FR2725030B1 - - Google Patents

Info

Publication number
FR2725030B1
FR2725030B1 FR9411857A FR9411857A FR2725030B1 FR 2725030 B1 FR2725030 B1 FR 2725030B1 FR 9411857 A FR9411857 A FR 9411857A FR 9411857 A FR9411857 A FR 9411857A FR 2725030 B1 FR2725030 B1 FR 2725030B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9411857A
Other languages
French (fr)
Other versions
FR2725030A1 (fr
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to FR9411857A priority Critical patent/FR2725030A1/fr
Publication of FR2725030A1 publication Critical patent/FR2725030A1/fr
Application granted granted Critical
Publication of FR2725030B1 publication Critical patent/FR2725030B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G01R1/07335—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards for double-sided contacting or for testing boards with surface-mounted devices (SMD's)

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
FR9411857A 1994-09-26 1994-09-26 Dispositif interface entre un appareil testeur et une carte de circuit imprime Granted FR2725030A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR9411857A FR2725030A1 (fr) 1994-09-26 1994-09-26 Dispositif interface entre un appareil testeur et une carte de circuit imprime

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9411857A FR2725030A1 (fr) 1994-09-26 1994-09-26 Dispositif interface entre un appareil testeur et une carte de circuit imprime

Publications (2)

Publication Number Publication Date
FR2725030A1 FR2725030A1 (fr) 1996-03-29
FR2725030B1 true FR2725030B1 (cs) 1997-02-07

Family

ID=9467560

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9411857A Granted FR2725030A1 (fr) 1994-09-26 1994-09-26 Dispositif interface entre un appareil testeur et une carte de circuit imprime

Country Status (1)

Country Link
FR (1) FR2725030A1 (cs)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3038665C2 (de) * 1980-10-13 1990-03-29 Riba-Prüftechnik GmbH, 7801 Schallstadt Prüfeinrichtung zum Überprüfen von mit Leiterbahnen versehenen Leiterplatten
FR2518358A1 (fr) * 1981-12-10 1983-06-17 Everett Charles Inc Tete d'essai actionnee par le vide munie d'une plaque de programmation
GB2183938A (en) * 1985-11-19 1987-06-10 Teradyne Inc Testing circuit boards
GB2214362A (en) * 1988-01-13 1989-08-31 Gab Hsu Detachable open/short testing fixture device for testing P.C. Boards
FR2688975B1 (fr) * 1992-03-19 1996-10-04 Testelec Dispositif interface entre un appareil testeur et une carte de circuit imprime.

Also Published As

Publication number Publication date
FR2725030A1 (fr) 1996-03-29

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Legal Events

Date Code Title Description
ST Notification of lapse