FR2743194B1 - Identification de carte a pointes pour une fabrication assistee par ordinateur - Google Patents
Identification de carte a pointes pour une fabrication assistee par ordinateurInfo
- Publication number
- FR2743194B1 FR2743194B1 FR9515862A FR9515862A FR2743194B1 FR 2743194 B1 FR2743194 B1 FR 2743194B1 FR 9515862 A FR9515862 A FR 9515862A FR 9515862 A FR9515862 A FR 9515862A FR 2743194 B1 FR2743194 B1 FR 2743194B1
- Authority
- FR
- France
- Prior art keywords
- computer
- card identification
- aided manufacturing
- pointed
- pointed card
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Radar Systems Or Details Thereof (AREA)
- Credit Cards Or The Like (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9515862A FR2743194B1 (fr) | 1995-12-29 | 1995-12-29 | Identification de carte a pointes pour une fabrication assistee par ordinateur |
US08/767,140 US5866024A (en) | 1995-12-29 | 1996-12-19 | Probe card identification for computer aided manufacturing |
EP96410128A EP0782001A1 (fr) | 1995-12-29 | 1996-12-19 | Carte de test d'identification pour la fabrication assistée par ordinateur |
JP8356733A JPH09190519A (ja) | 1995-12-29 | 1996-12-27 | コンピュータ援用生産におけるプローブカードの識別 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9515862A FR2743194B1 (fr) | 1995-12-29 | 1995-12-29 | Identification de carte a pointes pour une fabrication assistee par ordinateur |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2743194A1 FR2743194A1 (fr) | 1997-07-04 |
FR2743194B1 true FR2743194B1 (fr) | 1998-03-20 |
Family
ID=9486252
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9515862A Expired - Fee Related FR2743194B1 (fr) | 1995-12-29 | 1995-12-29 | Identification de carte a pointes pour une fabrication assistee par ordinateur |
Country Status (4)
Country | Link |
---|---|
US (1) | US5866024A (fr) |
EP (1) | EP0782001A1 (fr) |
JP (1) | JPH09190519A (fr) |
FR (1) | FR2743194B1 (fr) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000002236A2 (fr) * | 1998-07-07 | 2000-01-13 | Memc Electronic Materials, Inc. | Systeme et procede d'identification de frequences radioelectriques dans le suivi des etapes de fabrication des plaquettes |
US6505138B1 (en) * | 1999-10-28 | 2003-01-07 | Credence Systems Corporation | Function-based control interface for integrated circuit tester prober and handler devices |
US6691068B1 (en) | 2000-08-22 | 2004-02-10 | Onwafer Technologies, Inc. | Methods and apparatus for obtaining data for process operation, optimization, monitoring, and control |
KR100347765B1 (ko) * | 2000-10-18 | 2002-08-09 | 삼성전자 주식회사 | 웨이퍼의 전기적 특성을 검사하는 방법 및 장치 |
US6616034B2 (en) * | 2001-12-10 | 2003-09-09 | Fortrend Taiwan Scientific Corporation | Radio frequency identification device |
US8535228B2 (en) | 2004-10-06 | 2013-09-17 | Guided Therapy Systems, Llc | Method and system for noninvasive face lifts and deep tissue tightening |
US8444562B2 (en) | 2004-10-06 | 2013-05-21 | Guided Therapy Systems, Llc | System and method for treating muscle, tendon, ligament and cartilage tissue |
US10864385B2 (en) | 2004-09-24 | 2020-12-15 | Guided Therapy Systems, Llc | Rejuvenating skin by heating tissue for cosmetic treatment of the face and body |
US11883688B2 (en) | 2004-10-06 | 2024-01-30 | Guided Therapy Systems, Llc | Energy based fat reduction |
US8690778B2 (en) | 2004-10-06 | 2014-04-08 | Guided Therapy Systems, Llc | Energy-based tissue tightening |
US8133180B2 (en) | 2004-10-06 | 2012-03-13 | Guided Therapy Systems, L.L.C. | Method and system for treating cellulite |
US11235179B2 (en) | 2004-10-06 | 2022-02-01 | Guided Therapy Systems, Llc | Energy based skin gland treatment |
US9694212B2 (en) * | 2004-10-06 | 2017-07-04 | Guided Therapy Systems, Llc | Method and system for ultrasound treatment of skin |
US11724133B2 (en) * | 2004-10-07 | 2023-08-15 | Guided Therapy Systems, Llc | Ultrasound probe for treatment of skin |
US11207548B2 (en) | 2004-10-07 | 2021-12-28 | Guided Therapy Systems, L.L.C. | Ultrasound probe for treating skin laxity |
RU2680188C2 (ru) | 2008-06-06 | 2019-02-18 | Ультера, Инк. | Система и способ для косметической обработки и визуализации |
CN101718838B (zh) * | 2008-10-09 | 2012-06-13 | 相丰科技股份有限公司 | 无线射频识别芯片的测试模块及其使用方法 |
EP2382010A4 (fr) | 2008-12-24 | 2014-05-14 | Guided Therapy Systems Llc | Procédés et systèmes pour réduire les graisses et/ou traiter la cellulite |
WO2010076187A2 (fr) | 2008-12-30 | 2010-07-08 | Stmicroelectronics S.R.L. | Dispositif électronique intégré avec antenne d'émission-réception et interconnexion magnétique |
WO2011085227A2 (fr) * | 2010-01-08 | 2011-07-14 | Photon Dynamics, Inc. | Station de configuration de sonde automatique et procédé pour celle-ci |
CN104027893B (zh) | 2013-03-08 | 2021-08-31 | 奥赛拉公司 | 用于多焦点超声治疗的装置和方法 |
US20170028227A1 (en) | 2014-04-18 | 2017-02-02 | Ulthera, Inc. | Band transducer ultrasound therapy |
KR102615327B1 (ko) | 2016-01-18 | 2023-12-18 | 얼테라, 인크 | 환형 초음파 어레이가 가요성 인쇄 회로 기판에 지엽적으로 전기적으로 연결된 컴팩트한 초음파 디바이스 및 그 조립 방법 |
IL293809B2 (en) | 2016-08-16 | 2023-09-01 | Ulthera Inc | Systems and methods for cosmetic treatment of the skin using ultrasound |
TWI739764B (zh) * | 2016-10-04 | 2021-09-21 | 旺矽科技股份有限公司 | 同軸探針卡裝置 |
CN107894521B (zh) * | 2016-10-04 | 2021-08-20 | 旺矽科技股份有限公司 | 同轴探针卡装置 |
CN112198850A (zh) | 2016-11-09 | 2021-01-08 | 株式会社东芝 | 数据收集系统、处理系统以及存储介质 |
US11944849B2 (en) | 2018-02-20 | 2024-04-02 | Ulthera, Inc. | Systems and methods for combined cosmetic treatment of cellulite with ultrasound |
IT201900022176A1 (it) * | 2019-11-26 | 2021-05-26 | Tor Mec Ambrosi S R L | Metodo e sistema per tracciare il movimento di carrelli in un ambiente di lavoro tra una pluralità di stazioni di lavorazione di manufatti cuciti per l’assemblaggio di un capo d’abbigliamento |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3832530A (en) * | 1972-01-04 | 1974-08-27 | Westinghouse Electric Corp | Object identifying apparatus |
US4463353A (en) * | 1981-08-17 | 1984-07-31 | Ralston Purina Company | Animal feeding and monitoring system |
US4827110A (en) * | 1987-06-11 | 1989-05-02 | Fluoroware, Inc. | Method and apparatus for monitoring the location of wafer disks |
US5030807A (en) * | 1990-01-16 | 1991-07-09 | Amtech Corporation | System for reading and writing data from and into remote tags |
GB9009739D0 (en) * | 1990-05-01 | 1990-06-20 | Disys Inc | Transponder system |
US5081446A (en) * | 1990-09-24 | 1992-01-14 | Checkpoint Systems, Inc. | Security tag for compact disc storage container |
US5399983A (en) * | 1991-08-08 | 1995-03-21 | Tokyo Electron Yamanashi Limited | Probe apparatus |
US5240670A (en) * | 1991-08-22 | 1993-08-31 | Texas Instruments Incorporated | Method of improving the mechanical properties of semiconductor materials |
US5254939A (en) * | 1992-03-20 | 1993-10-19 | Xandex, Inc. | Probe card system |
JP3216205B2 (ja) * | 1992-03-27 | 2001-10-09 | 神鋼電機株式会社 | 半導体製造システムにおけるid認識装置 |
JPH05297064A (ja) * | 1992-04-16 | 1993-11-12 | Tokyo Seimitsu Co Ltd | 半導体素子検査装置 |
JP3219844B2 (ja) * | 1992-06-01 | 2001-10-15 | 東京エレクトロン株式会社 | プローブ装置 |
US5550482A (en) * | 1993-07-20 | 1996-08-27 | Tokyo Electron Kabushiki Kaisha | Probe device |
US5654693A (en) * | 1996-04-10 | 1997-08-05 | X-Cyte, Inc. | Layered structure for a transponder tag |
-
1995
- 1995-12-29 FR FR9515862A patent/FR2743194B1/fr not_active Expired - Fee Related
-
1996
- 1996-12-19 US US08/767,140 patent/US5866024A/en not_active Expired - Lifetime
- 1996-12-19 EP EP96410128A patent/EP0782001A1/fr not_active Withdrawn
- 1996-12-27 JP JP8356733A patent/JPH09190519A/ja not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
JPH09190519A (ja) | 1997-07-22 |
EP0782001A1 (fr) | 1997-07-02 |
US5866024A (en) | 1999-02-02 |
FR2743194A1 (fr) | 1997-07-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20060831 |