FR2821206B1 - Procede de fonctionnement d'une machine d'analyse optique de galettes a microstructures, machine adaptee - Google Patents

Procede de fonctionnement d'une machine d'analyse optique de galettes a microstructures, machine adaptee

Info

Publication number
FR2821206B1
FR2821206B1 FR0102184A FR0102184A FR2821206B1 FR 2821206 B1 FR2821206 B1 FR 2821206B1 FR 0102184 A FR0102184 A FR 0102184A FR 0102184 A FR0102184 A FR 0102184A FR 2821206 B1 FR2821206 B1 FR 2821206B1
Authority
FR
France
Prior art keywords
machine
microstructure
wafers
operating method
optical analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0102184A
Other languages
English (en)
Other versions
FR2821206A1 (fr
Inventor
Ramdane Benferhat
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Jobin Yvon SAS
Original Assignee
Horiba Jobin Yvon SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Jobin Yvon SAS filed Critical Horiba Jobin Yvon SAS
Priority to FR0102184A priority Critical patent/FR2821206B1/fr
Priority to PCT/FR2002/000603 priority patent/WO2002067296A1/fr
Publication of FR2821206A1 publication Critical patent/FR2821206A1/fr
Application granted granted Critical
Publication of FR2821206B1 publication Critical patent/FR2821206B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67745—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67253—Process monitoring, e.g. flow or thickness monitoring

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
FR0102184A 2001-02-16 2001-02-16 Procede de fonctionnement d'une machine d'analyse optique de galettes a microstructures, machine adaptee Expired - Fee Related FR2821206B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR0102184A FR2821206B1 (fr) 2001-02-16 2001-02-16 Procede de fonctionnement d'une machine d'analyse optique de galettes a microstructures, machine adaptee
PCT/FR2002/000603 WO2002067296A1 (fr) 2001-02-16 2002-02-15 Procede de fonctionnement d'une machine d'analyse optique de galettes a microstructures, machine adaptee

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0102184A FR2821206B1 (fr) 2001-02-16 2001-02-16 Procede de fonctionnement d'une machine d'analyse optique de galettes a microstructures, machine adaptee

Publications (2)

Publication Number Publication Date
FR2821206A1 FR2821206A1 (fr) 2002-08-23
FR2821206B1 true FR2821206B1 (fr) 2003-09-19

Family

ID=8860145

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0102184A Expired - Fee Related FR2821206B1 (fr) 2001-02-16 2001-02-16 Procede de fonctionnement d'une machine d'analyse optique de galettes a microstructures, machine adaptee

Country Status (2)

Country Link
FR (1) FR2821206B1 (fr)
WO (1) WO2002067296A1 (fr)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6278828A (ja) * 1985-10-01 1987-04-11 Dainippon Screen Mfg Co Ltd 表面処理方法およびその装置
US5766360A (en) * 1992-03-27 1998-06-16 Kabushiki Kaisha Toshiba Substrate processing apparatus and substrate processing method
US6208751B1 (en) * 1998-03-24 2001-03-27 Applied Materials, Inc. Cluster tool

Also Published As

Publication number Publication date
FR2821206A1 (fr) 2002-08-23
WO2002067296A1 (fr) 2002-08-29

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20121031