GB9804799D0 - Nanotribological probe microscope - Google Patents

Nanotribological probe microscope

Info

Publication number
GB9804799D0
GB9804799D0 GBGB9804799.6A GB9804799A GB9804799D0 GB 9804799 D0 GB9804799 D0 GB 9804799D0 GB 9804799 A GB9804799 A GB 9804799A GB 9804799 D0 GB9804799 D0 GB 9804799D0
Authority
GB
United Kingdom
Prior art keywords
nanotribological
probe microscope
microscope
probe
nanotribological probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB9804799.6A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coventry University
Original Assignee
Coventry University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Coventry University filed Critical Coventry University
Priority to GBGB9804799.6A priority Critical patent/GB9804799D0/en
Publication of GB9804799D0 publication Critical patent/GB9804799D0/en
Priority to AU32669/99A priority patent/AU3266999A/en
Priority to PCT/GB1999/000673 priority patent/WO1999045361A1/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/40—Investigating hardness or rebound hardness
    • G01N3/42—Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N19/00—Investigating materials by mechanical methods
    • G01N19/02—Measuring coefficient of friction between materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/26—Friction force microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/36—DC mode
    • G01Q60/366—Nanoindenters, i.e. wherein the indenting force is measured
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0286—Miniature specimen; Testing on microregions of a specimen

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Automation & Control Theory (AREA)
  • Nanotechnology (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
GBGB9804799.6A 1998-03-07 1998-03-07 Nanotribological probe microscope Ceased GB9804799D0 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
GBGB9804799.6A GB9804799D0 (en) 1998-03-07 1998-03-07 Nanotribological probe microscope
AU32669/99A AU3266999A (en) 1998-03-07 1999-03-08 Nanotribological probe microscope
PCT/GB1999/000673 WO1999045361A1 (en) 1998-03-07 1999-03-08 Nanotribological probe microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB9804799.6A GB9804799D0 (en) 1998-03-07 1998-03-07 Nanotribological probe microscope

Publications (1)

Publication Number Publication Date
GB9804799D0 true GB9804799D0 (en) 1998-04-29

Family

ID=10828115

Family Applications (1)

Application Number Title Priority Date Filing Date
GBGB9804799.6A Ceased GB9804799D0 (en) 1998-03-07 1998-03-07 Nanotribological probe microscope

Country Status (3)

Country Link
AU (1) AU3266999A (en)
GB (1) GB9804799D0 (en)
WO (1) WO1999045361A1 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1237161B1 (en) * 2001-02-28 2014-05-14 Imec Method and apparatus for performing atomic force microscopy measurements
CN100362334C (en) * 2004-06-30 2008-01-16 南京大学 Ultramicroscopic penetrometer
EP1844311A2 (en) * 2005-02-03 2007-10-17 Sela Semiconductor Engineering Laboratories Ltd. Sample preparation for micro-analysis
KR100869046B1 (en) 2007-02-09 2008-11-18 한국기계연구원 Afm probe
EP2310830B1 (en) 2008-07-03 2012-12-05 Hysitron Incorporated Micromachined comb drive for quantitative nanoindentation
US9335240B2 (en) 2008-07-03 2016-05-10 Hysitron Incorporated Method of measuring an interaction force
DE102011111238B4 (en) * 2011-08-19 2013-05-02 Technische Universität Ilmenau Method and device for presetting force-displacement curves
CN102426134A (en) * 2011-11-23 2012-04-25 中国矿业大学 Electronic control friction method and electronic control friction device for micro-nano textured surface
WO2014085630A1 (en) * 2012-11-28 2014-06-05 Hysitron Incorporated Micromachined comb drive for quantitative nanoindentation
CN103308404B (en) * 2013-06-14 2015-04-08 吉林大学 In-situ nano-indentation tester based on adjustable stretching-bending preload
US10761625B2 (en) 2017-10-31 2020-09-01 Microsoft Technology Licensing, Llc Stylus for operation with a digitizer
CN109633211B (en) * 2019-01-22 2021-06-22 湘潭大学 Method for representing anisotropy of ultimate shear stress of two-dimensional material

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5308974B1 (en) * 1992-11-30 1998-01-06 Digital Instr Inc Scanning probe microscope using stored data for vertical probe positioning
US5553486A (en) * 1993-10-01 1996-09-10 Hysitron Incorporated Apparatus for microindentation hardness testing and surface imaging incorporating a multi-plate capacitor system
AU3152795A (en) * 1994-07-28 1996-02-22 Victor B. Kley Scanning probe microscope assembly

Also Published As

Publication number Publication date
AU3266999A (en) 1999-09-20
WO1999045361A1 (en) 1999-09-10

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)