FR2789005B1 - PHYSICAL-CHEMICAL POLISHING PAD, POLISHING DEVICE USING SUCH A PAD AND METHOD FOR FORMING INSULATION IN A SUBSTRATE - Google Patents

PHYSICAL-CHEMICAL POLISHING PAD, POLISHING DEVICE USING SUCH A PAD AND METHOD FOR FORMING INSULATION IN A SUBSTRATE

Info

Publication number
FR2789005B1
FR2789005B1 FR9901230A FR9901230A FR2789005B1 FR 2789005 B1 FR2789005 B1 FR 2789005B1 FR 9901230 A FR9901230 A FR 9901230A FR 9901230 A FR9901230 A FR 9901230A FR 2789005 B1 FR2789005 B1 FR 2789005B1
Authority
FR
France
Prior art keywords
pad
polishing
physical
substrate
polishing pad
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9901230A
Other languages
French (fr)
Other versions
FR2789005A1 (en
Inventor
Hsueh Chung Chen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
United Microelectronics Corp
Original Assignee
United Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to GB9900721A priority Critical patent/GB2345657B/en
Priority to DE19902804A priority patent/DE19902804A1/en
Application filed by United Microelectronics Corp filed Critical United Microelectronics Corp
Priority to FR9901230A priority patent/FR2789005B1/en
Priority to JP11028922A priority patent/JP2000225558A/en
Publication of FR2789005A1 publication Critical patent/FR2789005A1/en
Application granted granted Critical
Publication of FR2789005B1 publication Critical patent/FR2789005B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/22Lapping pads for working plane surfaces characterised by a multi-layered structure
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D3/00Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
    • B24D3/34Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents characterised by additives enhancing special physical properties, e.g. wear resistance, electric conductivity, self-cleaning properties

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

The polishing pad has a main body (21) and a colored indicating structure (22) a certain distance under the surface (25). While performing chemical mechanical polishing, a slurry is supplied onto the polishing pad to react with the water to be polished. As the polishing pad is consumed until, when reaching the colored indicating structure, a different color appears on the pad to indicate the consumption level. The color can be further changed with consumption to show the lifetime of the pad. Thus the quality of products being polished is very much enhanced, and the fabrication cost is reduced since the risk of polishing wafers by a worn out pad is prevented.
FR9901230A 1999-01-13 1999-02-03 PHYSICAL-CHEMICAL POLISHING PAD, POLISHING DEVICE USING SUCH A PAD AND METHOD FOR FORMING INSULATION IN A SUBSTRATE Expired - Fee Related FR2789005B1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
GB9900721A GB2345657B (en) 1999-01-13 1999-01-13 Lifetime self-indicated polishing pad
DE19902804A DE19902804A1 (en) 1999-01-13 1999-01-25 Lifetime self-indicate polishing pad for chemical mechanical polisher comprises a pad with body having multicolored indicate layers with a top surface
FR9901230A FR2789005B1 (en) 1999-01-13 1999-02-03 PHYSICAL-CHEMICAL POLISHING PAD, POLISHING DEVICE USING SUCH A PAD AND METHOD FOR FORMING INSULATION IN A SUBSTRATE
JP11028922A JP2000225558A (en) 1999-01-13 1999-02-05 Polishing pad indicating durable period limit

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
GB9900721A GB2345657B (en) 1999-01-13 1999-01-13 Lifetime self-indicated polishing pad
DE19902804A DE19902804A1 (en) 1999-01-13 1999-01-25 Lifetime self-indicate polishing pad for chemical mechanical polisher comprises a pad with body having multicolored indicate layers with a top surface
FR9901230A FR2789005B1 (en) 1999-01-13 1999-02-03 PHYSICAL-CHEMICAL POLISHING PAD, POLISHING DEVICE USING SUCH A PAD AND METHOD FOR FORMING INSULATION IN A SUBSTRATE
JP11028922A JP2000225558A (en) 1999-01-13 1999-02-05 Polishing pad indicating durable period limit

Publications (2)

Publication Number Publication Date
FR2789005A1 FR2789005A1 (en) 2000-08-04
FR2789005B1 true FR2789005B1 (en) 2001-03-30

Family

ID=27438914

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9901230A Expired - Fee Related FR2789005B1 (en) 1999-01-13 1999-02-03 PHYSICAL-CHEMICAL POLISHING PAD, POLISHING DEVICE USING SUCH A PAD AND METHOD FOR FORMING INSULATION IN A SUBSTRATE

Country Status (4)

Country Link
JP (1) JP2000225558A (en)
DE (1) DE19902804A1 (en)
FR (1) FR2789005B1 (en)
GB (1) GB2345657B (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020077037A1 (en) * 1999-05-03 2002-06-20 Tietz James V. Fixed abrasive articles
JP2002239922A (en) * 2001-02-07 2002-08-28 Dainippon Printing Co Ltd Abrasive film
JP4041107B2 (en) 2004-09-22 2008-01-30 株式会社東芝 Polishing method
US8118644B2 (en) * 2008-10-16 2012-02-21 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing pad having integral identification feature
CN107344328B (en) * 2016-05-06 2020-03-10 中芯国际集成电路制造(上海)有限公司 Polishing pad, forming method thereof and polishing monitoring method
JP6822518B2 (en) * 2019-05-14 2021-01-27 株式会社Sumco Polishing pad management method and polishing pad management system

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4424203C2 (en) * 1994-07-09 1996-05-09 Wernicke & Co Gmbh Grinding wheel for grinding the edge of spectacle lenses
US5579717A (en) * 1994-10-13 1996-12-03 International Business Machines Corporation Method of grinding thin-film magnetic heads using optical grinding markers
US5733176A (en) * 1996-05-24 1998-03-31 Micron Technology, Inc. Polishing pad and method of use
JPH10100062A (en) * 1996-09-26 1998-04-21 Toshiba Corp Abrasive pad and grinding device
US5736427A (en) * 1996-10-08 1998-04-07 Micron Technology, Inc. Polishing pad contour indicator for mechanical or chemical-mechanical planarization

Also Published As

Publication number Publication date
GB2345657B (en) 2001-08-15
DE19902804A1 (en) 2000-07-27
GB2345657A (en) 2000-07-19
FR2789005A1 (en) 2000-08-04
JP2000225558A (en) 2000-08-15

Similar Documents

Publication Publication Date Title
DE69503408D1 (en) Device for chemical mechanical polishing with improved distribution of the polishing composition
IL134213A (en) Polishing composition including an inhibitor of tungsten etching
DE60307111D1 (en) METHOD FOR CHEMICAL MECHANICAL POLISHING OF MATERIALS WITH A LOW DIELECTRIC CONSTANT
FR2866748A1 (en) Semiconductor chip arrangement substrate for use in liquid crystal display (LCD), comprises fitting hole at arrangement surface and having shape similar as semiconductor chip
EP0933166A4 (en) Abrasive and method for polishing semiconductor substrate
TW200531783A (en) Polishing pad having a groove arrangement for reducing slurry consumption
FR2789005B1 (en) PHYSICAL-CHEMICAL POLISHING PAD, POLISHING DEVICE USING SUCH A PAD AND METHOD FOR FORMING INSULATION IN A SUBSTRATE
MY130639A (en) Method of rough polishing semiconductor wafers to reduce surface roughness
ATE304040T1 (en) SUSPENSION FOR CHEMICAL-MECHANICAL POLISHING OF COPPER SUBSTRATES
TW200734434A (en) Compositions and methods for tantalum CMP
SG53191G (en) Film for machining wafers
SG111616A1 (en) Cmp method utilizing amphiphilic non-ionic surfactants
MY116324A (en) Chemical mechanical polishing slurry useful for copper/tantalum substrate
TW372209B (en) Polishing apparatus and polishing method
TW200744792A (en) Polishing pad, pad dressing evaluation method, and polishing apparatus
TW200513520A (en) Method for manufacturing substrate
TW428225B (en) A method of polishing a surface of a substrate, a method of manufacturing semiconductor device, and an apparatus of manufacturing the same
TW200738402A (en) Polishing pad and polishing device
TW516119B (en) Chemical mechanical planarization of metal substrates
SG145688A1 (en) Cleaning process and apparatus for silicate materials
EP1205280A4 (en) Wafer polishing method and wafer polishing device
TW374044B (en) A wafer carrier assembly for chem-mech polishing
TW356565B (en) Method and device for removing a semiconductor wafer from a flat substrate
IS6030A (en) Ceramic product for use in connection with water and a method of preventive treatment of impurities
TW335519B (en) The method to increase the thickness of field oxide

Legal Events

Date Code Title Description
ST Notification of lapse