FR2774804B1 - Procede pour former l'electrode inferieure d'un condensateur - Google Patents

Procede pour former l'electrode inferieure d'un condensateur

Info

Publication number
FR2774804B1
FR2774804B1 FR9806657A FR9806657A FR2774804B1 FR 2774804 B1 FR2774804 B1 FR 2774804B1 FR 9806657 A FR9806657 A FR 9806657A FR 9806657 A FR9806657 A FR 9806657A FR 2774804 B1 FR2774804 B1 FR 2774804B1
Authority
FR
France
Prior art keywords
capacitor
forming
lower electrode
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9806657A
Other languages
English (en)
Other versions
FR2774804A1 (fr
Inventor
Jhy Jyi Sze
Hsiu Wen Huang
Gary Hong
Anchor Chen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
United Semiconductor Corp
Original Assignee
United Semiconductor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from TW087101622A external-priority patent/TW374242B/zh
Application filed by United Semiconductor Corp filed Critical United Semiconductor Corp
Publication of FR2774804A1 publication Critical patent/FR2774804A1/fr
Application granted granted Critical
Publication of FR2774804B1 publication Critical patent/FR2774804B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40Capacitors
    • H01L28/60Electrodes
    • H01L28/82Electrodes with an enlarged surface, e.g. formed by texturisation
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • H10B12/01Manufacture or treatment
    • H10B12/02Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
    • H10B12/03Making the capacitor or connections thereto
    • H10B12/033Making the capacitor or connections thereto the capacitor extending over the transistor
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • H10B12/30DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
    • H10B12/31DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor
    • H10B12/318DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor the storage electrode having multiple segments
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40Capacitors
    • H01L28/60Electrodes
    • H01L28/82Electrodes with an enlarged surface, e.g. formed by texturisation
    • H01L28/84Electrodes with an enlarged surface, e.g. formed by texturisation being a rough surface, e.g. using hemispherical grains
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40Capacitors
    • H01L28/60Electrodes
    • H01L28/82Electrodes with an enlarged surface, e.g. formed by texturisation
    • H01L28/86Electrodes with an enlarged surface, e.g. formed by texturisation having horizontal extensions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40Capacitors
    • H01L28/60Electrodes
    • H01L28/82Electrodes with an enlarged surface, e.g. formed by texturisation
    • H01L28/90Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)
FR9806657A 1998-02-07 1998-05-27 Procede pour former l'electrode inferieure d'un condensateur Expired - Fee Related FR2774804B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TW087101622A TW374242B (en) 1998-02-07 1998-02-07 Method for manufacturing an underside electrode of a capacitor
GB9809770A GB2337159B (en) 1998-02-07 1998-05-07 Method for manufacturing capacitor's lower electrode

Publications (2)

Publication Number Publication Date
FR2774804A1 FR2774804A1 (fr) 1999-08-13
FR2774804B1 true FR2774804B1 (fr) 2000-08-11

Family

ID=26313614

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9806657A Expired - Fee Related FR2774804B1 (fr) 1998-02-07 1998-05-27 Procede pour former l'electrode inferieure d'un condensateur

Country Status (4)

Country Link
JP (1) JP2936326B1 (fr)
DE (1) DE19823253C1 (fr)
FR (1) FR2774804B1 (fr)
GB (1) GB2337159B (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3344482B2 (ja) 1999-10-01 2002-11-11 日本電気株式会社 半導体記憶装置及びその製造方法
JP4731025B2 (ja) * 2001-02-07 2011-07-20 Okiセミコンダクタ株式会社 シリンダ型キャパシタ及びシリンダ型キャパシタの製造方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5278091A (en) * 1993-05-04 1994-01-11 Micron Semiconductor, Inc. Process to manufacture crown stacked capacitor structures with HSG-rugged polysilicon on all sides of the storage node
KR0165499B1 (en) * 1995-01-26 1998-12-15 Samsung Electronics Co Ltd Capacitor fabrication method of semiconductor device
KR970054170A (fr) * 1995-12-25 1997-07-31

Also Published As

Publication number Publication date
JP2936326B1 (ja) 1999-08-23
GB2337159B (en) 2000-12-06
FR2774804A1 (fr) 1999-08-13
DE19823253C1 (de) 1999-07-15
GB2337159A (en) 1999-11-10
JPH11238848A (ja) 1999-08-31
GB9809770D0 (en) 1998-07-08

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Legal Events

Date Code Title Description
TP Transmission of property
ST Notification of lapse