FR2792065B1 - INSTALLATION AND METHOD FOR OBSERVING TWO IDENTICAL SPECIMENS - Google Patents
INSTALLATION AND METHOD FOR OBSERVING TWO IDENTICAL SPECIMENSInfo
- Publication number
- FR2792065B1 FR2792065B1 FR9904485A FR9904485A FR2792065B1 FR 2792065 B1 FR2792065 B1 FR 2792065B1 FR 9904485 A FR9904485 A FR 9904485A FR 9904485 A FR9904485 A FR 9904485A FR 2792065 B1 FR2792065 B1 FR 2792065B1
- Authority
- FR
- France
- Prior art keywords
- observing
- installation
- identical specimens
- specimens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical or photographic arrangements associated with the tube
- H01J37/226—Optical arrangements for illuminating the object; optical arrangements for collecting light from the object
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9904485A FR2792065B1 (en) | 1999-04-09 | 1999-04-09 | INSTALLATION AND METHOD FOR OBSERVING TWO IDENTICAL SPECIMENS |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9904485A FR2792065B1 (en) | 1999-04-09 | 1999-04-09 | INSTALLATION AND METHOD FOR OBSERVING TWO IDENTICAL SPECIMENS |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2792065A1 FR2792065A1 (en) | 2000-10-13 |
FR2792065B1 true FR2792065B1 (en) | 2001-07-13 |
Family
ID=9544245
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9904485A Expired - Fee Related FR2792065B1 (en) | 1999-04-09 | 1999-04-09 | INSTALLATION AND METHOD FOR OBSERVING TWO IDENTICAL SPECIMENS |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR2792065B1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2896061B1 (en) * | 2012-09-14 | 2023-06-28 | Delmic Ip B.V. | Integrated optical and charged particle inspection apparatus |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW208757B (en) * | 1992-01-09 | 1993-07-01 | Samsung Electronics Co Ltd | |
JP3141732B2 (en) * | 1995-07-05 | 2001-03-05 | 株式会社日立製作所 | Charged particle beam equipment |
-
1999
- 1999-04-09 FR FR9904485A patent/FR2792065B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
FR2792065A1 (en) | 2000-10-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20141231 |