate and an epitaxial layer.
A ['aide de pro cedes de photolithogravure hab ituels et d'une Using habitual photolithography pro cedes and a
0 etape de gravure anisotrope, par exemple par une gravure ionique reac- 0 anisotropic etching step, for example by reac ion etching
tive, on realise des sillons 2 dans le substrat 1. Entre les sillons 2 on tive, we make grooves 2 in the substrate 1. Between the grooves 2 we
laisse des cloisons 3 dans la matiere du substrat. Une epaisseur caracte- leaves partitions 3 in the material of the substrate. Characteristic thickness
ristique du substrat est comprise entre 200 m et 600,um; une profon- ristic of the substrate is between 200 m and 600, um; a depth
deur caracteristique des sillons 2 est comprise entre 20,um et 200,um. the characteristic groove 2 is between 20 µm and 200 µm.
Suivant ['application, les sillons 2 peuvent avoir une forme quelconque. On peut choisir par exemple une structure dans laquelle les Depending on the application, the grooves 2 can have any shape. We can choose for example a structure in which the
sillons 3 vent des colonnes subsistent du substrat 1 dans cette zone. grooves 3 wind columns remain from the substrate 1 in this area.
D'autres possibilites vent par exemple des entretoises en forme de cloisons ou des entretoises en forme d'arcs de cercle. De telles etapes de procede Other possibilities are for example spacers in the form of partitions or spacers in the form of arcs of a circle. Such process steps
conduisent a l'etat represente a la figure la. lead to the state represented in FIG.
Selon la figure lb, on oxyde thermiquement la structure re- According to FIG. 1b, the structure re- thermally oxidized
sultante pour former une couche d'oyde isolante 4. Dans ce contexte, ['expression < isolante N signifie une isolation thermique et/ou electrique suivant ['application prevue pour le composant micromecanique. Dans le 2s cas du composant decrit ici, il s'agit d'un capteur chimicLue de sorte que sultante to form an insulating layer of oxide 4. In this context, the expression <insulating N means thermal and / or electrical insulation according to the intended application for the micromechanical component. In the second case of the component described here, it is a chemicLue sensor so that
l'effet d'isolation thermique est prioritaire. the thermal insulation effect has priority.
La largeur des entretoises 300 a la figure la est choisie pour qu'elle puisse etre oxydee completement par oxydation thermique et que les entretoises modifiees 3' soient constituees completement de dioyde de silicium. Les sillons 2 vent transformes en sillons 2' modifies, de largeur plus faible, par oxydation thermique. Dans ce contexte il convient de remarquer que la largeur des sillons 2 peut egalement etre choisie pour qu'ils soient completement fermes par l'etape d'oxydation thermique et qu'il ne subsiste pas de sillons 2', retrecis, comme dans The width of the spacers 300 in FIG. 1a is chosen so that it can be completely oxidized by thermal oxidation and so that the modified spacers 3 ′ are made entirely of silicon dioxide. The 2-channel grooves transformed into modified 2 'grooves, of smaller width, by thermal oxidation. In this context it should be noted that the width of the grooves 2 can also be chosen so that they are completely closed by the thermal oxidation step and that there are no grooves 2 ', shrunk, as in
l'exemple presente ici.the example presented here.
Selon la figure lc, au cours des etapes suivantes du proce- According to FIG. 1c, during the following stages of the process
de, on realise ['isolation par air des sillons modifies 2' en realisant des zo- of, we realize ['air isolation of modified grooves 2' by realizing zo-
nes de fermeture 6, 8, 9 sous la forme d'une succession de couches s couvrant la structure de sillons modifiee 2', 3'. La zone de fermeture est obtenue par le depot d'une premiere couche d'oxyde 6 suivie du depot d'une couche de nitrure 8 couvrant la premiere couche d'orde 6 ainsi que par le depot d'une seconde couche d'oxyde 9 couvrant la couche de nitrure closing nes 6, 8, 9 in the form of a succession of layers s covering the modified groove structure 2 ', 3'. The closing zone is obtained by depositing a first layer of oxide 6 followed by depositing a layer of nitride 8 covering the first layer of edge 6 as well as by depositing a second layer of oxide 9 covering the nitride layer
s de silicium 8.s of silicon 8.
Au cours d'une etape de procede suivante decrite en rela- In a subsequent process step described in relation
tion avec la figure ld, on polit la seconde couche d'oxyde 9 et la couche de nitrure de silicium 8 constitue une couche d'arret de polissage de maniere a obtenir une surface de structure plane. L'oxyde residue! de la seconde tion with FIG. 1d, the second oxide layer 9 is polished and the silicon nitride layer 8 constitutes a polishing stop layer so as to obtain a surface of planar structure. The oxide residue! of the second
io couche de dioxyde de silicium 9 subsiste uniquement dans les creux au- io layer of silicon dioxide 9 remains only in the troughs
dessus des sillons 2'.above the grooves 2 '.
Selon la figure lc, on forme alors sur la structure resultante According to figure lc, we then form on the resulting structure
un capteur chimique sous la forme d'un capteur de qualite d'air, connu. a chemical sensor in the form of a known air quality sensor.
Les elements de capteur, principaux, vent formes de resistances de platine is et comportent des capteurs thermiques 10, une installation de chauffage et une repartition d'electrodes 20. La fabrication de ces elements de The main sensor elements are formed by platinum resistors and include thermal sensors 10, a heating installation and a distribution of electrodes 20. The manufacture of these elements
capteur est connue de maniere generale et ne necessite pas de description sensor is generally known and does not require description
detaillee ici.detailed here.
Dans une etape suivante du procede representee a la figure lf, on depose une nouvelle couche d'oxyde de silicium 16 et on la met en structure. Dans le cas present, cette couche couvre tous les elements de capteur y compris le dispositif a electrodes 20 et protege ces moyens. A cote du dispositif a electrodes 20 il subsiste evidemment egalement les contacts (non representes) des chemins de branchement (qui ne vent pas In a following step of the process represented in FIG. 1f, a new layer of silicon oxide 16 is deposited and it is put into structure. In the present case, this layer covers all the sensor elements including the electrode device 20 and protects these means. Next to the electrode device 20 there are obviously also the contacts (not shown) of the connection paths (which do not wind
non plus representes) des elements de capteur. no longer shown) sensor elements.
Il convient de remarquer que les elements de capteur peu- It should be noted that the sensor elements may
vent etre realises non senlement en platine mais egalement par exemple can be made not only in platinum but also for example
en silicium conducteur. De tels elements de capteur de substrat de sili- made of conductive silicon. Such silicon substrate sensor elements
cium peuvent former en meme temps un fil chauffant, une repartition cium can form a heating wire at the same time, a distribution
d'electrodes et des thermocapteurs.electrodes and thermosensors.
Selon la figure lg on applique alors une pate 30 sensible According to FIG. Lg, a sensitive paste 30 is then applied.
chimiquement sur la structure resultante et on la cult. La pate 30 est ap- chemically on the resulting structure and we cultivate it. The dough 30 is ap-
pliquee notamment par-dessus le dispositif a electrodes 20 et touche la couche de nitrure de silicium 8 ou les restes d'o2gyde de la couche de pliquee in particular over the electrode device 20 and touches the layer of silicon nitride 8 or the o2gid remains of the layer of
3s dioyde de silicium 9 entre les electrodes. 3s silicon dioyde 9 between the electrodes.
Il convient de remarquer que les elements de capteur vent It should be noted that the wind sensor elements
disposes de preference au-dessus des sillons 2' ce qui garantit un decou- preferably arranged above the grooves 2 'which guarantees a cut
plage thermique aussi efficace que possible. Il en resulte notamment que thermal range as efficient as possible. In particular, it follows that
les capteurs thermiques 10 mesurent la temperature de la zone de fer- the thermal sensors 10 measure the temperature of the iron zone
meture, ['installation de chauffage 50 reglant cette temperature et la pate chimiquement sensible 30 est couplee a la repartition en electrodes 20, thermiquement, seulement dans la zone de fermeture et non au niveau du substrat 1. temperature, the heating installation 50 regulating this temperature and the chemically sensitive paste 30 is coupled to the distribution in electrodes 20, thermally, only in the closing zone and not at the level of the substrate 1.
Pour la suite des etapes du procede, notamment la forma- For the rest of the process steps, especially the training
tion des chemins de branchement, etc..., on procede de facOon connue non detaillee ici. Le procede selon ['invention peut etre integre en particulier dans des procedes existants de sorte que par exemple a partir du plan des tion of connection paths, etc ..., we proceed in a known way not detailed here. The process according to the invention can be integrated in particular into existing processes so that, for example, from the plane of the
o elements de capteur on peut utiliser totalement des procedes existants. o sensor elements it is possible to totally use existing methods.
La figure 2 est une vue de dessus d'un capteur chimique Figure 2 is a top view of a chemical sensor
selon la figure 1.according to figure 1.
La figure 2 est une vue de dessus d'une structure de cap teur realisee selon le procede des figures la-lg. Comme cela apparat a la figure 2, les electrodes 20a, 20b de la repartition d'electrodes 20 a une structure de peigne interdigitee dont les branchernents partent vers l'e:xterieur. Les branchements 50a, 50b de ['installation de chauffage 50 vent tires vers l'exterieur par un anneau entourant suivant une forme de meandres la repartition d'electrodes 20. Le contact vers l'exterieur peut se o faire de maniere quelconque. Comme capteur thermique 10 on utilise dans cet exemple deux resistances a platine 10a, 10b, non decrites de Figure 2 is a top view of a sensor structure made according to the method of Figures la-lg. As shown in FIG. 2, the electrodes 20a, 20b of the distribution of electrodes 20 have an interdigitated comb structure, the branching branches of which go towards the outside. The connections 50a, 50b of the heating installation 50 are vented towards the outside by a ring surrounding in a form of meandres the distribution of electrodes 20. The contact to the outside can be done in any way. As thermal sensor 10, in this example, two platinum resistors 10a, 10b are used, not described
maniere detaillee.detailed manner.
Bien que la presente invention ait ete decrite ci-dessus a ['aide d'un exemple de realisation preferential elle ntest pas limitee a cet Although the present invention has been described above using a preferential embodiment, it is not limited to this.
s exemple mais permet de multiples variantes. s example but allows multiple variants.
Dans les exemples ci-dessus, le composant micromecanique selon ['invention est presente suivant des formes simples pour la descrip tion de ses principes de base. Des developpements essentiellement com pliques utilisant les memes principes de base peuvent evidemment s'envisager. Par exemple a la place du changement des caracteristiques dielectriques on peut egalement modifier la resistance electrique du milieu par exemple du milieu sensible au gaz a ['aide d'electrodes de mesure correspondantes. Il est en outre possible de prevoir des milieux differents sur la couche d'isolation, sensibles a des gaz differents. Cela permet de detec In the above examples, the micromechanical component according to the invention is presented in simple forms for the description of its basic principles. Essentially complicated developments using the same basic principles can obviously be envisaged. For example, instead of changing the dielectric characteristics, it is also possible to modify the electrical resistance of the medium, for example of the medium sensitive to gas, by means of corresponding measurement electrodes. It is also possible to provide different media on the insulation layer, sensitive to different gases. This allows detec
ter plusieurs gaz avec le meme element de capteur. ter several gases with the same sensor element.
Enfin, on pout egalement utiliser les matieres de base de micromecanique, quelconques, sans se limiter a un support de silicium donne a titre d'exemple. La zone de fermeture pent egalement avoir d'autres successions de couches, par exemple une autre couche de dioxide de silicium a la place de la couche de nitrure de silicium. Finally, we can also use any basic micromechanical materials, without being limited to a silicon support given by way of example. The closure zone can also have other successions of layers, for example another layer of silicon dioxide in place of the layer of silicon nitride.
NOMENCLATURENOMENCLATURE
1 substrat 2, 2' sillons 3, 3' entretoise/cloison 4 couche d'oaryde thermique 6 couche d'oxyde 8 couche de nitrure lo 9 couche d'oxyde , lea, lob capteur thermique fit chauffant a, 50b branchement du fit chauffant 50 repartition d'electrodes }5 20a, 20b electrodes 16 couche d'oxyde pate sensible chimiquement t' 1 substrate 2, 2 'grooves 3, 3' spacer / partition 4 layer of thermal oaryde 6 layer of oxide 8 layer of nitride lo 9 layer of oxide, lea, lob thermal sensor fit heater to, 50b connection of the heater fit 50 distribution of electrodes} 5 20a, 20b electrodes 16 layer of chemically sensitive paste oxide t '
R EVE N D I CATI O N SR EVE N D I CATI O N S
1 ) Composant micromecanique comportant un substrat (l), caracterise par une couche d'isolation electrique (4) et/ou thermique prevue dans le substrat (l) et adjacente a la face avant du substrat (1), une structure en sillons (2', 3') prevue dans la zone d'isolation (4) et ayant un rapport d'aspect superieur a ['unite, et une zone de fermeture (6, 8, 9) prevue sur la zone d'isolation (4) pour fer 1) Micromechanical component comprising a substrate (l), characterized by an electrical insulation layer (4) and / or thermal provided in the substrate (l) and adjacent to the front face of the substrate (1), a grooved structure ( 2 ', 3') provided in the insulation zone (4) and having an aspect ratio greater than ['unit, and a closing zone (6, 8, 9) provided on the insulation zone (4 ) for iron
mer la structure en sillons (2', 3'). sea structure in grooves (2 ', 3').
2 ) Composant micromecanique selon la revendication l, caracterise en ce que le substrat (1) est en silicium et la zone d'isolation (4) en dioxyde de sili cium. 3 ) Composant micromecanique selon la revendication 2, caracterise en ce que la zone de fermeture (6, 8, 9) comprend une premiere couche de dioxyde de silicium (6) et par-dessus celle-ci une couche de nitrure de silicium ou 2) micromechanical component according to claim l, characterized in that the substrate (1) is made of silicon and the insulation zone (4) is made of silicon dioxide. 3) micromechanical component according to claim 2, characterized in that the closing zone (6, 8, 9) comprises a first layer of silicon dioxide (6) and above this a layer of silicon nitride or
o une couche de dioxyde de silicium (8). o a layer of silicon dioxide (8).
4 ) Composant micromecanique selon la revendication 3, caracterise en ce que la couche de nitrure de silicium ou de dioxyde de silicium (8) est integree 4) micromechanical component according to claim 3, characterized in that the layer of silicon nitride or silicon dioxide (8) is integrated
dans une seconde couche de dioxyde de silicium (9). in a second layer of silicon dioxide (9).
) Composant micromecanique selon l'une des revendications preceden ) Micromechanical component according to one of the preceding claims
tes, caracterise par une installation de capteur (20; 20a, 20b) prevue sur la zone de fermeture (6, 8, 9) pour detecter une propriete electrique d'un milieu (30) prevu a cet endroit. 6 ) Composant micromecanique selon la revendication 5, caracterise par une installation de chauffage (70) prevue sur la zone de fermeture (6, 8, 9) tes, characterized by a sensor installation (20; 20a, 20b) provided on the closure zone (6, 8, 9) to detect an electrical property of a medium (30) provided at this location. 6) micromechanical component according to claim 5, characterized by a heating installation (70) provided on the closing zone (6, 8, 9)
pour chauffer le milieu prevu (30).to heat the medium provided (30).
7 ) Composant micromecanique selon l'une des revendications preceden 7) micromechanical component according to one of the preceding claims
tes 5 ou 6, caracterise en ce que le composant est un capteur de qualite d'air, le milieu 130) est un milieu s sensible aux gaz et ['installation de capteur (20; 20a, 20b) est une instal lation de detection de capacite et/ou une installation de detection de re sistance. 8 ) Procede de fabrication d'un composant micromecanique caracterise o par les etapes suivantes: - on realise un substrat (1), - on forme une structure en sillons (2', 3') sur une surface principale du substrat (1), comportant des sillons (2) et un nombre correspondent d'entretoises (3) entre les sillons, - on forme une zone dtisolation (4) sur la structure resultante adjacente a la surface principale du substrat (1) et une structure de sillons (2', 3') modifiee et - on realise une zone de fermeture (6, 8, 9) pour fermer la structure de tes 5 or 6, characterized in that the component is an air quality sensor, the medium 130) is a gas-sensitive medium and the sensor installation (20; 20a, 20b) is a detection installation capacity and / or a resistance detection installation. 8) Method for manufacturing a micromechanical component characterized by the following steps: - a substrate (1) is produced, - a groove structure (2 ′, 3 ′) is formed on a main surface of the substrate (1), comprising grooves (2) and a corresponding number of spacers (3) between the grooves, - an insulation zone (4) is formed on the resulting structure adjacent to the main surface of the substrate (1) and a groove structure (2 ', 3') modified and - a closing zone (6, 8, 9) is created to close the structure of
sillons modifiee (2', 3').modified grooves (2 ', 3').
9 ) Procede selon la revendication 8, caracterise en ce qu' on forme la zone dtisolation (4) de preference par oxydation thermique de 9) Method according to claim 8, characterized in that the insulation zone (4) is preferably formed by thermal oxidation of
la structure de sillons (2, 3).the groove structure (2, 3).
) Procede selon la revendication 9, caracterise en ce que la structure de sillons (2', 3') modifiee comporte des entretoises (3') ayant ) Method according to claim 9, characterized in that the modified groove structure (2 ', 3') comprises spacers (3 ') having
subi completement une oxydation thermique. completely undergoes thermal oxidation.
11 ) Procede selon la revendication 9 ou 10, caracterise en ce que la structure de sillons modifiee (2', 3') presente des sillons (2') au moins en 11) Method according to claim 9 or 10, characterized in that the modified groove structure (2 ', 3') has grooves (2 ') at least in
partie retrecis.shrunk part.
12 ) Procede selon la revendication 9 ou 10, caracterise en ce que la structure de sillons modifiee (2', 3') comporte des sillons (2') au moins 12) Method according to claim 9 or 10, characterized in that the modified groove structure (2 ', 3') comprises grooves (2 ') at least
completement fermes.completely firm.
13) Procede selon la revendication 9 ou 10, caracterise en ce que la zone de fermeture (6, 8, 9) comprend le depot d'une premiere couche de dioxyde de silicium (6) et d'une couche de nitrure de silicium placee par dessus celle-ci ou d'une couche de dioyde de silicium (8) sur la structure 13) Method according to claim 9 or 10, characterized in that the closure zone (6, 8, 9) comprises the deposition of a first layer of silicon dioxide (6) and a layer of silicon nitride placed over it or a layer of silicon dioyde (8) on the structure
de sillons modifee (2', 3').of modified grooves (2 ', 3').
14 ) Procede selon la revendication 13, caracterise en ce que la couche de nitrure de silicium (8) est aplanie par un depot suivi d'un po 14) Method according to claim 13, characterized in that the silicon nitride layer (8) is planarized by a deposit followed by a po
lissage d'une seconde couche de dioyde de silicium (9). smoothing a second layer of silicon dioyde (9).
) Procede selon l'une quelconque des revendications 1 a 14, ) Method according to any one of claims 1 to 14,
caracterise en ce que la plage de fermeture l6, 8, 9) comporte une installation de capteur (20; a, 20b) pour saisir une propriete electrique d'un milieu (30) prevu sur celui-ci. 16 ) Procede selon la revendication 15, caracterise par une installation de chauffage (70) prevue sur la zone de fermeture (6, 8, 9) characterized in that the closing range 16, 8, 9) comprises a sensor installation (20; a, 20b) for capturing an electrical property of a medium (30) provided thereon. 16) Method according to claim 15, characterized by a heating installation (70) provided on the closing zone (6, 8, 9)
pour chauer le milieu (30) prevu.to heat the medium (30) provided.
17 ) Procede selon l'une des revendications 15 ou 16, 17) Method according to one of claims 15 or 16,
caracterise en ce que le composant est un capteur de qualite d'air, le milieu (30) etant un milieu sensible aux gaz et ['installation de capteur (20; 20a, 20b) est une instal characterized in that the component is an air quality sensor, the medium (30) being a gas-sensitive medium and the sensor installation (20; 20a, 20b) is an installation
lation de saisie de capacite et/ou une installation de saisie de resistance. Capacity input lation and / or resistance input facility.
18 ) Procede selon l'une des revendications 8 a 17, 18) Method according to one of claims 8 to 17,
caracterise en ce que le substrat (1) est en silicium et la zone dtisolation (4) en dioxyde de sili characterized in that the substrate (1) is made of silicon and the insulation zone (4) is made of silicon dioxide
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2002119254 DE10219254B4 (en) | 2002-04-30 | 2002-04-30 | Micromechanical component with an isolation region and corresponding manufacturing method |
Publications (2)
Publication Number | Publication Date |
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FR2839061A1 true FR2839061A1 (en) | 2003-10-31 |
FR2839061B1 FR2839061B1 (en) | 2007-04-06 |
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FR0305333A Expired - Fee Related FR2839061B1 (en) | 2002-04-30 | 2003-04-30 | MICROMECHANICAL COMPONENT WITH INSULATED AREA AND METHOD FOR MANUFACTURING THE SAME |
Country Status (2)
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DE (1) | DE10219254B4 (en) |
FR (1) | FR2839061B1 (en) |
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CH707797A1 (en) * | 2013-03-28 | 2014-09-30 | Silicior Sa | A method of manufacturing a micro-mechanical part substantially flat, and micro-mechanical part comprising at least a portion formed of silicon oxide. |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5578528A (en) * | 1995-05-02 | 1996-11-26 | Industrial Technology Research Institute | Method of fabrication glass diaphragm on silicon macrostructure |
US6096656A (en) * | 1999-06-24 | 2000-08-01 | Sandia Corporation | Formation of microchannels from low-temperature plasma-deposited silicon oxynitride |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01109250A (en) * | 1987-10-22 | 1989-04-26 | Toshiba Corp | Gas sensor |
FR2736205B1 (en) * | 1995-06-30 | 1997-09-19 | Motorola Semiconducteurs | SEMICONDUCTOR SENSOR DEVICE AND ITS FORMING METHOD |
DE19608370A1 (en) * | 1996-03-05 | 1996-07-25 | Josef Dr Lechner | Micro-mechanical channel prodn. with connection to surrounding atmos. |
EP0856825B1 (en) * | 1997-01-31 | 2004-11-17 | STMicroelectronics S.r.l. | Process for manufacturing integrated semiconductor devices comprising a chemoresistive gas microsensor |
-
2002
- 2002-04-30 DE DE2002119254 patent/DE10219254B4/en not_active Expired - Fee Related
-
2003
- 2003-04-30 FR FR0305333A patent/FR2839061B1/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5578528A (en) * | 1995-05-02 | 1996-11-26 | Industrial Technology Research Institute | Method of fabrication glass diaphragm on silicon macrostructure |
US6096656A (en) * | 1999-06-24 | 2000-08-01 | Sandia Corporation | Formation of microchannels from low-temperature plasma-deposited silicon oxynitride |
Non-Patent Citations (1)
Title |
---|
CHAN P C H ET AL: "An integrated gas sensor technology using surface micro-machining", SENSORS AND ACTUATORS B, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, vol. 82, no. 2-3, 28 February 2002 (2002-02-28), pages 277 - 283, XP004343660, ISSN: 0925-4005 * |
Also Published As
Publication number | Publication date |
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DE10219254A1 (en) | 2003-11-13 |
DE10219254B4 (en) | 2011-08-11 |
FR2839061B1 (en) | 2007-04-06 |
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