FR2816155B1 - Procede et dispositif de qualification de detecteurs d'image en fonction de leurs mauvais pixels - Google Patents
Procede et dispositif de qualification de detecteurs d'image en fonction de leurs mauvais pixelsInfo
- Publication number
- FR2816155B1 FR2816155B1 FR0013970A FR0013970A FR2816155B1 FR 2816155 B1 FR2816155 B1 FR 2816155B1 FR 0013970 A FR0013970 A FR 0013970A FR 0013970 A FR0013970 A FR 0013970A FR 2816155 B1 FR2816155 B1 FR 2816155B1
- Authority
- FR
- France
- Prior art keywords
- image detectors
- detectors according
- bad pixels
- qualifying
- qualifying image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/32—Transforming X-rays
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0013970A FR2816155B1 (fr) | 2000-10-31 | 2000-10-31 | Procede et dispositif de qualification de detecteurs d'image en fonction de leurs mauvais pixels |
US10/000,156 US7116811B2 (en) | 2000-10-31 | 2001-10-30 | Method and apparatus for qualification of image detectors |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0013970A FR2816155B1 (fr) | 2000-10-31 | 2000-10-31 | Procede et dispositif de qualification de detecteurs d'image en fonction de leurs mauvais pixels |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2816155A1 FR2816155A1 (fr) | 2002-05-03 |
FR2816155B1 true FR2816155B1 (fr) | 2003-04-04 |
Family
ID=8855932
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0013970A Expired - Fee Related FR2816155B1 (fr) | 2000-10-31 | 2000-10-31 | Procede et dispositif de qualification de detecteurs d'image en fonction de leurs mauvais pixels |
Country Status (2)
Country | Link |
---|---|
US (1) | US7116811B2 (fr) |
FR (1) | FR2816155B1 (fr) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3824927B2 (ja) * | 2001-06-22 | 2006-09-20 | 株式会社リコー | 読取装置、画像形成装置、通信装置および異常画素データ取得方法 |
US6919568B2 (en) * | 2003-04-08 | 2005-07-19 | Ge Medical Systems Global Technology Company Llc | Method and apparatus for identifying composite defective pixel map |
EP2132726A4 (fr) * | 2007-01-16 | 2011-01-12 | Bae Systems Information | Substitution de pixels en temps réel pour systèmes d'imagerie thermique |
DE102007013620A1 (de) * | 2007-03-21 | 2008-09-25 | Siemens Ag | Vorrichtung und Verfahren zur Überwachung von Festkörperdetektoren |
US8768032B2 (en) * | 2012-07-06 | 2014-07-01 | Morpho Detection, Llc | Method for correction of artifacts from edge detectors in compact geometry CT |
US9417340B2 (en) | 2012-07-06 | 2016-08-16 | Morpho Detection, Llc | Compact geometry CT system |
US9753224B2 (en) * | 2015-03-25 | 2017-09-05 | The Board Of Trustees Of The Leland Stanford Junior University | Field-programmable optical component |
KR20220138498A (ko) * | 2021-04-02 | 2022-10-13 | 삼성디스플레이 주식회사 | 표시 패널 및 이를 구비하는 표시 장치 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5339092A (en) * | 1989-11-06 | 1994-08-16 | Honeywell Inc | Beam former for matrix display |
US5361307A (en) * | 1993-03-25 | 1994-11-01 | General Electric Company | Correlation methods of identifying defects in imaging devices |
US5657400A (en) * | 1995-01-31 | 1997-08-12 | General Electric Company | Automatic identification and correction of bad pixels in a large area solid state x-ray detector |
US5854655A (en) * | 1995-08-29 | 1998-12-29 | Sanyo Electric Co., Ltd. | Defective pixel detecting circuit of a solid state image pick-up device capable of detecting defective pixels with low power consumption and high precision, and image pick-up device having such detecting circuit |
JP3819511B2 (ja) * | 1997-02-13 | 2006-09-13 | 富士写真フイルム株式会社 | Ccd撮像デバイスにおけるモニタ方法およびディジタルスチルカメラ |
US5847823A (en) * | 1997-04-28 | 1998-12-08 | International Business Machines Corporation | Surface inspection tool |
US6293465B1 (en) * | 1998-02-27 | 2001-09-25 | Intel Corporation | CMOS imaging device with integrated identification circuitry |
US6219443B1 (en) * | 1998-08-11 | 2001-04-17 | Agilent Technologies, Inc. | Method and apparatus for inspecting a display using a relatively low-resolution camera |
US6593961B1 (en) * | 1998-10-30 | 2003-07-15 | Agilent Technologies, Inc. | Test efficient method of classifying image quality of an optical sensor using three categories of pixels |
US6381357B1 (en) * | 1999-02-26 | 2002-04-30 | Intel Corporation | Hi-speed deterministic approach in detecting defective pixels within an image sensor |
US6819358B1 (en) * | 1999-04-26 | 2004-11-16 | Microsoft Corporation | Error calibration for digital image sensors and apparatus using the same |
US6795118B1 (en) * | 2000-10-18 | 2004-09-21 | Micron Technology, Inc. | Testing of solid-state image sensors |
-
2000
- 2000-10-31 FR FR0013970A patent/FR2816155B1/fr not_active Expired - Fee Related
-
2001
- 2001-10-30 US US10/000,156 patent/US7116811B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
FR2816155A1 (fr) | 2002-05-03 |
US7116811B2 (en) | 2006-10-03 |
US20020149684A1 (en) | 2002-10-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20100630 |