FR2754065B1 - Circuit de simulation d'un composant a retournement - Google Patents

Circuit de simulation d'un composant a retournement

Info

Publication number
FR2754065B1
FR2754065B1 FR9612023A FR9612023A FR2754065B1 FR 2754065 B1 FR2754065 B1 FR 2754065B1 FR 9612023 A FR9612023 A FR 9612023A FR 9612023 A FR9612023 A FR 9612023A FR 2754065 B1 FR2754065 B1 FR 2754065B1
Authority
FR
France
Prior art keywords
simulation
circuit
return component
return
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9612023A
Other languages
English (en)
Other versions
FR2754065A1 (fr
Inventor
Mickael Davy
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
SGS Thomson Microelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA filed Critical SGS Thomson Microelectronics SA
Priority to FR9612023A priority Critical patent/FR2754065B1/fr
Priority to US08/937,509 priority patent/US6173242B1/en
Publication of FR2754065A1 publication Critical patent/FR2754065A1/fr
Application granted granted Critical
Publication of FR2754065B1 publication Critical patent/FR2754065B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/263—Circuits therefor for testing thyristors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06G—ANALOGUE COMPUTERS
    • G06G7/00—Devices in which the computing operation is performed by varying electric or magnetic quantities
    • G06G7/48—Analogue computers for specific processes, systems or devices, e.g. simulators
    • G06G7/62—Analogue computers for specific processes, systems or devices, e.g. simulators for electric systems or apparatus

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
FR9612023A 1996-09-27 1996-09-27 Circuit de simulation d'un composant a retournement Expired - Fee Related FR2754065B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR9612023A FR2754065B1 (fr) 1996-09-27 1996-09-27 Circuit de simulation d'un composant a retournement
US08/937,509 US6173242B1 (en) 1996-09-27 1997-09-25 Circuit for simulating a break-over component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9612023A FR2754065B1 (fr) 1996-09-27 1996-09-27 Circuit de simulation d'un composant a retournement

Publications (2)

Publication Number Publication Date
FR2754065A1 FR2754065A1 (fr) 1998-04-03
FR2754065B1 true FR2754065B1 (fr) 1998-12-18

Family

ID=9496294

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9612023A Expired - Fee Related FR2754065B1 (fr) 1996-09-27 1996-09-27 Circuit de simulation d'un composant a retournement

Country Status (2)

Country Link
US (1) US6173242B1 (fr)
FR (1) FR2754065B1 (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2834128B1 (fr) * 2001-12-21 2005-03-04 St Microelectronics Sa Dispositif de protection bidirectionnel a faible capacite
US8341141B2 (en) * 2008-12-16 2012-12-25 Krislov Clinton A Method and system for automated document registration
CN104656014A (zh) * 2014-09-26 2015-05-27 天津电气科学研究院有限公司 一种基于电流传感器法的开关动作特性试验台校准方法
CN106154134B (zh) * 2016-06-18 2017-07-18 温州大学 一种晶闸管四象限触发特性参数测试装置
CN107179501B (zh) * 2017-06-20 2023-11-17 华北电力大学（保定） 一种单相断路器分闸重击穿模拟实验装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS514834B1 (fr) * 1970-12-27 1976-02-14
US3919489A (en) * 1974-01-04 1975-11-11 Bell Telephone Labor Inc Thyristor circuitry for providing automatic number identification services
US4117527A (en) * 1977-03-25 1978-09-26 General Electric Company Solid state valve thermal protection for hvdc power converters
US4215420A (en) * 1978-03-13 1980-07-29 Massachusetts Institute Of Technology Parity simulator
US4855666A (en) * 1988-10-11 1989-08-08 Jones Thad M AC current switch
US5619081A (en) * 1994-01-18 1997-04-08 Leviton Manufacturing Co., Inc. Asymmetrical AC trigger simulation

Also Published As

Publication number Publication date
FR2754065A1 (fr) 1998-04-03
US6173242B1 (en) 2001-01-09

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20070531