FR2781058B1 - Agencement de circuit pour le controle d'un circuit de reconnaissance ternaire - Google Patents

Agencement de circuit pour le controle d'un circuit de reconnaissance ternaire

Info

Publication number
FR2781058B1
FR2781058B1 FR9908983A FR9908983A FR2781058B1 FR 2781058 B1 FR2781058 B1 FR 2781058B1 FR 9908983 A FR9908983 A FR 9908983A FR 9908983 A FR9908983 A FR 9908983A FR 2781058 B1 FR2781058 B1 FR 2781058B1
Authority
FR
France
Prior art keywords
circuit
reconnaissance
ternary
controlling
circuit arrangement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9908983A
Other languages
English (en)
Other versions
FR2781058A1 (fr
Inventor
Paul Hartl
Hermann Haberer
Paul Haberl
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Leuze Lumiflex GmbH and Co KG
Original Assignee
Leuze Lumiflex GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leuze Lumiflex GmbH and Co KG filed Critical Leuze Lumiflex GmbH and Co KG
Publication of FR2781058A1 publication Critical patent/FR2781058A1/fr
Application granted granted Critical
Publication of FR2781058B1 publication Critical patent/FR2781058B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318502—Test of Combinational circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Circuits Of Receivers In General (AREA)
  • Eye Examination Apparatus (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Logic Circuits (AREA)
FR9908983A 1998-07-10 1999-07-07 Agencement de circuit pour le controle d'un circuit de reconnaissance ternaire Expired - Fee Related FR2781058B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19831088A DE19831088C2 (de) 1998-07-10 1998-07-10 Schaltungsanordnung zur Überprüfung einer Tri-State-Erkennungsschaltung

Publications (2)

Publication Number Publication Date
FR2781058A1 FR2781058A1 (fr) 2000-01-14
FR2781058B1 true FR2781058B1 (fr) 2005-07-15

Family

ID=7873715

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9908983A Expired - Fee Related FR2781058B1 (fr) 1998-07-10 1999-07-07 Agencement de circuit pour le controle d'un circuit de reconnaissance ternaire

Country Status (4)

Country Link
US (1) US6418546B1 (fr)
DE (1) DE19831088C2 (fr)
FR (1) FR2781058B1 (fr)
IT (1) IT1313223B1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10039142B4 (de) * 2000-08-07 2006-12-28 Leuze Lumiflex Gmbh + Co. Kg Verfahren zur Überwachung eines Zuganges zu einem Gefahrenbereich
US7098833B2 (en) * 2004-06-04 2006-08-29 Texas Instruments Incorporated Tri-value decoder circuit and method
CN104991184B (zh) * 2015-07-29 2018-05-25 英特格灵芯片(天津)有限公司 一种芯片片上三态信号检测装置及其检测方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3764995A (en) * 1971-12-21 1973-10-09 Prd Electronics Inc Programmable test systems
US5432440A (en) * 1991-11-25 1995-07-11 At&T Global Information Solutions Company Detection of tri-state logic signals
US5714892A (en) * 1996-04-04 1998-02-03 Analog Devices, Inc. Three state logic input
DE19736216A1 (de) * 1996-09-24 1998-03-26 Siemens Ag Einrichtung zur Diagnose des Zustands eines Tristate-Ausgangs
JP2861973B2 (ja) * 1996-10-11 1999-02-24 日本電気株式会社 半導体集積論理回路のテスト回路
TW347468B (en) * 1997-10-28 1998-12-11 Winbond Electronics Corp Three-step level detector without standby-current
US6133753A (en) * 1998-11-25 2000-10-17 Analog Devices, Inc. Tri-state input detection circuit

Also Published As

Publication number Publication date
DE19831088C2 (de) 2001-02-08
ITMI991472A0 (it) 1999-07-02
IT1313223B1 (it) 2002-06-17
DE19831088A1 (de) 2000-02-24
FR2781058A1 (fr) 2000-01-14
ITMI991472A1 (it) 2001-01-02
US6418546B1 (en) 2002-07-09

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Legal Events

Date Code Title Description
CA Change of address
CD Change of name or company name
CJ Change in legal form
ST Notification of lapse

Effective date: 20150331