FR2833704B1 - Methode de test d'un cristal de fluorure en reference a sa purete vis a vis du plomb - Google Patents
Methode de test d'un cristal de fluorure en reference a sa purete vis a vis du plombInfo
- Publication number
- FR2833704B1 FR2833704B1 FR0116097A FR0116097A FR2833704B1 FR 2833704 B1 FR2833704 B1 FR 2833704B1 FR 0116097 A FR0116097 A FR 0116097A FR 0116097 A FR0116097 A FR 0116097A FR 2833704 B1 FR2833704 B1 FR 2833704B1
- Authority
- FR
- France
- Prior art keywords
- purity
- testing
- lead
- respect
- fluoride crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 title 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/02—Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of crystals, e.g. rock-salt, semi-conductors
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B11/00—Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/12—Halides
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Metallurgy (AREA)
- Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Organic Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- Optics & Photonics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Inorganic Chemistry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0116097A FR2833704B1 (fr) | 2001-12-13 | 2001-12-13 | Methode de test d'un cristal de fluorure en reference a sa purete vis a vis du plomb |
PCT/US2002/037147 WO2003052392A1 (fr) | 2001-12-13 | 2002-11-19 | ELEMENTS DE CRISTAUX DE FLUORURE OPTIQUES UV POUR UNE LITHOGRAPHIE LASER λ<200NM ET PROCEDES ASSOCIES |
DE10297547T DE10297547T5 (de) | 2001-12-13 | 2002-11-19 | UV-optische Fluoridkristallelemente zur Laserlithografie mit λ<200nm und Verfahren derselben |
AU2002352798A AU2002352798A1 (en) | 2001-12-13 | 2002-11-19 | UV OPTICAL FLUORIDE CRYSTAL ELEMENTS FOR LamdaLESS THAN200NM LASER LITHOGRAPHY AND METHODS THEREFORE |
DE20221705U DE20221705U1 (de) | 2001-12-13 | 2002-11-19 | UV-optische Fluoridkristallelemente zur Laserlithografie mit Lambda < 200 nm |
JP2003553232A JP2005524055A (ja) | 2001-12-13 | 2002-11-19 | λ<200nmレーザリソグラフィ用UV光学フッ化物結晶素子並びにその作成及び検査方法 |
US10/317,789 US6894284B2 (en) | 2001-12-13 | 2002-12-11 | UV optical fluoride crystal elements for λ < 200nm laser lithography and methods therefor |
TW091136639A TW200305715A (en) | 2001-12-13 | 2002-12-13 | UV optical fluoride crystal elements for λ < 200nm laser lithography and methods therefor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0116097A FR2833704B1 (fr) | 2001-12-13 | 2001-12-13 | Methode de test d'un cristal de fluorure en reference a sa purete vis a vis du plomb |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2833704A1 FR2833704A1 (fr) | 2003-06-20 |
FR2833704B1 true FR2833704B1 (fr) | 2004-03-12 |
Family
ID=8870421
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0116097A Expired - Fee Related FR2833704B1 (fr) | 2001-12-13 | 2001-12-13 | Methode de test d'un cristal de fluorure en reference a sa purete vis a vis du plomb |
Country Status (2)
Country | Link |
---|---|
FR (1) | FR2833704B1 (fr) |
TW (1) | TW200305715A (fr) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3337638B2 (ja) * | 1997-03-31 | 2002-10-21 | キヤノン株式会社 | フッ化物結晶の製造方法及び光学部品の製造方法 |
JP3631063B2 (ja) * | 1998-10-21 | 2005-03-23 | キヤノン株式会社 | フッ化物の精製方法及びフッ化物結晶の製造方法 |
-
2001
- 2001-12-13 FR FR0116097A patent/FR2833704B1/fr not_active Expired - Fee Related
-
2002
- 2002-12-13 TW TW091136639A patent/TW200305715A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
FR2833704A1 (fr) | 2003-06-20 |
TW200305715A (en) | 2003-11-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
TP | Transmission of property | ||
TP | Transmission of property | ||
ST | Notification of lapse |
Effective date: 20130830 |