FR2787633B1 - Dispositif d'implantation d'ions et dispositif de traitement d'echantillon - Google Patents

Dispositif d'implantation d'ions et dispositif de traitement d'echantillon

Info

Publication number
FR2787633B1
FR2787633B1 FR9915972A FR9915972A FR2787633B1 FR 2787633 B1 FR2787633 B1 FR 2787633B1 FR 9915972 A FR9915972 A FR 9915972A FR 9915972 A FR9915972 A FR 9915972A FR 2787633 B1 FR2787633 B1 FR 2787633B1
Authority
FR
France
Prior art keywords
ion implantation
sample processing
processing device
implantation device
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9915972A
Other languages
English (en)
Other versions
FR2787633A1 (fr
Inventor
Hiroyuki Tomita
Kazuo Mera
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of FR2787633A1 publication Critical patent/FR2787633A1/fr
Application granted granted Critical
Publication of FR2787633B1 publication Critical patent/FR2787633B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2001—Maintaining constant desired temperature

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
FR9915972A 1998-12-17 1999-12-17 Dispositif d'implantation d'ions et dispositif de traitement d'echantillon Expired - Fee Related FR2787633B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10359348A JP2000183139A (ja) 1998-12-17 1998-12-17 イオン注入装置

Publications (2)

Publication Number Publication Date
FR2787633A1 FR2787633A1 (fr) 2000-06-23
FR2787633B1 true FR2787633B1 (fr) 2004-01-30

Family

ID=18464057

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9915972A Expired - Fee Related FR2787633B1 (fr) 1998-12-17 1999-12-17 Dispositif d'implantation d'ions et dispositif de traitement d'echantillon

Country Status (3)

Country Link
US (2) US6501080B1 (fr)
JP (1) JP2000183139A (fr)
FR (1) FR2787633B1 (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000183139A (ja) * 1998-12-17 2000-06-30 Hitachi Ltd イオン注入装置
US6774376B2 (en) * 1999-08-18 2004-08-10 Ibis Technology Corporation Wafer holding pin
JP4795755B2 (ja) * 2005-08-25 2011-10-19 株式会社日立ハイテクノロジーズ 半導体基板の製造装置
EP2320454A1 (fr) * 2009-11-05 2011-05-11 S.O.I.Tec Silicon on Insulator Technologies Porte substrat et dispositif de serrage par clip
JP5171860B2 (ja) * 2010-02-22 2013-03-27 株式会社日立製作所 イオン注入装置
US9490185B2 (en) * 2012-08-31 2016-11-08 Axcelis Technologies, Inc. Implant-induced damage control in ion implantation
CN103762145B (zh) * 2013-12-23 2016-03-09 中国电子科技集团公司第四十八研究所 旋转盘高温靶室系统
CN109659269B (zh) * 2018-12-28 2020-10-27 安徽龙芯微科技有限公司 一种晶圆覆膜装置

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3993018A (en) * 1975-11-12 1976-11-23 International Business Machines Corporation Centrifugal support for workpieces
DE3588132T2 (de) 1984-09-19 1997-04-03 Applied Materials Inc Vorrichtung zum Scannen von Wafern
US4733091A (en) 1984-09-19 1988-03-22 Applied Materials, Inc. Systems and methods for ion implantation of semiconductor wafers
EP0217616A3 (fr) * 1985-09-23 1989-01-25 Vg Instruments Group Limited Appareil de traitement de substrats
US4817556A (en) * 1987-05-04 1989-04-04 Varian Associates, Inc. Apparatus for retaining wafers
US4965862A (en) * 1988-05-18 1990-10-23 Varian Associates, Inc. Disk scanning apparatus for batch ion implanters
JPH04225256A (ja) 1990-12-26 1992-08-14 Toshiba Corp ウェーハ把持装置
JPH0613013A (ja) * 1992-06-29 1994-01-21 Sumitomo Electric Ind Ltd イオンビームを集束して加工を行う装置
US5406088A (en) * 1993-12-22 1995-04-11 Eaton Corporation Scan and tilt apparatus for an ion implanter
JP3003088B2 (ja) * 1994-06-10 2000-01-24 住友イートンノバ株式会社 イオン注入装置
JP3288554B2 (ja) * 1995-05-29 2002-06-04 株式会社日立製作所 イオン注入装置及びイオン注入方法
US5641969A (en) * 1996-03-28 1997-06-24 Applied Materials, Inc. Ion implantation apparatus
JP3407548B2 (ja) * 1996-03-29 2003-05-19 株式会社日立製作所 イオン打込み装置及びこれを用いた半導体製造方法
US5731593A (en) * 1997-02-28 1998-03-24 Nec Corporation Ion implantation method and ion implantation system used therefor
JP3284918B2 (ja) * 1997-04-11 2002-05-27 株式会社日立製作所 帯電防止方法及びイオン注入装置
US6214184B1 (en) * 1997-05-14 2001-04-10 Taiwan Semiconductor Manufacturing Company, Ltd Insulated wafer pedestal
GB2343550A (en) * 1997-07-29 2000-05-10 Silicon Genesis Corp Cluster tool method and apparatus using plasma immersion ion implantation
US5898179A (en) * 1997-09-10 1999-04-27 Orion Equipment, Inc. Method and apparatus for controlling a workpiece in a vacuum chamber
JP2000183139A (ja) * 1998-12-17 2000-06-30 Hitachi Ltd イオン注入装置
US6437350B1 (en) * 2000-08-28 2002-08-20 Varian Semiconductor Equipment Associates, Inc. Methods and apparatus for adjusting beam parallelism in ion implanters

Also Published As

Publication number Publication date
US6667485B2 (en) 2003-12-23
US6501080B1 (en) 2002-12-31
US20030052283A1 (en) 2003-03-20
FR2787633A1 (fr) 2000-06-23
JP2000183139A (ja) 2000-06-30

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20060831